Patents by Inventor Ondrej R. Baco

Ondrej R. Baco has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220310354
    Abstract: Methods include holding a sample with a movement stage configured to rotate the sample about a rotation axis, directing an imaging beam to a first sample location with the sample at a first rotational position about the rotation axis and detecting a first transmitted imaging beam image, rotating the sample using the movement stage about the rotation axis to a second rotational position, and directing the imaging beam to a second sample location by deflecting the imaging beam in relation to an optical axis of the imaging beam and detecting a second transmitted imaging beam image, wherein the second sample location is spaced apart from the first sample location at least at least in relation to the optical axis. Related systems and apparatus are also disclosed.
    Type: Application
    Filed: March 23, 2021
    Publication date: September 29, 2022
    Applicant: FEI Company
    Inventors: Ondrej L. Shánel, Trond Karsten Varslot, Ondrej R. Baco, Martin Schneider
  • Patent number: 11430633
    Abstract: Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: August 30, 2022
    Assignee: FEI Company
    Inventors: Ondrej L. Shanel, Trond Karsten Varslot, Martin Schneider, Maarten Kuijper, Ondrej R. Baco, Václav Batelka
  • Publication number: 20220208511
    Abstract: Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.
    Type: Application
    Filed: December 29, 2020
    Publication date: June 30, 2022
    Applicant: FEI Company
    Inventors: Ondrej L. Shanel, Trond Karsten Varslot, Martin Schneider, Maarten Kuijper, Ondrej R. Baco, Václav Batelka