Patents by Inventor Olivier Roger EVRARD

Olivier Roger EVRARD has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multi-radiation identification and dosimetry system and method
    Patent number: 10139496
    Abstract: A multi-radiation identification and dosimetry system and method that allows for monitoring of alpha, beta, and gamma radiation is disclosed. The system/method incorporates a segmented silicon drift detector (SSDD) that allows measurement of directly absorbed radiation in the semiconductor (betas, conversion electrons, Lx lines, and alphas) on one SSDD segment and radiation from a radiation scintillation detector (RSD) on multiple segments of the SSDD. With the anode side of the SSDD directed toward the radiation inspection surface (RIS), the SSDD+RSD stacked radiation detector collects radiation which is processed by a charge sensitive amplifier (CSA) and then processed by a time stamping differentiator (TSD). A computing control device (CCD) may be configured to collect the time stamp differentiation data from the various SSDD segments to permit the simultaneous discrimination of several types of radiation by and presentation of these radiation types and counts on a display monitor.
    Type: Grant
    Filed: December 9, 2015
    Date of Patent: November 27, 2018
    Assignee: MIRION TECHNOLOGIES (CANBERRA), INC.
    Inventors: Olivier Roger Evrard, Roger Abou-Khalil, Stephane Dogny, Nabil Menaa, Wilhelm Friedrich Mueller, Mathieu Morelle, Edward Lee Reagan
  • MULTI-RADIATION IDENTIFICATION AND DOSIMETRY SYSTEM AND METHOD
    Publication number: 20170146668
    Abstract: A multi-radiation identification and dosimetry system and method that allows for monitoring of alpha, beta, and gamma radiation is disclosed. The system/method incorporates a segmented silicon drift detector (SSDD) that allows measurement of directly absorbed radiation in the semiconductor (betas, conversion electrons, Lx lines, and alphas) on one SSDD segment and radiation from a radiation scintillation detector (RSD) on multiple segments of the SSDD. With the anode side of the SSDD directed toward the radiation inspection surface (RIS), the SSDD+RSD stacked radiation detector collects radiation which is processed by a charge sensitive amplifier (CSA) and then processed by a time stamping differentiator (TSD). A computing control device (CCD) may be configured to collect the time stamp differentiation data from the various SSDD segments to permit the simultaneous discrimination of several types of radiation by and presentation of these radiation types and counts on a display monitor.
    Type: Application
    Filed: December 9, 2015
    Publication date: May 25, 2017
    Applicant: Canberra Industries, Inc.
    Inventors: Olivier Roger EVRARD, Roger ABOU-KHAUL, Stephane DOGNY, Nabil MENAA, Wilhelm Friedrich MUELLER, Mathieu MORELLE, Edward Lee REAGAN