Patents by Inventor Omer L. Gulder

Omer L. Gulder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6809820
    Abstract: The method and apparatus of laser-induced incandescence (LII) to analyze characteristics of submicron-sized particles are described. LII is recognized as a good tool for determining the characteristics of small particles in a gas, e.g., volume fraction, particle size, and specific surface area. It uses the fact that the incandescence signal is proportional to the volume of the particles. It also uses the fact that transient cooling is dependent on the specific surface area of the particle, which is related to diameter of the particle. In LII, particles are heated by a pulsed laser light beam to a temperature where incandescence from the particles can be distinguished from ambient light. The temperature of particles and their volume fraction governs the incandescence. The temperature decay rate is proportional to the primary particle size. The invention uses an optical arrangement that ensures a near-uniform laser energy distribution spatial profile.
    Type: Grant
    Filed: January 13, 2004
    Date of Patent: October 26, 2004
    Assignee: National Research Council of Canada
    Inventors: David R. Snelling, Gregory J. Smallwood, Omer L. Gulder, Fengshan Liu
  • Publication number: 20040141176
    Abstract: The method and apparatus of laser-induced incandescence (LII) to analyze characteristics of submicron-sized particles are described. LII is recognized as a good tool for determining the characteristics of small particles in a gas, e.g., volume fraction, particle size, and specific surface area. It uses the fact that the incandescence signal is proportional to the volume of the particles. It also uses the fact that transient cooling is dependent on the specific surface area of the particle, which is related to diameter of the particle. In LII, particles are heated by a pulsed laser light beam to a temperature where incandescence from the particles can be distinguished from ambient light. The temperature of particles and their volume fraction governs the incandescence. The temperature decay rate is proportional to the primary particle size. The invention uses an optical arrangement that ensures a near-uniform laser energy distribution spatial profile.
    Type: Application
    Filed: January 13, 2004
    Publication date: July 22, 2004
    Inventors: David R. Snelling, Gregory J. Smallwood, Omer L. Gulder, Fengshan Liu
  • Publication number: 20030197863
    Abstract: The laser-induced incandescence (LII) to analyze characteristics of submicron sized particles is described. LII is recognized as a good tool for determining the characteristics of small particles in a gas, e.g., volume fraction, particle size, and specific surface area. It uses the fact that transient cooling is dependent on the specific surface area of the particle, which is related to diameter of the particle. In LII, particles are heated by a pulsed laser light beam to a temperature where incandescence from the particles can be distinguished from ambient light. The surface temperature of particles and their volume fraction governs the incandescence. The temperature decay is proportional to the primary particle size. The invention uses an optical arrangement that ensures a near-uniform laser energy distribution spatial profile. The invention also uses a low fluence laser beam pulse to avoid evaporation of particles.
    Type: Application
    Filed: April 18, 2002
    Publication date: October 23, 2003
    Inventors: David R. Snelling, Gregory J. Smallwood, Omer L. Gulder, Fengshan Liu
  • Patent number: 6154277
    Abstract: The invention relates to a method and an apparatus for the determination of particle volume fractions with laser induced incandescence (LII) using absolute light intensity measurements. This requires a knowledge of the particle temperature either from a numerical model of particulate heating or experimental observation of the particulate temperature. Further, by using a known particle temperature a particle volume fraction is calculated. This avoids the need for a calibration in a source of particulates with a known particle volume fraction or particle concentration. The sensitivity of the detection system is determined by calibrating an extended source of known radiance and then this sensitivity is used to interpret measured LII signals. This results in a calibration independent method and apparatus for measuring particle volume fraction or particle concentrations.
    Type: Grant
    Filed: May 20, 1999
    Date of Patent: November 28, 2000
    Assignee: National Research Council of Canada
    Inventors: David R. Snelling, Gregory J. Smallwood, Omer L. Gulder