Patents by Inventor Oksana Kryachek

Oksana Kryachek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Contactor with angled spring probes
    Publication number: 20080150569
    Abstract: A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to “swipe” the contact pads/solder balls of an IC device under test as the contacts are made. The angulation of the spring probes permit penetration through foreign material layers on the pad/ball surfaces with less contact force.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 26, 2008
    Inventors: Nasser Barabi, Oksana Kryachek, Ho Chee-Wah
  • Spring contact pin for an IC chip tester
    Publication number: 20070018666
    Abstract: A spring contact for IC chip test sockets, contactors, and the like is comprised of a barrel casing and two spring-loaded plungers, and an inward indentation formed at one end of the barrel casing, which pushes into the base end of one of the plungers for reducing the contact resistance between the one plunger and the barrel casing. Preferably, the inward indentation of the spring casing is formed by crimping the end of the spring casing.
    Type: Application
    Filed: July 20, 2006
    Publication date: January 25, 2007
    Inventors: Nasser Barabi, Oksana Kryachek, Chee-Wah Ho