Abstract: An ion analysis apparatus, comprising: an ionization source configured to generate a beam of ions; a trapping device configured to receive the beam of ions and to axially transfer ions downstream; a first quadrupole mass filter configured to receive the ions transferred from the trapping device and to transfer at least a first subset of the received ions; a segmented linear quadrupole ion trap configured to receive the at least first subset of ions transferred from the first quadrupole mass filter, to perform a first processing step on the received at least first subset of ions and to transfer the processed ions; a second quadrupole mass filter configured to receive the processed ions transferred from the segmented linear quadrupole ion trap and to transfer at least a second subset of the processed ions; a collision cell configured to receive the at least second subset of ions transferred from the second quadrupole mass filter, to perform a second processing step on the received at least second subset of i

Abstract: An ion analysis apparatus includes an ionization source that generates a beam of ions and a trapping device that axially transfers the ions downstream. A first quadrupole mass filter receives the ions from the trapping device and transfers at least a first subset of the received ions. A segmented linear quadrupole ion trap performs a first processing step on the at least first subset of ions and transfers the processed ions. A second quadrupole mass filter receives the processed ions transferred from the segmented linear quadrupole ion trap and transfers at least a second subset of the processed ions. A collision cell receives and performs a second processing step on the at least second subset of processed ions. A mass analyzer performs mass analysis of the ions processed by the collision cell.