Abstract: A pure copper sheet of the present invention has a composition including 99.96 mass % or more of Cu, 0.01 mass ppm or more and 3.00 mass ppm or less of P, 10.0 mass ppm or less of a total content of Pb, Se, and Te, 3.0 mass ppm or more of a total content of Ag and Fe, and inevitable impurities as a balance, in which an average crystal grain size of crystal grains on a rolled surface is 10 ?m or more, an aspect ratio of the crystal grain on the rolled surface is set to 2.0 or less, and a length percentage of the small tilt grain boundary and the subgrain boundary with respect to all grain boundaries is set to 80% or less in terms of partition fraction.

Abstract: A fuel cell module comprises: at least one cell stack including a plurality of single fuel cells supplied with a fuel gas and an oxidizing gas to generate power; a sealable housing accommodating the at least one cell stack and forming a power generation chamber inside the housing; a pressure vessel accommodating the housing; and an oxidizing gas supply pipe for supplying the oxidizing gas to the cell stack. At least one pressure equalizing opening is formed in the housing to allow communication between inside and outside of the housing. The at least one pressure equalizing opening includes only one pressure equalizing opening, or a plurality of pressure equalizing openings in which a distance between a pressure equalizing opening in the highest position and a pressure equalizing opening in the lowest position is within 0.1H, where H is a height of the housing.

Abstract: An image processing device includes a spectrum acquisition unit that acquires a plurality of spectra that respectively have different measurement energy ranges and energy resolutions and are acquired using an X-ray spectrometer having a plurality of dispersion elements with different spectral characteristics, a graph generation unit that sets the plurality of spectra on a single graph having an axis of an ath root of the energy (where a?2) as a first axis, and an axis based on an X-ray intensity as a second axis, and a display control unit that executes control to display the graph generated by the graph generation unit on a display unit.

Abstract: An image processing apparatus including a processor and a memory, the processor executing a program stored in the memory to: acquire elemental map data representing a distribution of X-ray intensity or a distribution of concentration for each element; generate a phase map indicating a distribution of phases of compounds based on the elemental map data; and generate graphs representing X-ray intensity of each element or a concentration of each element as an area for the respective phases of the compounds included in the phase map and cause a display section to display the graphs.

Abstract: Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored in the memory to perform: processing for calculating a difference between a maximum value and a minimum value of signal intensity data being intensity information on the signal of one of pixels within the mapping image, and determining a degree of smoothing to be used for the smoothing processing based on the difference; and processing for performing the smoothing processing based on the determined degree of smoothing.

Abstract: An image processing device includes a spectrum acquisition unit that acquires a plurality of spectra that respectively have different measurement energy ranges and energy resolutions and are acquired using an X-ray spectrometer having a plurality of dispersion elements with different spectral characteristics, a graph generation unit that sets the plurality of spectra on a single graph having an axis of an ath root of the energy (where a?2) as a first axis, and an axis based on an X-ray intensity as a second axis, and a display control unit that executes control to display the graph generated by the graph generation unit on a display unit.

Abstract: An image processing apparatus including a processor and a memory, the processor executing a program stored in the memory to: acquire elemental map data representing a distribution of X-ray intensity or a distribution of concentration for each element; generate a phase map indicating a distribution of phases of compounds based on the elemental map data; and generate graphs representing X-ray intensity of each element or a concentration of each element as an area for the respective phases of the compounds included in the phase map and cause a display section to display the graphs.

Abstract: Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored in the memory to perform: processing for calculating a difference between a maximum value and a minimum value of signal intensity data being intensity information on the signal of one of pixels within the mapping image, and determining a degree of smoothing to be used for the smoothing processing based on the difference; and processing for performing the smoothing processing based on the determined degree of smoothing.

Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.

Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.

Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.

Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.

Abstract: A radioactive iodine removal apparatus applying a radioactive iodine adsorbent according to an embodiment of the present invention includes an iodine filter that is provided in a chamber of a duct to which flue gas containing radioactive iodine is fed, and includes a radioactive iodine adsorbent that adsorbs radioactive iodine contained in the flue gas. The radioactive iodine adsorbent includes a carrier constituting a matrix and an impregnated substance with which the carrier is impregnated. The impregnated substance contains at least TEDA, and an impregnated amount of the TEDA is from 3.0% by mass to less than 10.0% by mass.

Abstract: A leak testing device for an iodine filter according to the present embodiment includes an iodine adsorption unit including an iodine filter provided in a chamber provided in a duct, to which flue gas containing radioactive iodine is fed, and including an iodine adsorbing material that adsorbs radioactive iodine contained in the flue gas, a fluorine-containing-reagent feed unit that feeds a fluorine-containing reagent that does not contain chlorine into the duct, and a first fluorine-containing-reagent-concentration measurement unit and a second fluorine-containing-reagent-concentration measurement unit that measures a concentration of the fluorine-containing reagent on an upstream side and a downstream side of the iodine filter.

Abstract: A radioactive iodine removal apparatus applying a radioactive iodine adsorbent according to an embodiment of the present invention includes an iodine filter that is provided in a chamber of a duct to which flue gas containing radioactive iodine is fed, and includes a radioactive iodine adsorbent that adsorbs radioactive iodine contained in the flue gas. The radioactive iodine adsorbent includes a carrier constituting a matrix and an impregnated substance with which the carrier is impregnated. The impregnated substance contains at least TEDA, and an impregnated amount of the TEDA is from 3.0% by mass to less than 10.0% by mass.

Abstract: A leak testing device for an iodine filter according to the present embodiment includes an iodine adsorption unit including an iodine filter provided in a chamber provided in a duct, to which flue gas containing radioactive iodine is fed, and including an iodine adsorbing material that adsorbs radioactive iodine contained in the flue gas, a fluorine-containing-reagent feed unit that feeds a fluorine-containing reagent that does not contain chlorine into the duct, and a first fluorine-containing-reagent-concentration measurement unit and a second fluorine-containing-reagent-concentration measurement unit that measures a concentration of the fluorine-containing reagent on an upstream side and a downstream side of the iodine filter.

Abstract: An electron beam system (such as a scanning electron microscope or an electron probe microanalyzer) capable of displaying backscattered electron (BSE) images at the same brightness and same contrast at all times if the atomic number differences are the same when illumination conditions including accelerating voltage and emission current are varied or when the specimens are imaged with different instruments.

Abstract: An electron beam system (such as a scanning electron microscope or an electron probe microanalyzer) capable of displaying backscattered electron (BSE) images at the same brightness and same contrast at all times if the atomic number differences are the same when illumination conditions including accelerating voltage and emission current are varied or when the specimens are imaged with different instruments.