Abstract: A sample observation device includes a sample container that holds the sample stained with a first fluorescent substance and a solution including a second fluorescent substance, an irradiation unit that performs irradiation with first excitation light and second excitation light, a scanning unit that scans the sample container in one direction, an image formation unit that forms first fluorescent light from the sample and second fluorescent light from the solution, an imaging unit that outputs first image data based on the first fluorescent light and first image data based on the second fluorescent light, an image processing unit that generates a first fluorescent light image based on a plurality of pieces of first image data and a second fluorescent light image based on a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample on the basis of the second fluorescent light image and sets an analysis area in the first fluorescent light image.

Abstract: A sample observation device includes a flow cell in which a fluid containing samples flows, an irradiation unit configured to irradiate the samples flowing in the flow cell with planar light, an image formation unit having an observation axis inclined with respect to an irradiation surface for the planar light, and configured to form an image of observation light generated in the sample due to the irradiation with the planar light, a two-dimensional imaging element configured to capture a light image including at least a cross section of the fluid among light images according to the observation light formed by the image formation unit, and outputs image data, and an analysis unit configured to analyze a light intensity profile of the sample in a flow direction of the fluid on the basis of the image data.

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

Abstract: An optical sensor includes a substrate, a light emitting element, a light receiving element, and an electronic circuit element. Light from the light emitting element is blocked by a detection object to detect the detection object. The light emitting element, the electronic circuit element and the light receiving element are mounted on the same surface of the substrate. The electronic circuit element is disposed between the light emitting element and the light receiving element on a mounting surface of the substrate.

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device includes a sample container that holds the sample stained with a first fluorescent substance and a solution including a second fluorescent substance, an irradiation unit that performs irradiation with first excitation light and second excitation light, a scanning unit that scans the sample container in one direction, an image formation unit that forms first fluorescent light from the sample and second fluorescent light from the solution, an imaging unit that outputs first image data based on the first fluorescent light and first image data based on the second fluorescent light, an image processing unit that generates a first fluorescent light image based on a plurality of pieces of first image data and a second fluorescent light image based on a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample on the basis of the second fluorescent light image and sets an analysis area in the first fluorescent light image.

Abstract: A sample observation device includes a sample container that holds the sample stained with a first fluorescent substance and a solution including a second fluorescent substance, an irradiation unit that performs irradiation with first excitation light and second excitation light, a scanning unit that scans the sample container in one direction, an image formation unit that forms first fluorescent light from the sample and second fluorescent light from the solution, an imaging unit that outputs first image data based on the first fluorescent light and first image data based on the second fluorescent light, an image processing unit that generates a first fluorescent light image based on a plurality of pieces of first image data and a second fluorescent light image based on a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample on the basis of the second fluorescent light image and sets an analysis area in the first fluorescent light image.

Abstract: A sample observation device includes an imaging unit that images observation light generated due to irradiation with the planar light that is transmitted through a membrane filter and outputs fluorescent light image data, a partial image generation unit that specifies a first area corresponding to a first sample holding space and a second area corresponding to a second sample holding space in the fluorescent light image data, and generates first partial image data corresponding to the first area and second partial image data corresponding to the second area, an observation image generation unit that generates first observation image data and second observation image data on the basis of the partial image data, and an analysis unit that analyzes a sample on the basis of the first observation image data and the second observation image data.

Abstract: A printed circuit board comprises a first mounting surface, a second mounting surface, and a piezoelectric transformer. The piezoelectric transformer has a piezoelectric substance, external electrodes, and a frame substrate. The second mounting surface has a projection region. There is a first region from a first location, where an end portion further from the output electrode out of end portions of the input electrode is projected onto the second mounting surface in the projection region, to a second location, where an end portion closer to the output electrode out of the end portions of the input electrode is projected onto the second mounting surface, the first region being a mounting allowed region where an electronic component is mounted.

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device includes an imaging unit that images observation light generated due to irradiation with the planar light that is transmitted through a membrane filter and outputs fluorescent light image data, a partial image generation unit that specifies a first area corresponding to a first sample holding space and a second area corresponding to a second sample holding space in the fluorescent light image data, and generates first partial image data corresponding to the first area and second partial image data corresponding to the second area, an observation image generation unit that generates first observation image data and second observation image data on the basis of the partial image data, and an analysis unit that analyzes a sample on the basis of the first observation image data and the second observation image data.

Abstract: A sample observation device includes an irradiation unit that irradiates a sample with planar light, a scanning unit that scans the sample in one direction with respect to an irradiation surface of the planar light, an image formation unit that forms images of fluorescent light and scattered light from the sample, an imaging unit that outputs first image data based on a light image of the fluorescent light and second image data based on a light image of the scattered light, an image processing unit that generates a fluorescent light image on the basis of a plurality of pieces of first image data and generates a scattered light image on the basis of a plurality of pieces of second image data, and an analysis unit that specifies an area in which there is the sample in the fluorescent light image on the basis of the scattered light image, and sets an analysis area in the fluorescent light image on the basis of the area in which there is the sample.

Abstract: An optical sensor includes a substrate, a light emitting element, a light receiving element, and an electronic circuit element. Light from the light emitting element is blocked by a detection object to detect the detection object. The light emitting element, the electronic circuit element and the light receiving element are mounted on the same surface of the substrate. The electronic circuit element is disposed between the light emitting element and the light receiving element on a mounting surface of the substrate.

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).

Abstract: A sample observation device (1) includes: an emission optical system (3) for emitting planar light (L2) onto a sample (S); a scanning unit (4) for scanning the sample (S) with respect to an emission face (R) of the planar light (L2); an imaging optical system (5) having an observation axis (P2) inclined with respect to the emission face (R) and for forming an image from observation light (L3) generated in the sample (S) in accordance with the emission of the planar light (L2); an image acquiring unit (6) for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L3) formed as an image by the imaging optical system (5); and an image generating unit (8) for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit (6).