Abstract: Method for optically measuring submicron dimensions of an object or covering between two objects, and device implementing such method, wherein a light beam (23) is emitted by means of an arc lamp (22) into a system (21) with an optical monofibre (8) having a diameter larger than 500 .mu.m and a length longer than 3 m, the beam (23) is focussed to the object to be measured through the lens (32) of a microscope, the reflected beam passing through the microscope lens is separated from the incident beam in order to direct it towards the sensors of the matrix cameras (41, 42) of the charge coupling type and the spatial signals thus obtained are processed in order to reconstitute the contours of the object or to measure the covering between the two objects.

Abstract: The width of a line projecting out of or recessed on a medium such as an integrated circuit is measured. A device for that purpose includes a confocal optical assembly having a monomode light source delivering a beam having a flat wave front. An optical deflector scans the surface of the medium transversely to the line width of the beam. A separator separates the light beam directed towards the medium carrying the line from the beam reflected by the medium. A detector includes a blade placed at a position conjugate with the focal point of the optical assembly and orthogonal to the line whose width is to be measured and a differential sensor placed at a position conjugate with the pupil of the optical assembly and delivering a signal responsive to the difference of lighting on each side of the blade for comparison with a threshold.