Abstract: A method of operating a data processing system to estimate the inductance values associated with a first metal trace having a defined width, thickness, and length in an integrated circuit. In the present invention, the number and location of any ground planes that are adjacent to the first trace in the integrated circuit are first determined. A first current loop passing through the first trace that depends on the number and location of the ground planes, if any, is defined. The magnetic flux per unit area generated in the first current loop when a predetermined current passes through the first trace is then determined and used to estimate the self-inductance of the first trace. If the first trace is adjacent to any ground planes, current loops through the first trace and the ground planes are also defined.