Patents by Inventor Nurrachman Chih Yeh Liu

Nurrachman Chih Yeh Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Randomized value generation
    Patent number: 9075675
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Grant
    Filed: June 2, 2011
    Date of Patent: July 7, 2015
    Assignee: The Regents of the University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M Hanson, Nathaniel Pinckney, David T Blaauw, Dennis M. Sylvester
  • Randomized value generation
    Patent number: 8930427
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Grant
    Filed: June 2, 2011
    Date of Patent: January 6, 2015
    Assignee: The Regents of the University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M Hanson, Nathaniel Pinckney, David T Blaauw, Dennis M. Sylvester
  • Randomized value generation
    Publication number: 20120030268
    Abstract: A data processing apparatus is provided for producing a randomized value. A cell in the data processing apparatus comprises a dielectric oxide layer and stress voltage circuitry is configured to apply a stress voltage across the dielectric oxide layer of the cell to cause an oxide breakdown process to occur. Oxide breakdown detection circuitry is configured to determine a current extent of the oxide breakdown process by measuring a response of the dielectric oxide layer to the stress voltage and randomized value determination circuitry is configured to determine a randomized value in dependence on the current extent of the oxide breakdown process.
    Type: Application
    Filed: June 2, 2011
    Publication date: February 2, 2012
    Applicant: University of Michigan
    Inventors: Nurrachman Chih Yeh Liu, Scott M. Hanson, Nathaniel Pinckney, David T. Blaauw, Dennis M. Sylvester