Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Abstract: Exemplary embodiments provide a computer-implemented method and a system for a startup cycle for a cycle deterministic start. An initializing mechanism applies power to a microprocessor. The initializing mechanism initializes the configuration of the microprocessor. The initializing mechanism initializes a timer. The initializing mechanism then sends a clock start command to the microprocessor. The clocks on the microprocessor are started. Upon the clocks starting, the timer begins and allows temporary transients, such as voltage droop due to a large instantaneous change in demand for current due to the commencement of clock switching. Responsive to the timer reaching a target value, an interrupt unit sends a system reset interrupt. Responsive to the interrupt unit sending the system reset interrupt, an instruction fetch unit fetches a first instruction. This operation will be deterministic to the state of the rest of the microprocessor memory elements (latches, arrays, et al.).

Abstract: Sensors on the integrated circuit are used to detect the current operating state of the chip, such as frequency, voltage, temperature characteristics, or variation in the integrated circuit manufacturing process. In response, the integrated circuit may choose to modify operational parameters (such as frequency, voltage, or power-down states) in order to dynamically and autonomously maintain an optimal performance and/or power-efficiency operational point.

Abstract: A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing.

Abstract: Sensors on the integrated circuit are used to detect the current operating state of the chip, such as frequency, voltage, temperature characteristics, or variation in the integrated circuit manufacturing process. In response, the integrated circuit may choose to modify operational parameters (such as frequency, voltage, or power-down states) in order to dynamically and autonomously maintain an optimal performance and/or power-efficiency operational point.

Abstract: Exemplary embodiments provide a computer-implemented method and a system for a startup cycle for a cycle deterministic start. An initializing mechanism applies power to a microprocessor. The initializing mechanism initializes the configuration of the microprocessor. The initializing mechanism initializes a timer. The initializing mechanism then sends a clock start command to the microprocessor. The clocks on the microprocessor are started. Upon the clocks starting, the timer begins and allows temporary transients, such as voltage droop due to a large instantaneous change in demand for current due to the commencement of clock switching. Responsive to the timer reaching a target value, an interrupt unit sends a system reset interrupt. Responsive to the interrupt unit sending the system reset interrupt, an instruction fetch unit fetches a first instruction. This operation will be deterministic to the state of the rest of the microprocessor memory elements (latches, arrays, et al.).

Abstract: A digitally tunable low voltage CMOS current reference is disclosed. A tunable current reference circuit is provided that includes a current source circuit that is coupled to a power supply voltage. The current source circuit provides a stable current reference output regardless of fluctuations in the power supply voltage. Multiple digitally selectable inputs are included in the current reference circuit and are coupled to the current source circuit. These inputs are used to adjust a value of the current reference output.

Abstract: A mechanism is provided to address a structure under test and to identify a point of failure. A test open line carries a signal that indicates whether a structure under test is open or closed. A test short line carries a signal that indicates whether a structure under test is shorted. A test structure may include an array of cells, where each cell includes a circuit including structures to test. The cells may be scanned using scan only latches and signals on the test open and/or test short lines may be recorded. A test circuit may include a digital mode and an analog mode. The digital mode provides an open or closed value. The analog mode includes a programmable load. The output of the analog mode provides a resistance value that is relative to the programmable load.

Abstract: An apparatus and method for accurately tuning the speed of an integrated circuit, i.e. a computer chip, using a built-in sense circuit and controller are provided. The sense circuit is provided in association with a monitored path. The sense circuit includes a variable delay element coupled to a controller. A data signal from the monitored path is provided to the sense circuit which adds an amount of delay as determined by the controller to the data signal. The delayed data signal and the original data signal are compared to determine if their values match. If they match, then the amount of delay added by the variable delay element is increased. If they do not match, then a previous amount of delay, prior to the mismatch, is output as the slack of the monitored path. The slack may then be used to tune the speed of the integrated circuit.

Abstract: An existing trace array on a chip is used to store the locations of bit failures from the automatic self-testing of an SRAM array. If a system is having problems, a technician can trigger the automatic test and then scan the trace array, thereby locating a large number of errors on the SRAM array very quickly.

Abstract: Repairing arrays on a processor with an on chip built in self test engine on the processor is provided. A subset of the arrays is selected for testing. Data patterns are sent from the test engine to the subset of arrays at a plurality of operating parameters. A response is received at the test engine from the subset of arrays at the operating parameters. The received response is compared to an expected response using the test engine, wherein the processor controller determines if additional test failures were detected by the test engine for the subset of arrays with a plurality of JTAG based instructions. Code in the processor controller then determines the states that need to be scanned into the scannable latches to force the array control logic to choose additional spare wordlines and/or bitlines to repair the newly identified failures in addition to all previously defined repair actions.

Abstract: A power-supply filter that is built into an integrated circuit package is disclosed. An LC, RC, or RLC filter is built into the integrated circuit's chip carrier module and connected so as to filter the power supply entering the integrated circuit. By manufacturing the filter as part of the integrated circuit package, a chip manufacturer can eliminate the need for application-level developers to provide an external filtering network in the deployment of the integrated circuit in an application circuit.

Abstract: A power-supply filter that is built into an integrated circuit package is disclosed. An LC, RC, or RLC filter is built into the integrated circuit's chip carrier module and connected so as to filter the power supply entering the integrated circuit. By manufacturing the filter as part of the integrated circuit package, a chip manufacturer can eliminate the need for application-level developers to provide an external filtering network in the deployment of the integrated circuit in an application circuit.

Abstract: Repairing a plurality arrays on a processor with an on chip built in self test engine on the processor is provided. A subset of the plurality of arrays is selected for testing. Data patterns are sent from the on chip built in self test engine to the subset of the plurality of arrays on the processor at a plurality of operating parameters. A response is received at the on chip built in self test engine from the subset of the plurality of arrays at the plurality of operating parameters. The response from the subset of the plurality of arrays is compared to an expected response using the on chip built in self test engine, wherein the processor controller determines if additional test failures were detected by the ABIST engine(s) for the subset of the plurality of arrays with a plurality of JTAG based instructions.

Abstract: A charge-pump which substantially reduces transient currents in the switches that connect output control signals to current sources and sinks, to provide improved response for very small phase errors. In a differential embodiment, the charge-pump uses four transistors connected respectively to two current sources and two current sinks, and the reduction in transients is achieved by providing four additional transistors which are connected with the first four transistors to form four pairs of source-coupled transistors. The four pairs of source-coupled transistors are cross-connected to keep the current sources and sinks at constant bias through near-constant conduction, which substantially eliminates any turn-on transients and provides a smoother response.

Abstract: A clock receiver system (10) includes a clock receiver circuit (14), a phase-lock loop circuit (15), and a clock receiver mirror circuit (16). The clock receiver circuit (14) comprises a differential amplifier having complementary first and second clock inputs and producing a clock receiver output (20). The clock receiver output (20) is applied as a first input to the phase-lock loop circuit (15). The output of the phase-lock loop circuit comprises a phase-locked clock output (22) which is directed to a clock distribution arrangement (25). The signal at the clock distribution arrangement (25) is fed back to the second input of the phase-lock loop circuit (15) through the clock receiver mirror circuit (16). The clock receiver circuit (14) and clock receiver mirror circuit (16) are both self-biased and include identical circuit components.