Patents by Inventor Ondrej Shánel

Ondrej Shánel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230298849
    Abstract: The invention relates to a sample handling and storage system. The system is used for storing and handling samples, which may be cryogenic samples, that are arranged for use in charged particle microscopy, such as cryo-electron microscope samples for use in cryo-transmission electron microscopy. The system comprises a storage apparatus for storing a plurality of samples, and a Charged Particle Apparatus (CPA), such as a cryo-TEM, at a location remote from said storage apparatus. The system further comprises a transfer device that is releasably connectable to said storage apparatus, and that is releasably connectable to said CPA as well. As defined herein, said transfer device is arranged for acquiring a sample from said plurality of samples when connected to said storage apparatus, and arranged for transferring said sample from said transfer device to said CPA when connected to said CPA.
    Type: Application
    Filed: March 21, 2023
    Publication date: September 21, 2023
    Inventors: Jirí Benda, Vojtech Dole{hacek over (z)}al, Tomá{hacek over (s)} Trnkócy, Jaroslav Hadzima, Martin Cechmánek, Ondrej Shánel
  • Patent number: 10520454
    Abstract: A method, target, and apparatus are disclosed for investigating a specimen using X-ray tomography. The specimen in mounted on a specimen holder. An X-ray target has a substrate of relatively low-atomic-number material carrying an array of mutually isolated nuggets of a relatively high-atomic number material. X-rays are generated by irradiating a single nugget in the target with a charged particle beam, which then illuminates the specimen along a first line of sight through the specimen. A flux of X-rays transmitted through the specimen is detected to form a first image. The illumination process is repeated for a series of different lines of sight through the specimen, to produce a series of images. A mathematical reconstruction on the series of images is then performed to produce a tomogram of at least part of the specimen.
    Type: Grant
    Filed: May 2, 2017
    Date of Patent: December 31, 2019
    Assignee: FEI Company
    Inventors: Petr Strelec, Ondrej Shanel
  • Publication number: 20180323032
    Abstract: A method, target, and apparatus are disclosed for investigating a specimen using X-ray tomography. The specimen in mounted on a specimen holder. An X-ray target has a substrate of relatively low-atomic-number material carrying an array of mutually isolated nuggets of a relatively high-atomic number material. X-rays are generated by irradiating a single nugget in the target with a charged particle beam, which then illuminates the specimen along a first line of sight through the specimen. A flux of X-rays transmitted through the specimen is detected to form a first image. The illumination process is repeated for a series of different lines of sight through the specimen, to produce a series of images. A mathematical reconstruction on the series of images is then performed to produce a tomogram of at least part of the specimen.
    Type: Application
    Filed: May 2, 2017
    Publication date: November 8, 2018
    Applicant: FEI Company
    Inventors: PETR STRELEC, Ondrej Shanel
  • Patent number: 9595359
    Abstract: A magnetic lens for focusing a beam of charged particles traveling along an optical axis includes an axial bore disposed around said optical axis; magnetic field generating means; and magnetic yoke, to guide and concentrate said magnetic field toward said optical axis so as to form a focusing region, wherein Said yoke has a composite structure, comprising an outer primary portion and an inner secondary portion; Said secondary portion is mounted as a monolithic insert within said primary portion so as to be disposed around said focusing region; Said secondary portion comprises a waist region surrounding said bore and acting as a magnetic constriction, configured such that said magnetic field undergoes saturation in said waist region, thereby causing magnetic flux to exit the waist region and form a focusing field in said focusing region.
    Type: Grant
    Filed: July 16, 2014
    Date of Patent: March 14, 2017
    Assignee: FEI COMPANY
    Inventor: Ondrej Shanel
  • Publication number: 20150021476
    Abstract: A magnetic lens for focusing a beam of charged particles traveling along an optical axis includes an axial bore disposed around said optical axis; magnetic field generating means; and magnetic yoke, to guide and concentrate said magnetic field toward said optical axis so as to form a focusing region, wherein Said yoke has a composite structure, comprising an outer primary portion and an inner secondary portion; Said secondary portion is mounted as a monolithic insert within said primary portion so as to be disposed around said focusing region; Said secondary portion comprises a waist region surrounding said bore and acting as a magnetic constriction, configured such that said magnetic field undergoes saturation in said waist region, thereby causing magnetic flux to exit the waist region and form a focusing field in said focusing region.
    Type: Application
    Filed: July 16, 2014
    Publication date: January 22, 2015
    Applicant: FEI Company
    Inventor: Ondrej Shanel