Patents by Inventor Olga S. Ovchinnikova

Olga S. Ovchinnikova has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240020833
    Abstract: Systems, methods and programs including machine learning techniques which can predict a spectral image directly from an optical image of a patient's tissue sample using a first model. There may be different first models for different cancers. Each first model may be trained by using a plurality of pairs of images from different samples, respectively, where each image in a respective pair may be obtained via different imaging modalities. The systems, methods and programs may also include machine learning techniques which can predict cancer labels from the predicted spectral image using a second model. There may be different second models for different cancers. Each second model may be trained using multiple spectral images and corresponding manually input cancer labels.
    Type: Application
    Filed: June 23, 2023
    Publication date: January 18, 2024
    Inventors: Olga S. Ovchinnikova, Jacob D. Hinkle, Inzamam Haque, Debangshu Mukherjee
  • Patent number: 11355336
    Abstract: A method of performing time-of-flight secondary ion mass spectrometry on a sample includes the step of directing a beam of primary ions to the sample, and stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample. The stimulation of the ions is cycled between a stimulation state and a lower stimulation state. Secondary ions emitted from the sample by the beam of primary ions are collected in a time-of-flight mass spectrometer. Time-of-flight secondary ion mass spectrometry is then performed on the secondary ions. A system for performing time-of-flight secondary ion mass spectrometry on a sample is also disclosed.
    Type: Grant
    Filed: February 12, 2021
    Date of Patent: June 7, 2022
    Assignees: UT-BATTELLE, LLC, UNIVERSITY OF TENNESSEE RESEARCH FOUNDATION
    Inventors: Anton V. Ievlev, Olga S. Ovchinnikova, Matthias Lorenz, Yongtao Liu
  • Patent number: 11313878
    Abstract: Techniques for generating full-spatial resolution, full spectral resolution image(s) from a 3D spectral-data cube for any spectral value within a given spectral range are provided without requiring the acquisition of all full-spatial resolution, full spectral resolution data by an instrument. The 3D spectral-data cube is generated from a limited number of full-spatial resolution, sparse spectral resolution data and a sparse-spatial resolution, full-spectral resolution data of the same area of the sample. The use of the 3D spectral-data cube reduces the data acquisition time.
    Type: Grant
    Filed: April 16, 2021
    Date of Patent: April 26, 2022
    Assignee: UT-BATTELLE, LLC
    Inventors: Olga S. Ovchinnikova, Nikolay Borodinov, Anton V. Ievlev, Sergei V. Kalinin, Rama K. Vasudevan
  • Publication number: 20210384021
    Abstract: Machine learning approach can combine mass spectral imaging (MSI) techniques, one with low spatial resolution but intact molecular spectra and the other with nanometer spatial resolution but fragmented molecular signatures, to predict molecular MSI spectra with submicron spatial resolution. The machine learning approach can perform transformations on the spectral image data of the two MSI techniques to reduce dimensionality, and using a correlation technique, find relationships between the transformed spectral image data. The determined relationships can be used to generate MSI spectra of desired resolution.
    Type: Application
    Filed: June 3, 2021
    Publication date: December 9, 2021
    Inventors: Olga S. Ovchinnikova, Anton V. Ievlev, Matthias Lorenz, Nikolay Borodinov, Steven T. King
  • Publication number: 20210325428
    Abstract: Techniques for generating full-spatial resolution, full spectral resolution image(s) from a 3D spectral-data cube for any spectral value within a given spectral range are provided without requiring the acquisition of all full-spatial resolution, full spectral resolution data by an instrument. The 3D spectral-data cube is generated from a limited number of full-spatial resolution, sparse spectral resolution data and a sparse-spatial resolution, full-spectral resolution data of the same area of the sample. The use of the 3D spectral-data cube reduces the data acquisition time.
    Type: Application
    Filed: April 16, 2021
    Publication date: October 21, 2021
    Inventors: Olga S. Ovchinnikova, Nikolay Borodinov, Anton V. Ievlev, Sergei V. Kalinin, Rama K. Vasudevan
  • Patent number: 9297828
    Abstract: A method for analyzing a sample having at least one analyte includes the step of heating the sample at a rate of at least 106 K/s to thermally desorb at least one analyte from the sample. The desorbed analyte is collected. The analyte can then be analyzed.
    Type: Grant
    Filed: March 27, 2014
    Date of Patent: March 29, 2016
    Assignee: UT-BATTELLE, LLC
    Inventors: Olga S. Ovchinnikova, Gary J. Van Berkel
  • Publication number: 20150276559
    Abstract: A method for analyzing a sample having at least one analyte includes the step of heating the sample at a rate of at least 106 K/s to thermally desorb at least one analyte from the sample. The desorbed analyte is collected. The analyte can then be analyzed.
    Type: Application
    Filed: March 27, 2014
    Publication date: October 1, 2015
    Inventors: Olga S. OVCHINNIKOVA, Gary J. VAN BERKEL
  • Patent number: 9146180
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Grant
    Filed: May 1, 2014
    Date of Patent: September 29, 2015
    Assignees: UT-Battelle, LLC, University of Tennessee Research Foundation
    Inventors: Gary J. Van Berkel, Vilmos Kertesz, Olga S. Ovchinnikova
  • Publication number: 20140238155
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Application
    Filed: May 1, 2014
    Publication date: August 28, 2014
    Applicants: UT-BATTELLE, LLC, UNIVERSITY OF TENNESSEE RESEARCH FOUNDATION
    Inventors: Gary J. VAN BERKEL, Vilmos KERTESZ, Olga S. OVCHINNIKOVA
  • Patent number: 8742338
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Grant
    Filed: July 24, 2013
    Date of Patent: June 3, 2014
    Assignees: UT-Battelle, LLC, University of Tennessee Research Foundation
    Inventors: Gary J. Van Berkel, Vilmos Kertesz, Olga S. Ovchinnikova
  • Publication number: 20130298701
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Application
    Filed: July 24, 2013
    Publication date: November 14, 2013
    Applicants: University of Tennessee Research Foundation, UT-Batelle, LLC
    Inventors: Gary J. VAN BERKEL, Vilmos KERTESZ, Olga S. OVCHINNIKOVA
  • Patent number: 8519330
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Grant
    Filed: June 3, 2011
    Date of Patent: August 27, 2013
    Assignees: UT-Battelle, LLC, University of Tennessee Research Foundation
    Inventors: Gary J. Van Berkel, Vilmos Kertesz, Olga S. Ovchinnikova
  • Patent number: 8384020
    Abstract: A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200° C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less.
    Type: Grant
    Filed: September 24, 2010
    Date of Patent: February 26, 2013
    Assignees: UT-Battelle, LLC, University of Tennessee Research Foundation
    Inventors: Stephen Jesse, Gary J. Van Berkel, Olga S. Ovchinnikova
  • Publication number: 20120079894
    Abstract: Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing.
    Type: Application
    Filed: June 3, 2011
    Publication date: April 5, 2012
    Applicant: UT-Battelle, LLC
    Inventors: Gary J. Van Berkel, Vilmos Kertesz, Olga S. Ovchinnikova
  • Publication number: 20120074306
    Abstract: A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200° C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte.
    Type: Application
    Filed: September 24, 2010
    Publication date: March 29, 2012
    Applicant: UT-Battelle, LLC
    Inventors: Stephen JESSE, Gary J. VAN BERKEL, Olga S. OVCHINNIKOVA