Patents by Inventor Norris C. Hekimian

Norris C. Hekimian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4833675
    Abstract: In the particular embodiment of the invention described in the specification, a frame slip detector for a detecting frame slip in a 24 channel PCM transmission system using an 8 KHz frame rate supplies a 1 KHz test tone to one channel of the system. A phase shift detector detects phase shifts in the same channel and supplies them to a frame slip indicator which responds to phase shift signals within the range from 40 degrees to 50 degrees which recur at periodic intervals of at least one second and supplies corresponding indications of frame slip for each phase shift detected.
    Type: Grant
    Filed: June 2, 1987
    Date of Patent: May 23, 1989
    Assignees: Hekimian Laboratories, Inc., Bell Communications Research, Inc.
    Inventors: Norris C. Hekimian, James F. Ingle
  • Patent number: 4220914
    Abstract: A measure of delay distortion produced in a circuit under test is provided by applying a purely amplitude-modulated carrier to the circuit and detecting the resulting phase modulation.
    Type: Grant
    Filed: June 14, 1978
    Date of Patent: September 2, 1980
    Assignee: Hekimian Laboratories, Inc.
    Inventor: Norris C. Hekimian
  • Patent number: 4149044
    Abstract: Amplitude and phase jitter can be individually or simultaneously viewed and immediately quantified on an oscilloscope by alternately applying both jitter signals to the vertical (or horizontal) deflection plates at a prescribed chopping frequency and applying the chopping signal to the horizontal (or vertical) deflection plates. The chopping signal frequency should be sufficiently greater than the bandwidth of the jitter signals to permit proper sampling. The resulting display is two spaced vertical (or horizontal) lines, the lengths of which represent instantaneous amplitude and phase jitter, respectively. Another embodiment alternately applies one of the jitter signals to the vertical plates while grounding the horizontal plates and applies the other jitter signal to the horizontal plates while grounding the vertical plates, the alternation being effected at a chopping frequency which is sufficiently high to permit proper sampling of the jitter signals.
    Type: Grant
    Filed: January 10, 1978
    Date of Patent: April 10, 1979
    Inventors: Norris C. Hekimian, Chong-Soo Kim
  • Patent number: 4132957
    Abstract: The gain of an operational amplifier is switched between +K dB and -K dB by switching circuit positions of the input and feedback impedances. The gain is changed in 0.1 dB steps by changing either the input or feedback impedance by a ratio of 1.0116 for each step. The gain is changed in 1.0 dB steps by changing the other of the feedback or input impedance by a ratio of 1.122 for each step. A novel two-pole switching arrangement employs the foregoing techniques to permit unambiguous gain polarity changes.
    Type: Grant
    Filed: October 26, 1977
    Date of Patent: January 2, 1979
    Assignee: Hekimian Laboratories, Inc.
    Inventors: Norris C. Hekimian, Chong-Soo Kim
  • Patent number: 3963992
    Abstract: An intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test. The two pairs of tones simulate two respective noise band test signals but eliminate the long time averaging required for measurements when noise bands are used. A highly linear AGC circuit employs sampling at an output-controlled duty cycle to maintain a constant reference level for the analyzer. This reference level permits automatic distortion measurements to be read out directly in db below the test signal. An RMS detector circuit for second order intermodulation products employs feedback control to maintain the input signal to a squaring circuit constant. Squaring of the constant level sinusoids produces RMS DC components which can be separated for direct measurement. A distortion circuit provides known levels of second and third order intermodulation in the test signal to permit accurate check out of the analyzer.
    Type: Grant
    Filed: August 14, 1974
    Date of Patent: June 15, 1976
    Assignee: Hekimian Laboratories, Inc.
    Inventors: Norris C. Hekimian, James F. Turner
  • Patent number: 3961255
    Abstract: In a phase lock loop, the bandwidth of the phase error signal, when used for phase measurement outside the loop, is increased by summing the error signal with an integrated version of the VCO control signal derived from the loop filter circuit. The combined effect on the error signal of both the loop filter circuit and the integration provides a boost effect at low frequencies, which when summed with the unprocessed error signal results in a broadband measurement signal with a low frequency cut-off below the low-frequency cut-off of the loop itself. This technique permits extending the bandwidth of the measurement signal without affecting loop operation.
    Type: Grant
    Filed: August 15, 1974
    Date of Patent: June 1, 1976
    Assignee: Hekimian Laboratories, Inc.
    Inventor: Norris C. Hekimian
  • Patent number: 3961264
    Abstract: A frequency converter circuit includes an input voltage-to-current converter which delivers signal current to a tuned IF circuit via a current steering circuit controlled by a local oscillator. In a preferred embodiment voltage-to-current conversion is effected without introducing unwanted harmonics by a double-gate MOSFET. Current steering is performed by a pair of push-pull connected transistors alternately driven into saturation by the local oscillator so that they alternately deliver signal current to the tank circuit in opposite senses. A current-limited diode clamps the output signal level in response to high input current levels to prevent over-driving an output filter.
    Type: Grant
    Filed: May 2, 1974
    Date of Patent: June 1, 1976
    Assignee: Hekimian Laboratories, Inc.
    Inventors: Norris C. Hekimian, Walter Mack
  • Patent number: 3940703
    Abstract: An intermodulation distortion analyzer generates two pairs of sinusoidal test tones to serve as a test signal for the channel under test. The two pairs of tones simulate two respective noise band test signals but eliminate the long time averaging required for measurements when noise bands are used. A highly linear AGC circuit employs sampling at an output-controlled duty cycle to maintain a constant reference level for the analyzer. This reference level permits automatic distortion measurements to be read out directly in db below the test signal. An RMS detector circuit for second order intermodulation products employs feedback control to maintain the input signal to a squaring circuit constant. Squaring of the constant level sinusoids produces RMS DC components which can be separated for direct measurement. A distortion circuit provides known levels of second and third order intermodulation in the test signal to permit accurate check out of the analyzer.
    Type: Grant
    Filed: August 14, 1974
    Date of Patent: February 24, 1976
    Assignee: Hekimian Laboratories, Inc.
    Inventors: Norris C. Hekimian, James F. Turner