Abstract: A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.

Abstract: A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.