Abstract: Provided are a method of testing semiconductor device and a system for testing semiconductor device. The method includes measuring a minimum operating voltage of each of a plurality of sample semiconductor devices and an operating frequency of corresponding ring oscillators included in each of the plurality of sample semiconductor devices, generating a model between the operating frequencies of the ring oscillators and the minimum operating voltages of the sample semiconductor devices, measuring an operating frequency of ring oscillators included in a target semiconductor device, and determining a target minimum operating voltage of the target semiconductor device based on the operating frequency of the ring oscillators of the target semiconductor device and the model.

Abstract: Provided are a method of testing semiconductor device and a system for testing semiconductor device. The method includes measuring a minimum operating voltage of each of a plurality of sample semiconductor devices and an operating frequency of corresponding ring oscillators included in each of the plurality of sample semiconductor devices, generating a model between the operating frequencies of the ring oscillators and the minimum operating voltages of the sample semiconductor devices, measuring an operating frequency of ring oscillators included in a target semiconductor device, and determining a target minimum operating voltage of the target semiconductor device based on the operating frequency of the ring oscillators of the target semiconductor device and the model.

Abstract: A method of operating a storage system, comprising: issuing a first command to write a first data to a first nonvolatile storage device; writing the first data to a second nonvolatile storage device if write condition is unstable; retrieving the first data from the second nonvolatile storage device; and writing the first data to the first nonvolatile storage device during a stable write condition, wherein whether write condition is stable is determined based on one of a sensor output or a memory access status signal, and wherein the memory access status signal is one of a predetermined value of retries, idling, access commands, or any combination thereof.