Abstract: Provided are a surface inspection device that evaluates a shape of a molded product with high accuracy in a shorter time than in the related art, a shape correction device, a surface inspection method, and a shape correction method. A point measurement sensor 201 that measures each of positions of predetermined points 102 set on a surface of an inspection target 101; a surface measurement sensor 202 that measures a shape of a predetermined surface 103 including the plurality of predetermined points 102 by simultaneously measuring positions of a plurality of points of the inspection target 101; and a deformation amount computation unit 3 that obtains an amount of deformation of the inspection target 101 from a reference shape based on the positions of the predetermined points 102 measured by the point measurement sensor 201 and a normal direction of the predetermined surface 103 measured by the surface measurement sensor 202 are included.

Abstract: An object of this invention is to provide a tomography method and a tomography system capable of tomographic imaging targeted uniquely to the test object among subjects under test. The method involves performing a process of generating projection data about the region of interest by selecting one reference projection data set from a plurality of projection data generated in a tomography process using a plurality of X-ray energy levels and by subtracting from the reference projection data set the product of an attenuation coefficient and the transmission length of the material configuring any region other than the region of interest detected by detector elements of detectors, and performing an image reconstruction computing process to generate a tomographic or stereoscopic image of the region of interest through image reconstruction based on the projection data about the region of interest generated in the projection data generating process.

Abstract: Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.

Abstract: An object of this invention is to provide a tomography method and a tomography system capable of tomographic imaging targeted uniquely to the test object among subjects under test. The method involves performing a process of generating projection data about the region of interest by selecting one reference projection data set from a plurality of projection data generated in a tomography process using a plurality of X-ray energy levels and by subtracting from the reference projection data set the product of an attenuation coefficient and the transmission length of the material configuring any region other than the region of interest detected by detector elements of detectors, and performing an image reconstruction computing process to generate a tomographic or stereoscopic image of the region of interest through image reconstruction based on the projection data about the region of interest generated in the projection data generating process.

Abstract: The invention relates to an X-ray CT system for measuring three-dimensional shapes, while the X-ray system is capable of extracting three-dimensional shape information with high accuracy in consideration of beam hardening depending on a material and thickness of a specimen. The X-ray CT system includes an optical distance meter and a CT image analyzing unit. The optical distance meter measures an outer shape of the specimen simultaneously with a measurement of projection data. The CT image analyzing unit calculates a boundary threshold for the specimen on the basis of a CT image and a measurement value of the outer shape.

Abstract: Provided is an eddy current inspection device, an eddy current inspection probe and an eddy current inspection method that make it possible to detect defects existing in deeper parts of test objects. Three or more odd number of excitation coils are arranged at even intervals in a circumferential direction on a postulated circumference. Excitation currents applied to the excitation coils are controlled so that the phase difference between excitation currents applied to adjacent ones of the excitation coils arranged in the circumferential direction on the postulated circumference equals one cycle divided by the number of excitation coils. A magnetic field generated according to an eddy current occurring in the test object due to a magnetic field caused by the application of the excitation currents to the excitation coils is detected by use of a detector arranged on a postulated plane containing the postulated circumference but inside the postulated circumference.

Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.

Abstract: The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. Thus, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract: An inspecting system of an assembly, for inspecting the assembly, by obtaining three-dimensional position relationship, in short time, for each of parts building up the assembly, comprises: a data editor/processor portion 2 for storing design data therein, and for producing/editing a calculated projection view; a brightness calculating portion 3 for calculating brightness in vicinity of boundaries, which are obtained when photographing the part to be extracted in plural numbers of directions, from the design data, for each direction; a sensitivity determining portion 4 for determining sensitivity of the photographing apparatus upon basis of the brightness, so that the projection image becomes clear in the vicinity of said boundaries; a photographing apparatus 5 for obtaining the projection images in the plural number of directions for the assembly conveyed; a video processor portion 6 for conducting video processing with converting the projection image into an electric signal, as an actual projection view; an

Abstract: The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method of the present invention includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. According to this invention, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

Abstract: A mesh generating method for numerical simulation of one (1) piece of an analysis target, in a short time period, where there are plural numbers of high-density configuration data, each presenting a configuration surface thereof said one (1) piece of analysis target, including the performing of a plurality of sub-steps until when none of the plural numbers of configuration mesh data remains, and mesh data for numerical simulation is generated from the final combined low-density configuration mesh data.

Abstract: In an X-ray CT image reconstruction method, position and size of a high X-ray absorber are determined by photographing a to-be-measured-target using high-energy X-rays, and performing the image reconstruction. Moreover, photographed data is computed which corresponds to a case where the high X-ray absorber is photographed using low-energy X-rays. Next, the to-be-measured-target is photographed using the low-energy X-rays. Furthermore, positions and sizes of low X-ray absorbers are determined by subtracting influence of the high X-ray absorber computed above from projection data which results from the photography using the low-energy X-rays. Finally, the positions and sizes of the high and low X-ray absorbers are synthesized on the reconstructed image.

Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract: A mesh generating method for numerical simulation, generating mesh data for numerical simulation of one (1) piece of an analysis target, in a short time period, where there are plural numbers of high-density configuration data, each presenting a configuration surface thereof said one (1) piece of analysis target, comprising the following steps: a step for reading one (1) piece of the configuration mesh data “A” from the plural numbers of the configuration mesh data; a step for generating low-density configuration mesh data “B” through treating a density lowering process for reducing a number of meshes on the configuration mesh data “A”; a step for reading configuration mesh data “C” neighboring to said configuration mesh data “A” from the plural numbers of configuration mesh data; a step for generating mixed and combined configuration mesh data “D” mixing a low density portion and a high density portion therein, through combining the low-density configuration mesh data “B” with the configuration mesh data “C”

Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.