Patents by Inventor Norio Satou
Norio Satou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8541871Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: GrantFiled: March 3, 2010Date of Patent: September 24, 2013Assignee: Panasonic CorporationInventors: Hidekazu Tomohiro, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Patent number: 8280148Abstract: A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.Type: GrantFiled: January 12, 2012Date of Patent: October 2, 2012Assignee: Hitachi High-Technologies CorporationInventors: Norio Satou, Susumu Koyama, Masashi Sakamoto, Kenji Obara
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Patent number: 8203504Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: GrantFiled: October 19, 2010Date of Patent: June 19, 2012Assignee: Hitachi High-Technologies CorporationInventors: Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Publication number: 20120114221Abstract: A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.Type: ApplicationFiled: January 12, 2012Publication date: May 10, 2012Applicant: Hitachi High-Technologies CorporationInventors: Norio SATOU, Susumu KOYAMA, Masashi SAKAMOTO, Kenji OBARA
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Patent number: 8121393Abstract: A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.Type: GrantFiled: January 8, 2009Date of Patent: February 21, 2012Assignee: Hitachi High-Technologies CorporationInventors: Norio Satou, Susumu Koyama, Masashi Sakamoto, Kenji Obara
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Patent number: 7994616Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: GrantFiled: July 24, 2009Date of Patent: August 9, 2011Assignee: Panasonic CorporationInventors: Hidekazu Tomohiro, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Patent number: 7941008Abstract: According to the pattern search method of the present invention, detection of a detection image region relative to an observation image is performed by a pattern matching. An image whose size is substantially the same as that of the observation image is used as the detection image region. The detection image region is relatively displaced with reference to the observation image, thereby detecting a degree of similarity for a common region which is common to both of the region and the image. Displacement range of the detection image region is set in advance. If area of the common region is larger than a predetermined value, calculating the degree of similarity will be performed.Type: GrantFiled: April 13, 2005Date of Patent: May 10, 2011Assignee: Hitachi High-Technologies CorporationInventors: Norio Satou, Akiyuki Sugiyama, Osamu Komuro, Satoru Yamaguchi
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Publication number: 20110032176Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: ApplicationFiled: October 19, 2010Publication date: February 10, 2011Inventors: Atsushi KOBARU, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Patent number: 7817105Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: GrantFiled: March 5, 2007Date of Patent: October 19, 2010Assignee: Hitachi High-Technologies CorporationInventors: Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Publication number: 20100155770Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: ApplicationFiled: March 3, 2010Publication date: June 24, 2010Applicant: Panasonic CorporationInventors: Hidekazu TOMOHIRO, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Patent number: 7692277Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: GrantFiled: January 13, 2004Date of Patent: April 6, 2010Assignee: Panasonic CorporationInventors: Hidekazu Tomohiro, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Publication number: 20090283791Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: ApplicationFiled: July 24, 2009Publication date: November 19, 2009Applicant: PANASONIC CORPORATIONInventors: Hidekazu TOMOHIRO, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Publication number: 20090180680Abstract: A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.Type: ApplicationFiled: January 8, 2009Publication date: July 16, 2009Inventors: Norio Satou, Susumu Koyama, Masashi Sakamoto, Kenji Obara
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Publication number: 20070159662Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: ApplicationFiled: March 5, 2007Publication date: July 12, 2007Inventors: Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Patent number: 7187345Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: GrantFiled: December 12, 2005Date of Patent: March 6, 2007Assignee: Hitachi High-Technologies CorporationInventors: Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Publication number: 20070024528Abstract: An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.Type: ApplicationFiled: December 12, 2005Publication date: February 1, 2007Inventors: Atsushi Kobaru, Hidetoshi Morokuma, Hiroki Kawada, Sho Takami, Katsuhiro Sasada, Kouichi Yamamoto, Norio Satou, Kunio Nakanishi
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Publication number: 20060102936Abstract: A lead frame (100) for a semiconductor device is formed by applying nickel plating (102), palladium plating (103), and gold flash plating (104) substantially entirely to lead frame body (101) such as copper thin plate in this order, and further applying silver plating (105) selectively to part of an inner part that is to be enclosed with a package of the semiconductor device. The lead frame (100) may also include a base of the package. The silver plating contributes to an excellent light reflectance and wire bonding efficiency of the inner part, whereas the gold flash plating contributes to an excellent resistance to corrosion and soldering efficiency of an outer part that is outside the package.Type: ApplicationFiled: January 13, 2004Publication date: May 18, 2006Inventors: Hidekazu Tomohiro, Masayuki Fujii, Norio Satou, Tomoyuki Yamada, Tomio Kusano
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Publication number: 20050232493Abstract: According to the pattern search method of the present invention, detection of a detection image region relative to an observation image is performed by a pattern matching. An image whose size is substantially the same as that of the observation image is used as the detection image region. The detection image region is relatively displaced with reference to the observation image, thereby detecting a degree of similarity for a common region which is common to both of the region and the image. Displacement range of the detection image region is set in advance. If area of the common region is larger than a predetermined value, calculating the degree of similarity will be performed.Type: ApplicationFiled: April 13, 2005Publication date: October 20, 2005Inventors: Norio Satou, Akiyuki Sugiyama, Osamu Komuro, Satoru Yamaguchi