Patents by Inventor Oliver B. Wright

Oliver B. Wright has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6552799
    Abstract: The invention provides an apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses. The apparatus is a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence. The interferometer is a two-arm Sagnac interferometer featuring two beam splitters. Measurement is performed in such a manner that a sample is excited by a beam of ultrashort optical pulses, and variations in intensity and phase of another optical beam are detected. This enables a wide range of measurement of physical properties such as thickness, sound velocity, and thermal properties of substances.
    Type: Grant
    Filed: July 31, 2001
    Date of Patent: April 22, 2003
    Assignee: Japan Science and Technology Corporation
    Inventors: Oliver B. Wright, David H. Hurley, Osamu Matsuda
  • Patent number: 6552800
    Abstract: The invention provides an apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses. The apparatus is a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence, i.e., a single-arm Sagnac interferometer featuring two beam splitters. Measurement is performed in such a manner that a sample is excited by a beam of ultrashort optical pulses, and variations in intensity and phase of another optical beam are detected. This enables a wide range of measurement of physical properties such as thickness, sound velocity, and thermal properties of substances.
    Type: Grant
    Filed: July 31, 2001
    Date of Patent: April 22, 2003
    Assignee: Japan Science and Technology Corporation
    Inventors: Oliver B. Wright, David H. Hurley, Osamu Matsuda
  • Patent number: 6549285
    Abstract: An apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses utilizes a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence. The interferometer is a two-arm Sagnac interferometer featuring three beam splitters. A sample is excited by a beam of ultrashort optical pulses, and variations in intensity and phase of another optical beam are detected. This enables a wide range of measurement of physical properties such as thickness, sound velocity, and thermal properties of substances.
    Type: Grant
    Filed: July 31, 2001
    Date of Patent: April 15, 2003
    Assignee: Japan Science and Technology Corporation
    Inventors: Oliver B. Wright, David H. Hurley, Osamu Matsuda
  • Patent number: D744152
    Type: Grant
    Filed: November 26, 2013
    Date of Patent: November 24, 2015
    Assignees: Plum Science K.K.
    Inventors: Sam-Hyeon Lee, Oliver B. Wright