Patents by Inventor Oh-Won Kwon

Oh-Won Kwon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240118028
    Abstract: An infrared heat source module is configured to minimize problems such as wrinkles or cracks in electrodes even if the patterns of a coated part and an uncoated part of the electrodes present in a current collector vary. The module improves a drying efficiency of the coated part of the current collector. An electrode using the infrared heat source module is manufactured by a process.
    Type: Application
    Filed: January 27, 2022
    Publication date: April 11, 2024
    Applicant: LG Energy Solution, Ltd.
    Inventors: Soon Sik Choi, Young Kuk Ko, Oh Cheol Kwon, Ji Hwan Kim, Jeong Won Lee
  • Patent number: 10036722
    Abstract: An ion concentration measuring method and apparatus are provided. The ion concentration measuring apparatus includes an ion sensing layer in contact with a solution, a plurality of transistors having gate electrodes connected to the ion sensing layer, and a reading unit configured to change frequency information by using drain currents from the plurality of transistors and generate ion concentration information by using the frequency information.
    Type: Grant
    Filed: December 4, 2015
    Date of Patent: July 31, 2018
    Assignee: KOREA INSTITUTE OF MACHINERY & MATERIALS
    Inventors: Kang-Ho Lee, Oh Won Kwon, Bong Seop Kwak, Dong Kyu Lee
  • Publication number: 20160341690
    Abstract: An ion concentration measuring method and apparatus are provided. The ion concentration measuring apparatus includes an ion sensing layer in contact with a solution, a plurality of transistors having gate electrodes connected to the ion sensing layer, and a reading unit configured to change frequency information by using drain currents from the plurality of transistors and generate ion concentration information by using the frequency information.
    Type: Application
    Filed: December 4, 2015
    Publication date: November 24, 2016
    Inventors: Kang-Ho LEE, Oh Won KWON, Bong Seop KWAK, Dong Kyu LEE
  • Patent number: 8759079
    Abstract: An apparatus for automatically analyzing a nucleic acid includes: a sample preprocessing device including a plurality of chambers in which reagents mixed with a sample are accommodated according to sample preprocessing process order for extracting a nucleic acid from the sample; and a nucleic amplifying and detecting device connected with the sample preprocessing device to receive the nucleic acid extracted from the sample.
    Type: Grant
    Filed: December 8, 2011
    Date of Patent: June 24, 2014
    Assignee: Korea Institute of Machinery & Materials
    Inventor: Oh Won Kwon
  • Publication number: 20130122576
    Abstract: An apparatus for automatically analyzing a nucleic acid includes: a sample preprocessing device including a plurality of chambers in which reagents mixed with a sample are accommodated according to sample preprocessing process order for extracting a nucleic acid from the sample; and a nucleic amplifying and detecting device connected with the sample preprocessing device to receive the nucleic acid extracted from the sample.
    Type: Application
    Filed: December 8, 2011
    Publication date: May 16, 2013
    Applicant: KOREA INSTITUTE OF MACHINERY & MATERIALS
    Inventor: Oh Won KWON
  • Patent number: 6711074
    Abstract: Circuits and methods for repairing a column in repairing a row by using an adjacent block are disclosed. An adjacent block selecting fuse unit generates an adjacent block selecting signal in response to a column redundancy start signal. The adjacent block selecting signal determines whether to use either row repair lines of a block designated by an externally inputted block address or row repair lines of an adjacent block of the block. A fuse unit receives the column redundancy start signal, the adjacent block designating bit, the inverted adjacent block designating bit and a plurality block address bits in which the adjacent block designated bit and the inverted adjacent block designating bit are removed from the block address and the inverting block address, and outputs an output signal.
    Type: Grant
    Filed: June 19, 2002
    Date of Patent: March 23, 2004
    Assignee: Hynix Semiconductor Inc.
    Inventor: Oh Won Kwon
  • Publication number: 20030031061
    Abstract: Circuits and methods for repairing a column in repairing a row by using an adjacent block, are disclosed. An adjacent block selecting fuse unit generates an adjacent block selecting signal in response to a column redundancy start signal. The adjacent block selecting signal determines whether to use either row repair lines of a block designated by an externally inputted block address or row repair lines of an adjacent block of the block. A fuse unit receives the column redundancy start signal, the adjacent block designating bit, the inverted adjacent block designating bit and a plurality block address bits in which the adjacent block designated bit and the inverted adjacent block designating bit are removed from the block address and the inverting block address, and outputs an output signal.
    Type: Application
    Filed: June 19, 2002
    Publication date: February 13, 2003
    Inventor: Oh Won Kwon
  • Patent number: 6404680
    Abstract: The present invention comprises a first means to select all repair fuse cells, using a test mode, and to sense each repair fuse cell state depending on the applied read-out voltage; a logical means to generate decision signals to decide the overerasing state of said repair fuse cells by logically combining sensed signals from said each repair fuse cell; and a second means to read output signals of said logical means.
    Type: Grant
    Filed: December 22, 1999
    Date of Patent: June 11, 2002
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventor: Oh Won Kwon
  • Patent number: 6377496
    Abstract: A word line voltage regulation circuit includes a first comparator for comparing a first reference voltage and the potential of an output node; a first switching element for supplying the supply voltage to the output node depending on the output signal of the first comparator; a second comparator for comparing a second reference voltage and the potential of the output node; a second switching element for regulating the potential of the output node depending on the output signal of the second comparator; a third switching element for transmitting the potential of the output node to a decoder circuit depending on a first control signal; and a fourth switching element for supplying the supply voltage to the decoder circuit depending on a second control signal.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: April 23, 2002
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventors: Poong Yeub Lee, Im Cheol Ha, Kye Wan Shin, Oh Won Kwon, Sung Hwan Seo
  • Patent number: 6333666
    Abstract: An antifuse circuit provides a stabilized high voltage to an antifuse programming circuit through the use of an NC pin which is not used in the chip operation.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: December 25, 2001
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventors: Phil-Jung Kim, Jae-Kyung Wee, Chang-Hyuk Lee, Jin-Keun Oh, Jae-Seok Park, Oh-Won Kwon, Ho-Youb Cho
  • Publication number: 20010030570
    Abstract: An antifuse circuit provides a stabilized high voltage to an antifuse programming circuit through the use of an NC pin which is not used in the chip operation.
    Type: Application
    Filed: December 18, 2000
    Publication date: October 18, 2001
    Inventors: Phil-Jung Kim, Jae-Kyung Wee, Chang-Hyuk Lee, Jin-Keun Oh, Jae-Seok Park, Oh-Won Kwon, Ho-Youb Cho
  • Patent number: 5998830
    Abstract: A flash memory cell of the present invention comprises a silicon substrate consisted of an insulating film and a silicon film in which a first and second channel regions are formed and a pair of gate electrodes formed on the first and second channel regions, respectively. Each channel region has a drain region and source region formed at both sides thereof.
    Type: Grant
    Filed: December 29, 1997
    Date of Patent: December 7, 1999
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventor: Oh Won Kwon