Patents by Inventor Norio Miyazato

Norio Miyazato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8493558
    Abstract: A surface inspection apparatus includes an irradiating unit that has a plurality of light sources that respectively emit a plurality of illumination light beams having different wavelength ranges, and irradiates an inspection surface as a surface of a body to be inspected with the illumination light beams, in a condition where the light sources are located adjacent to each other and arranged in a given order along the inspection surface, an imaging unit that images reflected light when the illumination light beams are reflected by the inspection surface, so as to obtain a plurality of items of image data corresponding to the respective wavelength ranges, and a control unit that detects a detection object on the inspection surface, based on the items of image data corresponding to the respective wavelength ranges which are obtained by the imaging unit.
    Type: Grant
    Filed: October 8, 2009
    Date of Patent: July 23, 2013
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Yasunori Asada, Norio Miyazato, Eiji Yamazaki
  • Patent number: 8224060
    Abstract: An image processing method that differentiates image data using an image processing system that includes a processing unit and a storage unit includes: acquiring image data; sequentially picking up pixels one by one at a predetermined pitch from among the pixels that constitute the image data and setting the picked up pixels as reference pixels; setting a close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the close regions; setting a wide region larger than the close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the wide regions; and calculating a difference between the density of each of the reference pixels and a corresponding one of the average values of the densities of the pixels of the wide regions.
    Type: Grant
    Filed: October 7, 2009
    Date of Patent: July 17, 2012
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Yasunori Asada, Norio Miyazato, Eiji Yamazaki
  • Publication number: 20100091272
    Abstract: A surface inspection apparatus includes an irradiating unit that has a plurality of light sources that respectively emit a plurality of illumination light beams having different wavelength ranges, and irradiates an inspection surface as a surface of a body to be inspected with the illumination light beams, in a condition where the light sources are located adjacent to each other and arranged in a given order along the inspection surface, an imaging unit that images reflected light when the illumination light beams are reflected by the inspection surface, so as to obtain a plurality of items of image data corresponding to the respective wavelength ranges, and a control unit that detects a detection object on the inspection surface, based on the items of image data corresponding to the respective wavelength ranges which are obtained by the imaging unit.
    Type: Application
    Filed: October 8, 2009
    Publication date: April 15, 2010
    Inventors: Yasunori ASADA, Norio Miyazato, Eiji Yamazaki
  • Publication number: 20100092069
    Abstract: An image processing method that differentiates image data using an image processing system that includes a processing unit and a storage unit includes: acquiring image data; sequentially picking up pixels one by one at a predetermined pitch from among the pixels that constitute the image data and setting the picked up pixels as reference pixels; setting a close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the close regions; setting a wide region larger than the close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the wide regions; and calculating a difference between the density of each of the reference pixels and a corresponding one of the average values of the densities of the pixels of the wide regions.
    Type: Application
    Filed: October 7, 2009
    Publication date: April 15, 2010
    Inventors: Yasunori ASADA, Norio Miyazato, Eiji Yamazaki