Patents by Inventor Noriko IIZUMI

Noriko IIZUMI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10018586
    Abstract: A flow cell for electrochemical measurement which introduces a sample solution, applies a voltage between a working electrode and a counter electrode to analyze the sample solution electrochemically, discharges the sample solution, and performs the electrochemical measurement continuously. The flow cell includes a unit which measures a value of a current flowing between electrodes at the time of applying a voltage, a unit which records the measured current value, a unit which compares the recorded current value with a current value set separately as a determination standard, and a unit which determines whether the current value measured at a cycle of a determination target and the recorded current value is normal by the comparison.
    Type: Grant
    Filed: January 14, 2014
    Date of Patent: July 10, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shinya Matsuoka, So Oguchi, Yukie Tokiwa, Toshinari Sakurai, Yasushi Niiyama, Noriko Iizumi
  • Patent number: 9792832
    Abstract: An image display device displays operation items of an electron microscope on an operation screen, and a storage device stores information of assist buttons which display image state information acquired via a detector of the electron microscope. The information of the assist buttons corresponds to image quality of an acquired image via the detector as well as to observation conditions composed of a combination of parameter setting values of the electron microscope, an operation program which analyzes the image quality of the acquired image. The information of the assist buttons is acquired based on analytical results of the image quality as well as current observation conditions, and the assist buttons are displayed on a predetermined part of the operation screen. Accordingly, the skills of a novice user operating a charged particle beam apparatus can be improved.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: October 17, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yayoi Konishi, Hiroyuki Noda, Takahiro Inada, Kunji Shigeto, Tohru Ando, Noriko Iizumi, Ryuichiro Tamochi, Mitsugu Sato
  • Patent number: 9297820
    Abstract: An automatic analyzer includes a storage unit for storing operation information information about usage histories of expendable supplies provided for the analysis, and an analysis-ID control unit giving an ID to the analysis, the analysis ID being used as information for identifying the analysis to derive a calibration curve. Data stored in the storage unit is organized along the same time axis both in the order of samples subjected to the analysis and inspection, and in the order of analysis items, so that the data is output in a total data display area. The data is organized from the viewpoint of an analysis process of an analysis item of each sample. By use of information used to identify an influence range based on a kind of an abnormal state, which is stored beforehand, a judgment is made as to whether or not it is necessary to perform reinspection.
    Type: Grant
    Filed: February 11, 2009
    Date of Patent: March 29, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Noriko Iizumi, Tomoko Tomiyama, Yoshimitsu Takagi, Kyoko Imai, Ryuichiro Kodama, Tomonori Mimura
  • Publication number: 20150355140
    Abstract: A flow cell for electrochemical measurement which introduces a sample solution, applies a voltage between a working electrode and a counter electrode to analyze the sample solution electrochemically, discharges the sample solution, and performs the electrochemical measurement continuously. The flow cell includes a unit which measures a value of a current flowing between electrodes at the time of applying a voltage, a unit which records the measured current value, a unit which compares the recorded current value with a current value set separately as a determination standard, and a unit which determines whether the current value measured at a cycle of a determination target and the recorded current value is normal by the comparison.
    Type: Application
    Filed: January 14, 2014
    Publication date: December 10, 2015
    Applicant: Hitachi High-Technologies Corporation
    Inventors: Shinya MATSUOKA, So OGUCHI, Yukie TOKIWA, Toshinari SAKURAI, Yasushi NIIYAMA, Noriko IIZUMI
  • Patent number: 9206462
    Abstract: When automatically classified results are different from judgment of a laboratory technician, the laboratory technician has to reselect the bacterial colonies one-by-one to be a pickup colony through watching the displayed image. To get rid of the inconvenience, provided is a pretreatment device for a bacteria test comprising: a specification unit by which an operator instructs to specify the number of bacterial colonies and the increased/decreased number of the bacterial colonies to be displayed; and a display unit for displaying classification results obtained following the operator's instruction. The pretreatment device for a bacteria test facilitates the automatically classified results to be brought close to the judgment of the laboratory technician, resulting in the saving of the time required for checking the appropriate bacterial colonies for the pickup colony.
    Type: Grant
    Filed: December 1, 2014
    Date of Patent: December 8, 2015
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Noriko Iizumi, Akira Maekawa
  • Patent number: 9058957
    Abstract: A charged particle beam apparatus is provided with a parameter adjustment practice function for allowing any user to easily learn manual focus adjustment and stigma adjustment. Control conditions of the focus arrangement of an objective lens, an X-stigmator and a Y-stigmator are set according to the user's operation. According to a group of the focus adjustment, an X-stigma adjustment and a Y-stigma adjustment which are set, a practice-purpose image corresponding to the control conditions is read out from a storage device and is displayed on a screen.
    Type: Grant
    Filed: May 28, 2012
    Date of Patent: June 16, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura, Shunya Watanabe, Mami Konomi, Shinichi Tomita, Ryuichiro Tamochi
  • Publication number: 20150087017
    Abstract: When automatically classified results are different from judgment of a laboratory technician, the laboratory technician has to reselect the bacterial colonies one-by-one to be a pickup colony through watching the displayed image. To get rid of the inconvenience, provided is a pretreatment device for a bacteria test comprising: a specification unit by which an operator instructs to specify the number of bacterial colonies and the increased/decreased number of the bacterial colonies to be displayed; and a display unit for displaying classification results obtained following the operator's instruction. The pretreatment device for a bacteria test facilitates the automatically classified results to be brought close to the judgment of the laboratory technician, resulting in the saving of the time required for checking the appropriate bacterial colonies for the pickup colony.
    Type: Application
    Filed: December 1, 2014
    Publication date: March 26, 2015
    Inventors: Noriko IIZUMI, Akira MAEKAWA
  • Publication number: 20150074523
    Abstract: Skills of a novice user operating a charged particle beam apparatus can be improved. Provided are an image display device which displays operation items of an electron microscope on an operation screen, a storage device which stores information of assist buttons which display image state information acquired via a detector of the electron microscope such that the information of assist buttons is correspondent to image quality of the image thus acquired as well as to observation conditions composed of a combination of parameter setting values of the electron microscope, an operation program which analyzes the image quality of the image acquired via the detector, acquires the information of the assist buttons based on analytical results of the image quality of the image as well as current observation conditions, and makes the assist buttons be displayed on the predetermined part of the operation screen.
    Type: Application
    Filed: March 15, 2013
    Publication date: March 12, 2015
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yayoi Konishi, Hiroyuki Noda, Takahiro Inada, Kunji Shigeto, Tohru Ando, Noriko Iizumi, Ryuichiro Tamochi, Mitsugu Sato
  • Publication number: 20140131590
    Abstract: In recent years, a range of users for a charged particle beam apparatus such as a scanning electron microscope has been broadened. All users want to learn a manual adjustment technology, but it is very difficult to adjust all parameters for observation to have an appropriate value. Therefore, a beginner is unlikely to sufficiently show a performance of an apparatus. This disclosure aims to provide the charged particle beam apparatus including a parameter adjustment practice function for allowing any user to easily learn the manual adjustment technology. In order to solve the above-described problem, there is provided means for practicing a focus adjustment and a stigma adjustment. Control conditions of the focus arrangement of an objective lens, an X-stigmator and a Y-stigmator are set according to the user's operation.
    Type: Application
    Filed: May 28, 2012
    Publication date: May 15, 2014
    Inventors: Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura, Shunya Watanabe, Mami Konomi, Shinichi Tomita, Ryuichiro Tamochi
  • Publication number: 20120258525
    Abstract: When automatically classified results are different from judgment of a laboratory technician, the laboratory technician has to reselect the bacterial colonies one-by-one to be a pickup colony through watching the displayed image. To get rid of the inconvenience, provided is a pretreatment device for a bacteria test comprising: a specification unit by which an operator instructs to specify the number of bacterial colonies and the increased/decreased number of the bacterial colonies to be displayed; and a display unit for displaying classification results obtained following the operator's instruction. The pretreatment device for a bacteria test facilitates the automatically classified results to be brought close to the judgment of the laboratory technician, resulting in the saving of the time required for checking the appropriate bacterial colonies for the pickup colony.
    Type: Application
    Filed: May 21, 2010
    Publication date: October 11, 2012
    Inventors: Noriko Iizumi, Akira Maekawa
  • Publication number: 20090202390
    Abstract: An automatic analyzer includes a storage unit for storing operation information, information about usage histories of expendable supplies provided for the analysis, and an analysis-ID control unit giving an ID to the analysis, the analysis ID being used as information for identifying the analysis to derive a calibration curve. Data stored in the storage unit is organized along the same time axis both in the order of samples subjected to the analysis and inspection, and in the order of analysis items, so that the data is output in a total data display area. The data is organized from the viewpoint of an analysis process of an analysis item of each sample. By use of information used to identify an influence range based on a kind of an abnormal state, which is stored beforehand, a judgment is made as to whether or not it is necessary to perform reinspection.
    Type: Application
    Filed: February 11, 2009
    Publication date: August 13, 2009
    Inventors: Noriko IIZUMI, Tomoko Tomiyama, Yoshimitsu Takagi, Kyoko Imai, Ryuichiro Kodama, Tomonori Mimura