Patents by Inventor OptimalTest, Ltd.

OptimalTest, Ltd. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING
    Publication number: 20130193994
    Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
    Type: Application
    Filed: March 14, 2013
    Publication date: August 1, 2013
    Applicant: OptimalTest, Ltd.
    Inventor: OptimalTest, Ltd.