Patents by Inventor Oliver Rinner

Oliver Rinner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240355604
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Application
    Filed: July 1, 2024
    Publication date: October 24, 2024
    Applicants: DH Technologies Development Pte. Ltd., ETH Zurich
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 12033839
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Grant
    Filed: December 1, 2021
    Date of Patent: July 9, 2024
    Assignees: DH Technologies Development Pte. Ltd., ETH Zürich
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20220181132
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Application
    Filed: December 1, 2021
    Publication date: June 9, 2022
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 11222775
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: January 11, 2022
    Assignees: DH Technologies Development Pte. Ltd.
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20190311892
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Application
    Filed: June 24, 2019
    Publication date: October 10, 2019
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20170032948
    Abstract: Systems and methods are disclosed for analyzing a sample using overlapping precursor isolation windows. A mass analyzer of a tandem mass spectrometer is instructed to select and fragment at least two overlapping precursor isolation windows across a precursor ion mass range of a sample using a processor. The tandem mass spectrometer includes a mass analyzer that allows overlapping precursor isolation windows across the mass range of the sample.
    Type: Application
    Filed: October 14, 2016
    Publication date: February 2, 2017
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 9435778
    Abstract: A method of the analysis of compounds with mass spectrometry and to instruments, substances, and methods for polypeptide analysis, in particular in targeted proteomics applications and based on indexed retention times as peptide specific property.
    Type: Grant
    Filed: September 20, 2012
    Date of Patent: September 6, 2016
    Assignee: BiognoSYS AG
    Inventors: Claudia Escher, Reto Ossola, Oliver Rinner, Lukas Reiter
  • Publication number: 20160225594
    Abstract: Systems and methods are disclosed for detecting compounds in a sample using a tandem mass spectrometer. A sample comprising a plurality of detectable compounds that have been separated in time over a time interval is introduced into a tandem mass spectrometer. A sample product ion spectra is obtained. The presence of one or more known compounds of interest in the sample product ion spectra is determined. A compound is identified as present in the sample if the score associated with said compound meets a threshold value set as indicative of the likely presence of the compound in the sample.
    Type: Application
    Filed: April 13, 2016
    Publication date: August 4, 2016
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 9343278
    Abstract: Systems and methods are disclosed for quantitating detectable compounds of a sample. Sample product ion spectra are received for each mass selection window for each time step. The received sample product ion spectra are searched for the presence of known compounds of interest with known product ion spectra by retrieving the known product ion spectra from a library, retrieving the sample product ion spectra corresponding to the precursor mass selection window expected to contain a precursor ion corresponding to the known product ion spectra, generating product ion traces in time for the sample product ion spectra for the known product ion spectra, calculating a score for the product ion traces and product ion spectra that represents how well known product ions and sample product ions match, and calculating a quantitative value for the known compound from the product ion traces when the score exceeds a threshold value.
    Type: Grant
    Filed: June 17, 2015
    Date of Patent: May 17, 2016
    Assignees: DH Technologies Development Pte. Ltd., ETH Zürich
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 9343279
    Abstract: Systems and methods are disclosed for identifying detectable compounds of a sample. Sample product ion spectra are received for each mass selection window of precursor mass selection windows for each time step. The received sample product ion spectra are searched for the presence of known compounds of interest with known product ion spectra by retrieving a known product ion spectrum from a library, retrieving the sample product ion spectra corresponding to the precursor mass selection window expected to contain a precursor ion corresponding to the known product ion spectrum, generating product ion traces in time for the retrieved sample product ion spectra, calculating a score for the product ion traces and the retrieved sample product ion spectra that represents how well the retrieved sample product ion spectra and the known product ion spectrum match, and confirming the identity of a precursor ion using the score.
    Type: Grant
    Filed: June 17, 2015
    Date of Patent: May 17, 2016
    Assignees: DH Technologies Development Pte. Ltd., ETH Zürich
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20150287579
    Abstract: Systems and methods are disclosed for quantitating detectable compounds of a sample. Sample product ion spectra are received for each mass selection window for each time step. The received sample product ion spectra are searched for the presence of known compounds of interest with known product ion spectra by retrieving the known product ion spectra from a library, retrieving the sample product ion spectra corresponding to the precursor mass selection window expected to contain a precursor ion corresponding to the known product ion spectra, generating product ion traces in time for the sample product ion spectra for the known product ion spectra, calculating a score for the product ion traces and product ion spectra that represents how well known product ions and sample product ions match, and calculating a quantitative value for the known compound from the product ion traces when the score exceeds a threshold value.
    Type: Application
    Filed: June 17, 2015
    Publication date: October 8, 2015
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20150279644
    Abstract: Systems and methods are disclosed for identifying detectable compounds of a sample. Sample product ion spectra are received for each mass selection window of precursor mass selection windows for each time step. The received sample product ion spectra are searched for the presence of known compounds of interest with known product ion spectra by retrieving a known product ion spectrum from a library, retrieving the sample product ion spectra corresponding to the precursor mass selection window expected to contain a precursor ion corresponding to the known product ion spectrum, generating product ion traces in time for the retrieved sample product ion spectra, calculating a score for the product ion traces and the retrieved sample product ion spectra that represents how well the retrieved sample product ion spectra and the known product ion spectrum match, and confirming the identity of a precursor ion using the score.
    Type: Application
    Filed: June 17, 2015
    Publication date: October 1, 2015
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 9099288
    Abstract: Systems and methods are used to store an electronic record of all product ion spectra of all detectable compounds of a sample. A plurality of product ion scans are performed on a tandem mass spectrometer one or more times in a single sample analysis across a mass range using a plurality of mass selection windows. All sample product ion spectra of all detectable compounds for each mass selection window are produced. All sample product ion spectra for each mass selection window are received from the tandem mass spectrometer using a processor. All sample product ion spectra for each mass selection window are stored as an electronic record of all detectable compounds of the sample using the processor. The electronic record is used to characterize compounds known at the time the electronic record is stored or to characterize compounds that became known after the electronic record was stored.
    Type: Grant
    Filed: July 11, 2014
    Date of Patent: August 4, 2015
    Assignees: DH Technologies Development Pte. Ltd., ETH Zürich
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20150144778
    Abstract: Systems and methods are used to store an electronic record of all product ion spectra of all detectable compounds of a sample. A plurality of product ion scans are performed on a tandem mass spectrometer one or more times in a single sample analysis across a mass range using a plurality of mass selection windows. All sample product ion spectra of all detectable compounds for each mass selection window are produced. All sample product ion spectra for each mass selection window are received from the tandem mass spectrometer using a processor. All sample product ion spectra for each mass selection window are stored as an electronic record of all detectable compounds of the sample using the processor. The electronic record is used to characterize compounds known at the time the electronic record is stored or to characterize compounds that became known after the electronic record was stored.
    Type: Application
    Filed: July 11, 2014
    Publication date: May 28, 2015
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20140236497
    Abstract: The invention relates to the analysis of compounds with mass spectrometry and more particularly to instruments, substances, and methods for polypeptide analysis, in particular in targeted proteomics applications and based on indexed retention time as peptide specific property.
    Type: Application
    Filed: September 20, 2012
    Publication date: August 21, 2014
    Applicant: BiognoSYS AG
    Inventors: Claudia Escher, Reto Ossola, Oliver Rinner, Lukas Reiter
  • Patent number: 8809770
    Abstract: Systems and methods are used to store an electronic record of all product ion spectra of all detectable compounds of a sample. A plurality of product ion scans are performed on a tandem mass spectrometer one or more times in a single sample analysis across a mass range using a plurality of mass selection windows. All sample product ion spectra of all detectable compounds for each mass selection window are produced. All sample product ion spectra for each mass selection window are received from the tandem mass spectrometer using a processor. All sample product ion spectra for each mass selection window are stored as an electronic record of all detectable compounds of the sample using the processor. The electronic record is used to characterize compounds known at the time the electronic record is stored or to characterize compounds that became known after the electronic record was stored.
    Type: Grant
    Filed: September 14, 2011
    Date of Patent: August 19, 2014
    Assignee: DH Technologies Development Pte. Ltd.
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro Alvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Publication number: 20130206979
    Abstract: Systems and methods are used to store an electronic record of all product ion spectra of all detectable compounds of a sample. A plurality of product ion scans are performed on a tandem mass spectrometer one or more times in a single sample analysis across a mass range using a plurality of mass selection windows. All sample product ion spectra of all detectable compounds for each mass selection window are produced. All sample product ion spectra for each mass selection window are received from the tandem mass spectrometer using a processor. All sample product ion spectra for each mass selection window are stored as an electronic record of all detectable compounds of the sample using the processor. The electronic record is used to characterize compounds known at the time the electronic record is stored or to characterize compounds that became known after the electronic record was stored.
    Type: Application
    Filed: September 14, 2011
    Publication date: August 15, 2013
    Inventors: Ronald F. Bonner, Stephen A. Tate, Rudolf Aebersold, Pedro Jose Navarro ALvarez, Oliver Rinner, Lukas Reiter, Ludovic Gillet
  • Patent number: 8501421
    Abstract: The invention relates to a method for the determination of an MRM or SRM assay for a protein of interest, a peptide of interest, or a group of proteins/peptides of interest or a whole proteome. It essentially includes the following steps: (1) a list of proteins of interest is selected and for each member at least one or a list of candidate proteotypic peptides is derived (2) this at least one peptide is synthesized/generated essentially without subsequent purification; (3) this at least one unpurified peptide is analyzed by selected reaction monitoring (SRM) preferably coupled to liquid chromatography (LC-SRM) or analogous techniques; (4) validation and/or optimisation of the corresponding assay of the at least one peptide with determination of the SRM coordinates for a peptide/protein of interest and/or of a regulator of interest is achieved.
    Type: Grant
    Filed: May 20, 2009
    Date of Patent: August 6, 2013
    Assignee: Eidgenossische Technische Hochschule Zurich
    Inventors: Rudolf Aebersold, Paola Picotti, Oliver Rinner, Johan Malmstroem
  • Publication number: 20110178273
    Abstract: The invention relates to a method for the determination of an MRM or SRM assay for a protein of interest, a peptide of interest, or a group of proteins/peptides of interest or a whole proteome. It essentially includes the following steps: (1) a list of proteins of interest is selected and for each member at least one or a list of candidate proteotypic peptides is derived (2) this at least one peptide is synthesized/generated essentially without subsequent purification; (3) this at least one unpurified peptide is analyzed by selected reaction monitoring (SRM) preferably coupled to liquid chromatography (LC-SRM) or analogous techniques; (4) validation and/or optimisation of the corresponding assay of the at least one peptide with determination of the SRM coordinates for a peptide/protein of interest and/or of a regulator of interest is achieved.
    Type: Application
    Filed: May 20, 2009
    Publication date: July 21, 2011
    Applicant: EIDGENOSSISCHE TECHNISCHE HOCHSCHULE ZURICH
    Inventors: Rudolf Aabersold, Paola Picotti, Oliver Rinner, Johan Malmstrom