Patents by Inventor Oleg Kononchuck

Oleg Kononchuck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8759881
    Abstract: A heterostructure that includes, successively, a support substrate of a material having an electrical resistivity of less than 10?3 ohm·cm and a thermal conductivity of greater than 100 W·m?1·K?1, a bonding layer, a first seed layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, a second seed layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, and an active layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, and being present in a thickness of between 3 and 100 micrometers. The materials of the support substrate, the bonding layer and the first seed layer are refractory at a temperature of greater than 750° C., the active layer and second seed layer have a difference in lattice parameter of less than 0.005 ?, the active layer is crack-free, and the heterostructure has a specific contact resistance between the bonding layer and the first seed layer that is less than or equal to 0.1 ohm·cm2.
    Type: Grant
    Filed: December 1, 2010
    Date of Patent: June 24, 2014
    Assignee: Soitec
    Inventors: Jean-Marc Bethoux, Fabrice Letertre, Chris Werkhoven, Ionut Radu, Oleg Kononchuck
  • Publication number: 20120241821
    Abstract: A heterostructure that includes, successively, a support substrate of a material having an electrical resistivity of less than 10?3 ohm·cm and a thermal conductivity of greater than 100 W·m?1·K?1, a bonding layer, a first seed layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, a second seed layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, and an active layer of a monocrystalline material of composition AlxInyGa(1-x-y)N, and being present in a thickness of between 3 and 100 micrometers. The materials of the support substrate, the bonding layer and the first seed layer are refractory at a temperature of greater than 750° C., the active layer and second seed layer have a difference in lattice parameter of less than 0.005 ?, the active layer is crack-free, and the heterostructure has a specific contact resistance between the bonding layer and the first seed layer that is less than or equal to 0.1 ohm·cm2.
    Type: Application
    Filed: December 1, 2010
    Publication date: September 27, 2012
    Applicant: SOITEC
    Inventors: Jean-Marc Bethoux, Fabrice Letertre, Chris Werkhoven, Ionut Radu, Oleg Kononchuck