Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging angled-polished optical-fiber endface(s) of an optical-fiber connector. The proposed adapter tip or microscope system comprises relay optics comprising a multifaceted optical prism defining a first reflecting plane surface, a second reflecting plane surface and a third reflecting plane surface, used to deflect inspection light coming from the endface(s) through reflection of illumination light—referred to hereinafter as the object beam—towards and substantially in line with the optical axis of the objective lens of the optical-fiber connector-endface inspection microscope device.

Abstract: There are provided systems and methods for inspecting an endface of an optical-fiber connector using an optical-fiber connector endface inspection microscope system comprising one or more image detectors for capturing images over the whole endface to be inspected. An illumination system comprises two or more illumination sources disposed so as to illuminate respective regions over the connector endface and to prevent dark zones in the capture images. The illumination sources are activated in sequence, such that adjacent sources are never activated at the same time, and corresponding images captured in sequence, i.e., one after the other. In this case, it is also possible to activate the illumination sources in sequence, such that adjacent sources are never activated at the same time. Activating the illumination sources separately eliminates the illumination overlap and so eliminates the double image artifact. This allows for a more uniformly lit image with less dark spots.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging two non-parallel APC optical-fiber endfaces of a duplex (i.e., APC trans-duplex) optical-fiber connector. Because the two optical-fiber endfaces of an APC trans-duplex connector are angled-polished (APC) in different directions (non-parallel), inspection light reflected on the two endfaces take diverging pathways. A single-fiber or multi-fiber inspection microscope therefore cannot allow inspection of both optical-fiber endfaces at once. The proposed adapter tip or microscope system comprises relay optics defining two imaging paths (one for each optical-fiber endface), wherein each imaging path comprises at least one optical component (e.g.

Abstract: There is provided an optical-fiber connector endface inspection microscope system for inspecting an endface of an optical-fiber connector. It comprises one or more image detector for capturing at least one image of the endface to be inspected; an objective lens system comprising a focusing lens for adjusting a focus of the objective lens system on the image detector and a fixed relay lens; a main housing structure enclosing the image detector and the focusing lens; and at least one interchangeable optical head releasably connectable to the main housing structure and enclosing the fixed relay lens, wherein the optical head is releasably connectable to an adapter tip for interfacing with the optical-fiber connector to be inspected.

Abstract: There is therefore provided a method, system and computer program for detecting duplicate optical-fiber connector endface inspections performed on a same optical-fiber connector. Duplicate optical-fiber connector endface inspections can be detected by extracting a signature of the optical-fiber connector endface from the acquired optical-fiber connector endface inspection image to uniquely identify the optical-fiber connector and detect duplicate optical-fiber connector endface inspections. The signature can be stored to help detection of inadvertent or fraudulent duplicate or repetitive measurements made on a same optical-fiber connector.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector endface inspection microscope and an optical-fiber connector endface inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip or microscope system comprises a relay optical system comprising a Rhomboid prism. The Rhomboid prism being disposed so as to receive light reflected from said optical-fiber endface during inspection and laterally shift the light beam reflected from the angled-polished optical-fiber endface.

Abstract: There is provided an optical-fiber connector endface inspection microscope system for inspecting an endface of an optical-fiber connector. It comprises one or more image detector for capturing at least one image of the endface to be inspected; an objective lens system comprising a focusing lens for adjusting a focus of the objective lens system on the image detector and a fixed relay lens; a main housing structure enclosing the image detector and the focusing lens; and at least one interchangeable optical head releasably connectable to the main housing structure and enclosing the fixed relay lens, wherein the optical head is releasably connectable to an adapter tip for interfacing with the optical-fiber connector to be inspected.

Abstract: There are provided systems and methods for inspecting an endface of an optical-fiber connector using an optical-fiber connector endface inspection microscope system comprising one or more image detectors for capturing images over the whole endface to be inspected. An illumination system comprises two or more illumination sources disposed so as to illuminate respective regions over the connector endface and to prevent dark zones in the capture images. The illumination sources are activated in sequence, such that adjacent sources are never activated at the same time, and corresponding images captured in sequence, i.e., one after the other. In this case, it is also possible to activate the illumination sources in sequence, such that adjacent sources are never activated at the same time. Activating the illumination sources separately eliminates the illumination overlap and so eliminates the double image artifact. This allows for a more uniformly lit image with less dark spots.

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector endface inspection microscope and an optical-fiber connector endface inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip or microscope system comprises a relay optical system comprising a Rhomboid prism. The Rhomboid prism being disposed so as to receive light reflected from said optical-fiber endface during inspection and laterally shift the light beam reflected from the angled-polished optical-fiber endface.

Abstract: There is therefore provided a method, system and computer program for detecting duplicate optical-fiber connector endface inspections performed on a same optical-fiber connector. Duplicate optical-fiber connector endface inspections can be detected by extracting a signature of the optical-fiber connector endface from the acquired optical-fiber connector endface inspection image to uniquely identify the optical-fiber connector and detect duplicate optical-fiber connector endface inspections. The signature can be stored to help detection of inadvertent or fraudulent duplicate or repetitive measurements made on a same optical-fiber connector.