Abstract: A request for a page is received. The page is provided at least in part by determining dynamically a content element for the page. An auction to determine a winning bid is conducted prior to providing the page in response to the request and the content element determined based at least in part on the auction winner.

Abstract: A semiconductor metrology system including a spectrum acquisition tool for collecting, using a first measurement protocol, baseline scatterometric spectra on first semiconductor wafer targets, and for various sources of spectral variability, variability sets of scatterometric spectra on second semiconductor wafer targets, the variability sets embodying the spectral variability, a reference metrology tool for collecting, using a second measurement protocol, parameter values of the first semiconductor wafer targets, and a training unit for training, using the collected spectra and values, a prediction model using machine learning and minimizing an associated loss function incorporating spectral variability terms, the prediction model for predicting values for production semiconductor wafer targets based on their spectra.

Abstract: A system and methods for Advance Process Control (APC) in semiconductor manufacturing include: for each of a plurality of waiter sites, receiving a pre-process set of scatterometric training data, measured before implementation of a processing step, receiving a corresponding post-process set of scatterometric training data measured after implementation of the process step, and receiving a set of process control knob training data indicative of process control knob settings applied during implementation of the process step; and generating a machine learning model correlating variations in the pre-process sets of scatterometric training data and the corresponding process control knob training data with the corresponding post-process sets of scatterometric training data, to train the machine learning model to recommend changes to process control knob settings to compensate for variations in the pre-process scatterometric data.

Abstract: Methods of in vitro clonal propagation and regeneration in Cannabis are provided. Also provided is the use of such methods in improvements of cannabis cultivars such as via breeding.

Abstract: A request for a page is received. A processor is used to provide an optimized version of the page at least in part by determining dynamically an optimized content element for the page based at least in part on a user attribute associated with the request and content performance data generated based at least in part on testing of alternative versions of the page with respect to other users having the user attribute. The provided optimized version of the page is selected from the alternative versions of the page based on the content performance data indicating that the selected version of the page is optimized for the other users having the user attribute.

Abstract: A semiconductor metrology system including a spectrum acquisition tool for collecting, using a first measurement protocol, baseline scatterometric spectra on first semiconductor wafer targets, and for various sources of spectral variability, variability sets of scatterometric spectra on second semiconductor wafer targets, the variability sets embodying the spectral variability, a reference metrology tool for collecting, using a second measurement protocol, parameter values of the first semiconductor wafer targets, and a training unit for training, using the collected spectra and values, a prediction model using machine learning and minimizing an associated loss function incorporating spectral variability terms, the prediction model for predicting values for production semiconductor wafer targets based on their spectra.

Abstract: A polynucleotide comprising a nucleic acid sequence encoding an expression product of interest under a transcriptional control of a heterologous cis-acting regulatory element comprising a nucleic acid sequence at least 85% identical to SEQ ID NO: 2 (CsUbiquitin10), 4 (CsPs2), 6 (CsActin), 8 (CsTubulin), 10 (Cs EIF), 28 (metallothionein 2A), 30 (Catalase), 32 (Asparagine synthetase), 34 (60S ribosomal protein L3), 38 (40S ribosomal protein S3a), 40 (Phi-1 protein) or 44 (Receptor for activated protein kinase C) is provided. Also provided are nucleic acid constructs and cells comprising same.

Abstract: A system and methods for Advance Process Control (APC) in semiconductor manufacturing include: for each of a plurality of waiter sites, receiving a pre-process set of scatterometric training data, measured before implementation of a processing step, receiving a corresponding post-process set of scatterometric training data measured after implementation of the process step, and receiving a set of process control knob training data indicative of process control knob settings applied during implementation of the process step; and generating a machine learning model correlating variations in the pre-process sets of scatterometric training data and the corresponding process control knob training data with the corresponding post-process sets of scatterometric training data, to train the machine learning model to recommend changes to process control knob settings to compensate for variations in the pre-process scatterometric data.

Abstract: A semiconductor metrology system including a spectrum acquisition tool for collecting, using a first measurement protocol, baseline scatterometric spectra on first semiconductor wafer targets, and for various sources of spectral variability, variability sets of scatterometric spectra on second semiconductor wafer targets, the variability sets embodying the spectral variability, a reference metrology tool for collecting, using a second measurement protocol, parameter values of the first semiconductor wafer targets, and a training unit for training, using the collected spectra and values, a prediction model using machine learning and minimizing an associated loss function incorporating spectral variability terms, the prediction model for predicting values for production semiconductor wafer targets based on their spectra.

Abstract: A request for a page is received. The page is provided at least in part by determining dynamically a content element for the page. An auction to determine a winning bid is conducted prior to providing the page in response to the request and the content element determined based at least in part on the auction winner.

Abstract: A request for a page is received. A processor is used to provide an optimized version of the page at least in part by determining dynamically an optimized content element for the page based at least in part on a user attribute associated with the request and content performance data generated based at least in part on testing of alternative versions of the page with respect to other users having the user attribute. The provided optimized version of the page is selected from the alternative versions of the page based on the content performance data indicating that the selected version of the page is optimized for the other users having the user attribute.

Abstract: A request for a page is received. The page is provided at least in part by determining dynamically a content element for the page. An auction to determine a winning bid is conducted prior to providing the page in response to the request and the content element determined based at least in part on the auction winner.

Abstract: A request for a page is received. A page structure and content elements associated with the page are determined. An optimized version of the page is provided at least in part by determining dynamically an optimized content element for the page based at least in part on the determined page structure and the determined content elements associated with the page and including the optimized content element as a static element in the optimized version of the page in place of one of the determined content elements that corresponds to a script.

Abstract: A request for a page is received. A client-side executable code that is included in a plurality of content elements associated with the page is extracted. A single instance of the client-side executable code is injected at an optimized location of the page. The page that includes the single instance of the client-side executable code is provided.

Abstract: A test structure for use in metrology measurements of a sample pattern formed by periodicity of unit cells, each formed of pattern features arranged in a spaced-apart relationship along a pattern axis, the test structure having a test pattern, which is formed by a main pattern which includes main pattern features of one or more of the unit cells and has a symmetry plane, and a predetermined auxiliary pattern including at least two spaced apart auxiliary features located within at least some of those features of the main pattern, parameters of which are to be controlled during metrology measurements.

Abstract: A system and methods for Advance Process Control (APC) in semiconductor manufacturing include: for each of a plurality of waiter sites, receiving a pre-process set of scatterometric training data, measured before implementation of a processing step, receiving a corresponding post-process set of scatterometric training data measured after implementation of the process step, and receiving a set of process control knob training data indicative of process control knob settings applied during implementation of the process step; and generating a machine learning model correlating variations in the pre-process sets of scatterometric training data and the corresponding process control knob training data with the corresponding post-process sets of scatterometric training data, to train the machine learning model to recommend changes to process control knob settings to compensate for variations in the pre-process scatterometric data.

Abstract: A request for a page is received. A processor is used to provide an optimized version of the page at least in part by determining dynamically an optimized content element for the page based at least in part on a user attribute associated with the request and content performance data generated based at least in part on testing of alternative versions of the page with respect to other users having the user attribute. The provided optimized version of the page is selected from the alternative versions of the page based on the content performance data indicating that the selected version of the page is optimized for the other users having the user attribute.

Abstract: Methods of in vitro clonal propagation, regeneration and transformation in Cannabis are provided. Also provided is the use of such methods in improvements of cannabis cultivars such as via breeding.

Abstract: A method of controlling cannabinoid synthesis in a cell or plant or plant part comprising same is provided. The method comprising modulating expression in the cell of at least one polypeptide comprising an amino acid sequence at least 95% identical to SEQ ID NO: 1-15 and 18-86, the polypeptide modulating cannabinoid synthesis, thereby controlling cannabinoid synthesis in the cell. Also provided are methods of producing cannabinoids and selecting plants producing cannabinoids of interest.

Abstract: A system and method of constructing a 3D model of surface may include: sequentially acquiring multiple pairs of stereoscopic images of a surface from a stereoscopic camera; and incrementally constructing a 3D model of the surface from the image pairs, concurrently with the sequential image acquisition.