Patents by Inventor Oleg B. Yurchak

Oleg B. Yurchak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180233290
    Abstract: A structural capacitor having a plurality of planar dielectric layers and a plurality of positive and negative electrodes with the positive and negative electrodes alternating between each dielectric layer. First and second spaced apart holes are provided through each dielectric layer as well as the electrodes so that the first holes in the electrodes register with the first holes in the dielectric layer and likewise for the second holes. The capacitor is formed by stacking the dielectric layers and electrodes on two spaced apart alignment pins with a positive alignment pin extending through the first holes and a negative alignment pin extending through the second holes in the dielectric layers and electrodes. These alignment pins maintain layer alignment during subsequent thermal and pressure processing to bond together the dielectric and electrode layers into an integral structural material.
    Type: Application
    Filed: April 13, 2018
    Publication date: August 16, 2018
    Inventors: Daniel M. Baechle, Daniel J. O'Brien, Eric D. Wetzel, Oleg B. Yurchak
  • Patent number: 9959974
    Abstract: A structural capacitor having a plurality of planar dielectric layers and a plurality of positive and negative electrodes with the positive and negative electrodes alternating between each dielectric layer and methods for making structural capacitors are provided. First and second spaced apart holes are provided through each dielectric layer as well as the electrodes so that the first holes in the electrodes register with the first holes in the dielectric layer and likewise for the second holes. The capacitor is formed by stacking the dielectric layers and electrodes on two spaced apart alignment pins with a positive alignment pin extending through the first holes and a negative alignment pin extending through the second holes in the dielectric layers and electrodes. These alignment pins maintain layer alignment during subsequent thermal and pressure processing to bond together the dielectric and electrode layers into an integral structural material.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: May 1, 2018
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Daniel M. Baechle, Daniel J. O'Brien, Eric D. Wetzel, Oleg B. Yurchak
  • Publication number: 20160254093
    Abstract: A structural capacitor having a plurality of planar dielectric layers and a plurality of positive and negative electrodes with the positive and negative electrodes alternating between each dielectric layer. First and second spaced apart holes are provided through each dielectric layer as well as the electrodes so that the first holes in the electrodes register with the first holes in the dielectric layer and likewise for the second holes. The capacitor is formed by stacking the dielectric layers and electrodes on two spaced apart alignment pins with a positive alignment pin extending through the first holes and a negative alignment pin extending through the second holes in the dielectric layers and electrodes. These alignment pins maintain layer alignment during subsequent thermal and pressure processing to bond together the dielectric and electrode layers into an integral structural material.
    Type: Application
    Filed: February 27, 2015
    Publication date: September 1, 2016
    Inventors: Daniel M. Baechle, Daniel J. O'Brien, Eric D. Wetzel, Oleg B. Yurchak