Abstract: A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

Abstract: A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

Abstract: A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

Abstract: There is provided a method for assigning an attribute to x-ray attenuation including scanning in an x-ray scanning device first and second reference materials each having known atomic composition, dimensions and orientation in the scanning device. The device emits x-rays which pass through the first reference material with first reference material path lengths and the second reference material with second reference material path lengths. The x-rays are detected by detectors to provide a plurality of dual-energy attenuation images having dual-energy x-ray attenuation information. The dual-energy x-ray attenuation information in the dual-energy attenuation images is associated with the first and second reference material path lengths.

Abstract: An x-ray screening system includes a plurality of x-ray screening devices each for scanning at least one object of interest. Each screening device emits x-rays which pass through the object of interest and which are detected by a group of detectors including at least one detector to provide measured x-ray energy signals. At least one central processor is in data communication with each screening device for receiving the measured x-ray energy signals from each screening device automatically and in real-time. The at least one processor automatically analyzes the measured x-ray energy signals in real-time to determine at least one property of the object of interest and determining whether the at least one property indicates that at least a portion of the object of interest is composed of a material of interest. The material of interest may be a potentially dangerous material.

Abstract: A method for assigning attributes to an unknown object includes the steps of scanning the unknown object at least partially overlapping with a background object within an x-ray scanning device to provide dual-energy attenuation images having dual-energy attenuation information representing an overlap region wherein the background object and the unknown object overlap, decomposing the attenuation images into reference material equivalent path length images, removing the background object to provide reference material equivalent path lengths representing the unknown object, converting the reference material equivalent path lengths representing the unknown object into unknown object path lengths multiplied by a predetermined scaling factor, reducing the scaling factor to provide a contour of the unknown object and unknown object path lengths, and, determining a density and effective atomic number of the unknown object.

Abstract: A method for assigning one of a safe and threat condition to an object includes determining density and effective atomic number values for a plurality of predetermined safe and threat objects, plotting the values in a probability map to correlate corresponding density and effective atomic number values with each of the safe and threat objects, scanning an object to provide dual-energy attenuation images representing the object, decomposing the attenuation images into dual-reference material equivalent path length images to provide reference material equivalent path lengths representing the object, converting the reference path lengths into object path lengths, determining the effective atomic number for each pixel representing the object, and, imposing the effective atomic number and the mass density of the unknown object onto the probability map to determine a probability that the object is correlated with one of the predetermined safe and threat objects.

Abstract: There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.

Abstract: There is provided a method for assigning an attribute to an unknown object overlapping with a predetermined background object. The unknown object is scanned overlapping with the background object within an x-ray scanning device to obtain a plurality of dual-energy attenuation images having attenuation information representing the background object and an overlap region wherein the background object and the unknown object overlap. The dual-energy attenuation images are decomposed into reference material equivalent path length images. The reference material equivalent path lengths representing the background object in the overlap region are determined and eliminated from the overlap region to provide reference material equivalent path length images having first and second reference material equivalent path lengths through only the unknown object.

Abstract: A scanning system for scanning an object, and a corresponding bracket and method are described. The system has a scanning chamber in which the object to be scanned is received. The system also has a displacement assembly which displaces the object along a displacement path passing at least partially through the scanning chamber. The system also includes a source for emitting electromagnetic (EM) radiation or X-rays against the object within the scanning chamber such that at least some of the EM radiation passes through the object. The source is angled relative to the displacement path at an angle in a range between about 5° to about 8° and about 22° to about 30°. Finally, the system may also have detectors arranged around the scanning chamber which detect the EM radiation which passes through the object. The system, bracket, and method allow for the production of representative three-dimensional views of the object.

Abstract: A method for assigning one of a safe and threat condition to an object includes determining density and effective atomic number values for a plurality of predetermined safe and threat objects, plotting the values in a probability map to correlate corresponding density and effective atomic number values with each of the safe and threat objects, scanning an object to provide dual-energy attenuation images representing the object, decomposing the attenuation images into dual-reference material equivalent path length images to provide reference material equivalent path lengths representing the object, converting the reference path lengths into object path lengths, determining the effective atomic number for each pixel representing the object, and, imposing the effective atomic number and the mass density of the unknown object onto the probability map to determine a probability that the object is correlated with one of the predetermined safe and threat objects.

Abstract: There is provided a method for assigning an attribute to x-ray attenuation including scanning in an x-ray scanning device first and second reference materials each having known atomic composition, dimensions and orientation in the scanning device. The device emits x-rays which pass through the first reference material with first reference material path lengths and the second reference material with second reference material path lengths. The x-rays are detected by detectors to provide a plurality of dual-energy attenuation images having dual-energy x-ray attenuation information. The dual-energy x-ray attenuation information in the dual-energy attenuation images is associated with the first and second reference material path lengths.

Abstract: A method for assigning attributes to an unknown object includes the steps of scanning the unknown object at least partially overlapping with a background object within an x-ray scanning device to provide dual-energy attenuation images having dual-energy attenuation information representing an overlap region wherein the background object and the unknown object overlap, decomposing the attenuation images into reference material equivalent path length images, removing the background object to provide reference material equivalent path lengths representing the unknown object, converting the reference material equivalent path lengths representing the unknown object into unknown object path lengths multiplied by a predetermined scaling factor, reducing the scaling factor to provide a contour of the unknown object and unknown object path lengths, and, determining a density and effective atomic number of the unknown object.

Abstract: There is provided a method for assigning an attribute to an unknown object overlapping with a predetermined background object. The unknown object is scanned overlapping with the background object within an x-ray scanning device to obtain a plurality of dual-energy attenuation images having attenuation information representing the background object and an overlap region wherein the background object and the unknown object overlap. The dual-energy attenuation images are decomposed into reference material equivalent path length images. The reference material equivalent path lengths representing the background object in the overlap region are determined and eliminated from the overlap region to provide reference material equivalent path length images having first and second reference material equivalent path lengths through only the unknown object.

Abstract: There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.