Patents by Inventor Oliver BREITWIESER

Oliver BREITWIESER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10436817
    Abstract: A test matrix adapter device having a plurality of segments arranged in a plane, the respective segments have line-shaped and column-shaped frame sections, and the segments are connected to one another in a form-fitting manner by the frame sections. Semiconductor receiving devices are arranged within the segments, that each have a plurality of first contact surfaces that are spaced apart from one another. The semiconductor receiving device are form-fittingly connected by webs to the frame sections of an assigned segment. The semiconductor receiving device has a bottom side and a base region at least partially enclosed by a frame, and an outer side. The column-shaped frame sections have projections that have second contact surfaces that are connected by conductor tracks to the first contact surfaces. The semiconductor receiving device adapted to receive a packaged semiconductor component with terminal contacts and to connect the terminal contacts to the first contact surfaces.
    Type: Grant
    Filed: February 10, 2017
    Date of Patent: October 8, 2019
    Assignee: TDK-Micronas GmbH
    Inventors: Timo Kaufmann, Klaus Heberle, Joerg Franke, Oliver Breitwieser
  • Patent number: 10165686
    Abstract: An electrical component having a first package part of a first plastic compound. The first package part has a first trench-shaped formation. A first semiconductor body with an integrated circuit is disposed in the first trench-shaped formation. At least two traces, which run on an outer side of the first package part, are provided on a surface of the first trench-shaped formation, wherein the at least two traces are connected to the integrated circuit. The first trench-shaped formation is filled at least partially with a filling material of a second plastic compound to cover the first semiconductor body.
    Type: Grant
    Filed: July 29, 2015
    Date of Patent: December 25, 2018
    Assignee: TDK-Micronas GmbH
    Inventors: Joerg Franke, Klaus Heberle, Oliver Breitwieser, Timo Kaufmann
  • Publication number: 20170227578
    Abstract: A test matrix adapter device having a plurality of segments arranged in a plane, the respective segments have line-shaped and column-shaped frame sections, and the segments are connected to one another in a form-fitting manner by the frame sections. Semiconductor receiving devices are arranged within the segments, that each have a plurality of first contact surfaces that are spaced apart from one another. The semiconductor receiving device are form-fittingly connected by webs to the frame sections of an assigned segment. The semiconductor receiving device has a bottom side and a base region at least partially enclosed by a frame, and an outer side. The column-shaped frame sections have projections that have second contact surfaces that are connected by conductor tracks to the first contact surfaces. The semiconductor receiving device adapted to receive a packaged semiconductor component with terminal contacts and to connect the terminal contacts to the first contact surfaces.
    Type: Application
    Filed: February 10, 2017
    Publication date: August 10, 2017
    Applicant: TDK-Micronas GmbH
    Inventors: Timo KAUFMANN, Klaus HEBERLE, Joerg FRANKE, Oliver BREITWIESER
  • Patent number: 9718224
    Abstract: An injection-molded circuit carrier is provided that has an outside and an underside and an inner base region and a frame. The frame has an inside and a cover surface, so that the inner base region is enclosed in the manner of a frame, and multiple printed conductors are provided, which are spaced a distance apart. The printed conductors are guided at least partially from the inside to the underside via the cover surface and via the outside so that at least two metal surfaces are formed on the underside, which are each electrically connected to a printed conductor and are spaced a distance apart. The metal surfaces are designed to be significantly wider than the printed conductors for the purpose of forming a capacitive sensor.
    Type: Grant
    Filed: August 26, 2015
    Date of Patent: August 1, 2017
    Assignee: TDK-Micronas GmbH
    Inventors: Joerg Franke, Timo Kaufmann, Oliver Breitwieser, Klaus Heberle
  • Patent number: 9645203
    Abstract: A magnetic field measuring device includes a first semiconductor body having a surface formed in a first x-y plane, the first semiconductor body having two magnetic field sensors, spaced a distance apart on the surface, and the magnetic field sensors each measuring one z component of a magnetic field. A first magnet has a planar main extension surface formed in a second x-y plane, the direction of magnetization changing from a north pole to a south pole along the main extension surface on a symmetry surface of the magnet. One of the two magnetic field sensors being disposed in the vicinity of the north pole and the other of the two magnetic field sensors being situated in the vicinity of the south pole, so that signals having opposite polarities with respect to each other are formed in a z component of the magnetic field.
    Type: Grant
    Filed: August 3, 2015
    Date of Patent: May 9, 2017
    Assignee: Micronas GmbH
    Inventors: Timo Kaufmann, Klaus Heberle, Joerg Franke, Oliver Breitwieser
  • Patent number: 9513343
    Abstract: A measuring system having a magnetic device for generating a magnetic field and having a magnetic field sensor for detecting a flux density of the magnetic field at least in a first spatial direction, whereby the magnetic field sensor is fixedly positioned relative to the magnetic device. The magnetic device has at least two main poles for generating a main magnetic field and at least two secondary poles for generating a secondary magnetic field. The magnetic field in the magnetic field sensor is formed by superposition of the main magnetic field and the secondary magnetic field. The magnetic field sensor is designed to measure the flux density of the superposition in the first spatial direction, and, in the magnetic field sensor, the secondary magnetic field compensates at least partially the main magnetic field in the first spatial direction.
    Type: Grant
    Filed: May 8, 2014
    Date of Patent: December 6, 2016
    Assignee: Micronas GmbH
    Inventors: Klaus Heberle, Joerg Franke, Oliver Breitwieser, Timo Kaufmann
  • Patent number: 9442169
    Abstract: A measuring system, having a magnetic device for generating a magnetic field and having a magnetic field sensor with a sensor surface for detecting a flux density of the magnetic field penetrating the sensor surface at least in a first spatial direction, whereby the magnetic field sensor is fixedly positioned relative to the magnetic device. The magnetic device can have at least one permanent magnet and a flux concentrator made of a ferromagnetic material. The permanent magnet has at least two pole surfaces and an outer surface. The flux concentrator can have a smaller dimensions than the outer surface of the permanent magnet. The flux concentrator can be positioned within the outer surface of the permanent magnet and the flux concentrator and the permanent magnet can have a magnetic force closure.
    Type: Grant
    Filed: May 8, 2014
    Date of Patent: September 13, 2016
    Assignee: Micronas GmbH
    Inventors: Klaus Heberle, Joerg Franke, Oliver Breitwieser, Timo Kaufmann
  • Publication number: 20160061634
    Abstract: An injection-molded circuit carrier is provided that has an outside and an underside and an inner base region and a frame. The frame has an inside and a cover surface, so that the inner base region is enclosed in the manner of a frame, and multiple printed conductors are provided, which are spaced a distance apart. The printed conductors are guided at least partially from the inside to the underside via the cover surface and via the outside so that at least two metal surfaces are formed on the underside, which are each electrically connected to a printed conductor and are spaced a distance apart. The metal surfaces are designed to be significantly wider than the printed conductors for the purpose of forming a capacitive sensor.
    Type: Application
    Filed: August 26, 2015
    Publication date: March 3, 2016
    Applicant: MICRONAS GMBH
    Inventors: Joerg FRANKE, Timo KAUFMANN, Oliver BREITWIESER, Klaus HEBERLE
  • Publication number: 20160037641
    Abstract: An electrical component having a first package part of a first plastic compound. The first package part has a first trench-shaped formation. A first semiconductor body with an integrated circuit is disposed in the first trench-shaped formation. At least two traces, which run on an outer side of the first package part, are provided on a surface of the first trench-shaped formation, wherein the at least two traces are connected to the integrated circuit. The first trench-shaped formation is filled at least partially with a filling material of a second plastic compound to cover the first semiconductor body.
    Type: Application
    Filed: July 29, 2015
    Publication date: February 4, 2016
    Applicant: MICRONAS GMBH
    Inventors: Joerg FRANKE, Klaus HEBERLE, Oliver BREITWIESER, Timo KAUFMANN
  • Publication number: 20160033587
    Abstract: A magnetic field measuring device includes a first semiconductor body having a surface formed in a first x-y plane, the first semiconductor body having two magnetic field sensors, spaced a distance apart on the surface, and the magnetic field sensors each measuring one z component of a magnetic field. A first magnet has a planar main extension surface formed in a second x-y plane, the direction of magnetization changing from a north pole to a south pole along the main extension surface on a symmetry surface of the magnet. One of the two magnetic field sensors being disposed in the vicinity of the north pole and the other of the two magnetic field sensors being situated in the vicinity of the south pole, so that signals having opposite polarities with respect to each other are formed in a z component of the magnetic field.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 4, 2016
    Applicant: MICRONAS GMBH
    Inventors: Timo KAUFMANN, Klaus HEBERLE, Joerg FRANKE, Oliver BREITWIESER
  • Publication number: 20140333299
    Abstract: A measuring system, having a magnetic device for generating a magnetic field and having a magnetic field sensor with a sensor surface for detecting a flux density of the magnetic field penetrating the sensor surface at least in a first spatial direction, whereby the magnetic field sensor is fixedly positioned relative to the magnetic device. The magnetic device can have at least one permanent magnet and a flux concentrator made of a ferromagnetic material. The permanent magnet has at least two pole surfaces and an outer surface. The flux concentrator can have a smaller dimensions than the outer surface of the permanent magnet. The flux concentrator can be positioned within the outer surface of the permanent magnet and the flux concentrator and the permanent magnet can have a magnetic force closure.
    Type: Application
    Filed: May 8, 2014
    Publication date: November 13, 2014
    Applicant: Micronas GmbH
    Inventors: Klaus HEBERLE, Joerg FRANKE, Oliver BREITWIESER, Timo KAUFMANN
  • Publication number: 20140333298
    Abstract: A measuring system having a magnetic device for generating a magnetic field and having a magnetic field sensor for detecting a flux density of the magnetic field at least in a first spatial direction, whereby the magnetic field sensor is fixedly positioned relative to the magnetic device. The magnetic device has at least two main poles for generating a main magnetic field and at least two secondary poles for generating a secondary magnetic field. The magnetic field in the magnetic field sensor is formed by superposition of the main magnetic field and the secondary magnetic field. The magnetic field sensor is designed to measure the flux density of the superposition in the first spatial direction, and, in the magnetic field sensor, the secondary magnetic field compensates at least partially the main magnetic field in the first spatial direction.
    Type: Application
    Filed: May 8, 2014
    Publication date: November 13, 2014
    Applicant: Micronas GmbH
    Inventors: Klaus HEBERLE, Joerg FRANKE, Oliver BREITWIESER, Timo KAUFMANN