Patents by Inventor Omur Erdinc

Omur Erdinc has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tuned oscillator atomic force microscopy methods and apparatus
    Patent number: 11162977
    Abstract: Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: November 2, 2021
    Assignee: Yale University
    Inventors: Udo Schwarz, Eric Altman, Hendrik Hölscher, Omur Erdinc Dagdeviren
  • TUNED OSCILLATOR ATOMIC FORCE MICROSCOPY METHODS AND APPARATUS
    Publication number: 20190056428
    Abstract: Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.
    Type: Application
    Filed: December 21, 2015
    Publication date: February 21, 2019
    Inventors: Udo Schwarz, Eric Altman, Hendrik Hölscher, Omur Erdinc