Patents by Inventor Oleg MALTSEV

Oleg MALTSEV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240055247
    Abstract: A system includes a sample chamber, an aperture plate defining an aperture having an aperture axis aligned with a sample location within the sample chamber. The system further includes a first laser source to produce a cloud of material from a sample and a second laser source configured to produce ionized material from the cloud of material. The system also includes an ion extractor assembly defining an ion extraction path and a mass spectrometer in communication with the ion extractor assembly. The ion extractor assembly is switchable between a rejection state in which the ion extractor assembly generates a rejection field to direct ions of the cloud of material away from the ion extractor inlet, and an acceptance state in which the ion extractor assembly generates an acceptance field to direct ionized material produced by the second beam along the ion extraction path.
    Type: Application
    Filed: August 10, 2023
    Publication date: February 15, 2024
    Inventors: Jeffrey WILLIAMS, Jens COLE, Peyton Mackenzie WILLIS, Oleg MALTSEV, Jonathan C. PUTMAN, Nathan KAISER, Cole NAYMARK
  • Patent number: 11769656
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Grant
    Filed: November 1, 2021
    Date of Patent: September 26, 2023
    Assignee: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • Patent number: 11332498
    Abstract: Disclosed are compounds represented by the following general formula (I): Cyclo-(Arg-Gly-Asp-X1-X2-X3-X4-X5) (I) wherein the variables groups X1 to X5 have the following meanings X1: Leu, Ile, Nle, Val, Tyr, Phe; X2: D-amino acid such as D-Pro, N-Me-D-Phe; X3: Pro, N-Me-amino acid such as N-Me-Lys, N-Me-Lys(Ac); Pro-Rx3, N-Me-Lys-Rx4; X4: Gly, Ala, Ser, Thr; X5: Leu, Ala, Tyr, His, Ile, Nle, Val, Phe wherein Pro-Rx3 represents a proline residue that carries at the C-3, C-4 or C-5 carbon atom and preferably the C-4 carbon atom a functional group selected from —NH2, —OH, —NH—Ac, —NH-hexyne, and wherein Lys-Rx4 represents a lysine residue, wherein the ?-amino nitrogen atom carries a group of the formula -L4-R4, wherein L4 is selected from the group consisting of covalent bond, —C(O)—, and —C(O)—O—, . . .
    Type: Grant
    Filed: March 16, 2018
    Date of Patent: May 17, 2022
    Assignee: Technische Universitat Munchen
    Inventors: Horst Kessler, Tobias Kapp, Florian Reichart, Oleg Maltsev
  • Publication number: 20220059333
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Application
    Filed: November 1, 2021
    Publication date: February 24, 2022
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • Patent number: 11164734
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Grant
    Filed: April 11, 2019
    Date of Patent: November 2, 2021
    Assignee: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • Publication number: 20200328072
    Abstract: Systems and methods for sample analysis include applying, using a first laser source, a first beam to a sample to desorb organic material from a location of the sample and ionizing the desorbed organic material using a second laser source to generate ionized organic material. The ionized organic material is then analyzed using a mass spectrometer. A second beam from the first laser is then applied to the sample to ablate inorganic material from the location of the sample. The ablated inorganic material is then ionized using the second laser source to generate ionized inorganic material. The mass spectrometer is then used to analyze the ionized inorganic material. During analysis, one or more images of the sample may also be captured and linked to the collected analysis data.
    Type: Application
    Filed: April 11, 2019
    Publication date: October 15, 2020
    Applicant: Exum Instruments
    Inventors: Jeffrey Williams, Stephen Strickland, Neal Wostbrock, Oleg Maltsev, Matthew McGoogan, Scott Messina
  • Publication number: 20200087347
    Abstract: Disclosed are compounds represented by the following general formula (I): Cyclo-(Arg-Gly-Asp-X1-X2-X2-X4-X5) (I) wherein the variables groups X1 to X5 have the following meanings X1: Leu, Ile, Nle, Val, Tyr, Phe; X2: D-amino acid such as D-Pro, N-Me-D-Phe; X3: Pro, N-Me-amino acid such as N-Me-Lys, N-Me-Lys(Ac); Pro-Rx3, N-Me-Lys-Rx4; X4: Gly, Ala, Ser, Thr; X5: Leu, Ala, Tyr, His, Ile, Nle, Val, Phe wherein Pro-Rx3 represents a proline residue that carries at the C-3, C-4 or C-5 carbon atom and preferably the C-4 carbon atom a functional group selected from —NH2, —OH, —NH—Ac, —NH-hexyne, and wherein Lys-Rx4 represents a lysine residue, wherein the ?-amino nitrogen atom carries a group of the formula -L4-R4, wherein L4 is selected from the group consisting of covalent bond, —C(O)—, and —C(O)—O—, . . .
    Type: Application
    Filed: March 16, 2018
    Publication date: March 19, 2020
    Inventors: Horst Kessler, Tobias Kapp, Florian Reichart, Oleg Maltsev
  • Patent number: 10562936
    Abstract: Disclosed are compound exhibiting highly active and selective binding to ?v?6 integrin, which are represented by the following general formula (I): Cyclo-(Arg-X1-Asp-X2-X3-X4-X5-X6-X7) (I) wherein the variables groups X to X have the following meanings X1: Ser, Gly, Thr, X2: Leu, lie, Nle, Val, Phe, X3: Gly, Ala, X4: Leu, He, Nle, Val, Phe, Lys, Tyr, Trp, Arg, X5: D-Pro, N-Me-D-lipophilic amino acids, X6: Pro, N-Me-amino acids, N-Me-Lys, N-Me-Lys(Ac), and X7; Ala, Leu, He, Nle, Val, Phe, Tyr, Trp or wherein the sub-sequence -X5-X6- represents a ?-turn mimetic differing from the meanings above, or pharmaceutically acceptable salts, esters, solvates, polymorphs or modified forms thereof represented by the following general formula (II): (X0)n1L(X8)n2 wherein Xo represents the compound of the general formula (I) as specified above (excluding one hydrogen atom to allow bonding to the linker), L represents a linker, X8 represents the effector moiety and wherein n1 and n2 are each independently selected from the ra
    Type: Grant
    Filed: September 19, 2016
    Date of Patent: February 18, 2020
    Assignee: Technische Universitat Munchen
    Inventors: Tobias Kapp, Horst Kessler, Oleg Maltsev
  • Publication number: 20180265548
    Abstract: Disclosed are compound exhibiting highly active and selective binding to ???6 integrin, which are represented by the following general formula (I): Cyclo-(Arg-X1-Asp-X2-X3-X4-X5-X6-X7) (I) wherein the variables groups X to X have the following meanings X1: Ser, Gly, Thr, X2: Leu, Ile, Nle, Val, Phe, X3: Gly, Ala, X4: Leu, He, Nle, Val, Phe, Lys, Tyr, Trp, Arg, X5: D-Pro, N-Me-D-lipophilic amino acids, X6: Pro, N-Me-amino acids, N-Me-Lys, N-Me-Lys(Ac), and X7; Ala, Leu, He, Nle, Val, Phe, Tyr, Trp or wherein the sub-sequence -X5-X6- represents a ?-turn mimetic differing from the meanings above, or pharmaceutically acceptable salts, esters, solvates, polymorphs or modified forms thereof represented by the following general formula (II): (X0)n1L(X8)n2 wherein X0 represents the compound of the general formula (I) as specified above (excluding one hydrogen atom to allow bonding to the linker), L represents a linker, X8 represents the effector moiety and wherein n1 and n2 are each independently selected from the ra
    Type: Application
    Filed: September 19, 2016
    Publication date: September 20, 2018
    Inventors: Tobias KAPP, Horst KESSLER, Oleg MALTSEV