Abstract: A solid-state image pickup device has a plurality of photoelectric conversion elements arranged in a two-dimensional pattern, to which horizontal and vertical switches are coupled for selecting the photoelectric conversion elements; horizontal and vertical scanning circuitry for turning the switches "on" and "off" are integrated on the same semiconductor substrate. In order to detect an image with low capacitive lag and high resolution power, the required minimum number (four) of switching elements, adapted to turn respective fields "on" and "off" in a predetermined combination, are connected to an output terminal of each of the unit circuits which constitute the vertical scanning circuit. Using an output scanning pulse from the vertical scanning circuit and a field pulse, interlaced scanning in which two row lines are simultaneously selected in one of the combinations differing for the respective fields is executed so as to derive an optical image through the vertical switches.