Patents by Inventor Olivier G. Philip
Olivier G. Philip has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10408969Abstract: Devices and methods for a rugged semiconductor radiation detector are provided. The semiconductor detector may include a hermetically sealed housing and a semiconductor disposed within the housing that has a first surface and a second surface opposite one another. A first metallization layer may at least partially cover the first surface of the semiconductor and a second metallization layer may at least partially cover the second surface of the semiconductor. The first metallization layer or the second metallization layer, or both, do not extend completely to an edge of the semiconductor, thereby providing a nonconductive buffer zone. This reduces electrical field stresses that occur when a voltage potential is applied between the first metallization layer and the second metallization layer and reduces a likelihood of electrical failure (e.g., due to arcing).Type: GrantFiled: October 18, 2018Date of Patent: September 10, 2019Assignee: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Frederic Gicquel, Olivier G. Philip, Christian Stoller, Zilu Zhou
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Publication number: 20190049620Abstract: Devices and methods for a rugged semiconductor radiation detector are provided. The semiconductor detector may include a hermetically sealed housing and a semiconductor disposed within the housing that has a first surface and a second surface opposite one another. A first metallization layer may at least partially cover the first surface of the semiconductor and a second metallization layer may at least partially cover the second surface of the semiconductor. The first metallization layer or the second metallization layer, or both, do not extend completely to an edge of the semiconductor, thereby providing a nonconductive buffer zone. This reduces electrical field stresses that occur when a voltage potential is applied between the first metallization layer and the second metallization layer and reduces a likelihood of electrical failure (e.g., due to arcing).Type: ApplicationFiled: October 18, 2018Publication date: February 14, 2019Inventors: Frederic Gicquel, Olivier G. Philip, Christian Stoller, Zilu Zhou
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Patent number: 10120099Abstract: Devices and methods for a rugged semiconductor radiation detector are provided. The semiconductor detector may include a hermetically sealed housing and a semiconductor disposed within the housing that has a first surface and a second surface opposite one another. A first metallization layer may at least partially cover the first surface of the semiconductor and a second metallization layer may at least partially cover the second surface of the semiconductor. The first metallization layer or the second metallization layer, or both, do not extend completely to an edge of the semiconductor, thereby providing a nonconductive buffer zone. This reduces electrical field stresses that occur when a voltage potential is applied between the first metallization layer and the second metallization layer and reduces a likelihood of electrical failure (e.g., due to arcing).Type: GrantFiled: July 21, 2015Date of Patent: November 6, 2018Assignee: SCHLUMBERGER TECHNOLOGY CORPORATONInventors: Frederic Gicquel, Olivier G. Philip, Christian Stoller, Zilu Zhou
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Publication number: 20170205529Abstract: Devices and methods for a rugged semiconductor radiation detector are provided. The semiconductor detector may include a hermetically sealed housing and a semiconductor disposed within the housing that has a first surface and a second surface opposite one another. A first metallization layer may at least partially cover the first surface of the semiconductor and a second metallization layer may at least partially cover the second surface of the semiconductor. The first metallization layer or the second metallization layer, or both, do not extend completely to an edge of the semiconductor, thereby providing a nonconductive buffer zone. This reduces electrical field stresses that occur when a voltage potential is applied between the first metallization layer and the second metallization layer and reduces a likelihood of electrical failure (e.g., due to arcing).Type: ApplicationFiled: July 21, 2015Publication date: July 20, 2017Inventors: Frederic Gicquel, Olivier G. Philip, Christian Stoller, Zilu Zhou
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Patent number: 9008969Abstract: Method and system for analyzing electrical pulses contained in a pulse train signal representative of the interaction of x-ray bursts with a nuclear detector configured for subsurface disposal. The pulse train signal is sampled to form a digitized signal. The total energy deposited at the detector during an x-ray burst is determined from the digitized signal, and a count rate of x-ray pulses from the burst is determined. A subsurface parameter is determined using the total energy deposit.Type: GrantFiled: December 10, 2007Date of Patent: April 14, 2015Assignee: Schlumberger Technology CorporationInventors: Christian Stoller, Olivier G. Philip
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Publication number: 20140319330Abstract: Embodiments described herein are directed to methods and neutron detectors for use in downhole and other oilfield applications. In particular, the neutron detector includes a scintillator formed at least partially from an elpasolite material. In a more specific embodiment, the scintillator is formed from a Cs2LiYCl6 (“CLYC”) material.Type: ApplicationFiled: October 18, 2012Publication date: October 30, 2014Inventors: Markus Berheide, Bradley A. Roscoe, Jing Qian, Timothy Spillane, Irina Shestakova, Olivier G. Philip, Stefan Vajda
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Patent number: 8865011Abstract: The invention provides a method for optimizing the spectroscopy performance of a spectroscopy scintillator by surrounding the scintillator by a reflector material, performing a scan measuring resolution and light output at three or more axial locations on the crystal, where at least one location is close to the PMT or below the crystal (near the PMT) at least one location is at the end away from the PMT of the scintillator), and adjusting the surface finish of the crystal and/or the reflector to obtain equal light output and optimal resolution over the length and different azimuth of the crystal.Type: GrantFiled: May 18, 2010Date of Patent: October 21, 2014Assignee: Schlumberger Technology CorporationInventors: Olivier G. Philip, Markus Berheide
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Publication number: 20130299713Abstract: A neutron detecting device using a neutron-reactive material as the source of charged particles to feed conventional dynode-based electron multiplier which not gas-filled (i.e., with 3He). The detector comprises a neutron-reacting material that produces charged particles, coupled with an electron multiplier that is known for use in photomultipliers. The neutron-reacting material is deposited on a substrate at the entrance to the electron multiplier. Charged particles from the neutron-reacting material impinge on the first dynode of the electron multiplier, where, in turn, electrons are generated. The secondary electrons are collected by a second dynode, and the charge so collected is amplified in each succeeding dynode stage in a cascade effect. The charge pulse from the anode is processed by subsequent pulse processing electronics and counting electronics to provide a count rate that is proportional to the neutron flux incident on the neutron-reacting material.Type: ApplicationFiled: November 11, 2011Publication date: November 14, 2013Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Kenneth Stephenson, Christian Stoller, Olivier G. Philip
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Publication number: 20120187081Abstract: The invention provides a method for optimizing the spectroscopy performance of a spectroscopy scintillator by surrounding the scintillator by a reflector material, performing a scan or more sectors measuring resolution and light output at three or more axial locations on the crystal, where at least one location is close to the PMT or below the crystal (near the PMT) at least one location is at the end away from the PMT of the scintillator), and adjusting the surface finish of the crystal and/or the reflector to obtain equal light output and optimal resolution over the length and different azimuth of the crystal.Type: ApplicationFiled: May 18, 2010Publication date: July 26, 2012Inventors: Olivier G. Philip, Markus Berheide
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Patent number: 7633058Abstract: A well logging instrument includes a source of high energy neutrons arranged to bombard a formation surrounding the instrument. A scintillator sensitive to gamma radiation resulting from interaction of the high energy neutrons with the formation is disposed in the instrument. A neutron shielding material surrounds the scintillator. A neutron moderator surrounds the neutron shielding material. An amplifier is optically coupled to the scintillator.Type: GrantFiled: December 4, 2007Date of Patent: December 15, 2009Assignee: Schlumberger Technology CorporationInventors: Christian Stoller, Bradley Albert Roscoe, Olivier G. Philip
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Publication number: 20090150077Abstract: Method and system for analyzing electrical pulses contained in a pulse train signal representative of the interaction of x-ray bursts with a nuclear detector configured for subsurface disposal. The pulse train signal is sampled to form a digitized signal. The total energy deposited at the detector during an x-ray burst is determined from the digitized signal, and a count rate of x-ray pulses from the burst is determined. A subsurface parameter is determined using the total energy deposit.Type: ApplicationFiled: December 10, 2007Publication date: June 11, 2009Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Christian Stoller, Olivier G. Philip
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Publication number: 20090140134Abstract: A well logging instrument includes a source of high energy neutrons arranged to bombard a formation surrounding the instrument. A scintillator sensitive to gamma radiation resulting from interaction of the high energy neutrons with the formation is disposed in the instrument. A neutron shielding material surrounds the scintillator. A neutron moderator surrounds the neutron shielding material. An amplifier is optically coupled to the scintillator.Type: ApplicationFiled: December 4, 2007Publication date: June 4, 2009Applicant: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Christian Stoller, Bradley Albert Roscoe, Olivier G. Philip
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Patent number: 5912460Abstract: An advanced method for determining formation density in an array-detector density tool uses three or more detectors to yield an improved accuracy and precision of the formation density measurement even in the presence of a large standoff between the tool and the formation. A more accurate photoelectric factor is determined through a new single detector algorithm. Use of the information on the photoelectric effect and the density from the three detectors allows the measurement of a photoelectric effect compensated for stand off and the photoelectric factor of the mudcake. The use of the multi-detector density answers allows for a consistency check and therefore a much improved quality control of the density measurement.Type: GrantFiled: March 6, 1997Date of Patent: June 15, 1999Assignee: Schlumberger Technology CorporationInventors: Christian Stoller, Urmi DasGupta, Olivier G. Philip, Nihal I. Wijeyesekera, Peter D. Wraight