Abstract: The plant water Anomalous Phase sensor can determine moisture levels in plant leaves, stems and wood. The sensors described include several embodiments of the sensor, all of which estimate moisture levels by determining changes in the phase spectrum of an anomalous-phase resonator. Two embodiments include a planar transmitting antenna array with two slightly detuned patch antennas and a detector. In a first embodiment, the detector is a dipole antenna centered and out of plane with the transmitting antenna array. In a second embodiment, the detector is a singular rectangular patch antenna coplanar with the transmitting antenna array. The third embodiment is similar to the second embodiment, but is formed on a flexible substrate, so that the sensor can be wrapped about a twig, branch or other plant structure, in a non-coplanar arrangement. To compensate for temperature affects, a reference sensor may be integrated with an active sensor.

Abstract: The plant water Anomalous Phase sensor can determine moisture levels in plant leaves, stems and wood. The sensors described include several embodiments of the sensor, all of which estimate moisture levels by determining changes in the phase spectrum of an anomalous-phase resonator. Two embodiments include a planar transmitting antenna array with two slightly detuned patch antennas and a detector. In a first embodiment, the detector is a dipole antenna centered and out of plane with the transmitting antenna array. In a second embodiment, the detector is a singular rectangular patch antenna coplanar with the transmitting antenna array. The third embodiment is similar to the second embodiment, but is formed on a flexible substrate, so that the sensor can be wrapped about a twig, branch or other plant structure, in a non-coplanar arrangement. To compensate for temperature affects, a reference sensor may be integrated with an active sensor.

Abstract: There is provided a dielectric constant analyzer device adapted to determine a dielectric property associated with a substrate material by measuring transmission and reflection parameters for a transmission line connected to said substrate material over a specified frequency range; determining a transmission phase response based on the transmission and reflection parameters; determining an anomalous phase slope characterized by a double slope reversals based on the transmission phase response; determining a resonance frequency based on a centre point of the anomalous phase slope reversals, where the center point corresponds to an anomalous phase at the resonance frequency; and determining the dielectric constant based on the resonance frequency, the anomalous phase at the resonance frequency and the anomalous phase slope. There is also provided a method and a microcomputer for doing the same.

Abstract: There is provided a printed circuit board structure, a dielectric substrate structure and a method of manufacturing thereof using wideband microstrip lines for reducing signal reflection, resonance and radiation for maintaining signal quality. The widths of certain portions of the wideband microstrips and underlying substrate portions are tapered gradually for achieving a reduction in a signal reflection, resonance and radiation therefore resulting in maintaining signal quality.

Abstract: There is provided a printed circuit board structure, a dielectric substrate structure and a method of manufacturing thereof using wideband microstrip lines for reducing signal reflection, resonance and radiation for maintaining signal quality. The widths of certain portions of the wideband microstrips and underlying substrate portions are tapered gradually for achieving a reduction in a signal reflection, resonance and radiation therefore resulting in maintaining signal quality.

Abstract: There is provided a dielectric constant analyzer device adapted to determine a dielectric property associated with a substrate material by measuring transmission and reflection parameters for a transmission line connected to said substrate material over a specified frequency range; determining a transmission phase response based on the transmission and reflection parameters; determining an anomalous phase slope characterized by a double slope reversals based on the transmission phase response; determining a resonance frequency based on a centre point of the anomalous phase slope reversals, where the center point corresponds to an anomalous phase at the resonance frequency; and determining the dielectric constant based on the resonance frequency, the anomalous phase at the resonance frequency and the anomalous phase slope. There is also provided a method and a microcomputer for doing the same.