Patents by Inventor Or Amzaleg
Or Amzaleg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11785373Abstract: A system for positioning an earbud relative to the ear of a person includes an ear frame that extends between a first end and a second end. The ear frame extends in an ear frame plane defined by the first end, the second end, and a top portion. The system further includes an earbud receiver configured to receive a stem of an earbud. The earbud receiver is connected to the ear frame. The earbud receiver defines a bore extending along an earbud receiver axis between a first opening at a first end of the earbud receiver and a second opening at a second end of the receiver. The earbud receiver axis intersects the ear frame plane an angle theta selected to retain the position the earbud relative to the ear of the person. In some embodiments, theta is selected between 5 degrees and 30 degrees.Type: GrantFiled: May 26, 2022Date of Patent: October 10, 2023Assignee: Amzaleg's, LLCInventor: Or Amzaleg
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Patent number: 11592400Abstract: Inspection data that corresponds to potential defects of an object may be received. A first set of locations of first potential defects can be identified. The first set of locations of the first potential defects can be imaged with a review tool to obtain a first set of review images. The first potential defects can be classified based on the first set of review images to obtain first classification results of the first potential defects. An instruction can be determined for the review tool based on the first classification results, the instruction being associated with detecting potential defects. Using the instruction, a second set of locations of second potential defects of the plurality of potential defects to be imaged with the review tool can be identified.Type: GrantFiled: December 21, 2020Date of Patent: February 28, 2023Assignee: Applied Materials Israel Ltd.Inventors: Saar Shabtay, Moshe Amzaleg, Zvi Goren
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Publication number: 20220278377Abstract: An apparatus for replacing a used battery pack of a portable device with a charged battery pack. The apparatus is configured to receive a portable device with the battery pack housed therein, unlock the battery pack by automation means and extract it from the housing, insert and lock another battery pack into the housing. In another aspect, the invention relates to a portable device comprising a battery pack and battery pack housing, which is configured to be inserted into the housing, locked therein and provide electrical charge either to the housing or to devices that are electrically connected to the housing. The battery pack may be unlocked and retrieved from the housing and, in turn, replaced with another battery pack (e.g. a charged battery pack).Type: ApplicationFiled: August 7, 2019Publication date: September 1, 2022Inventors: Moshe AMZALEG, Ilan BEN HARUSH
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Publication number: 20210109029Abstract: Inspection data that corresponds to potential defects of an object may be received. A first set of locations of first potential defects can be identified. The first set of locations of the first potential defects can be imaged with a review tool to obtain a first set of review images. The first potential defects can be classified based on the first set of review images to obtain first classification results of the first potential defects. An instruction can be determined for the review tool based on the first classification results, the instruction being associated with detecting potential defects. Using the instruction, a second set of locations of second potential defects of the plurality of potential defects to be imaged with the review tool can be identified.Type: ApplicationFiled: December 21, 2020Publication date: April 15, 2021Inventors: Saar Shabtay, Moshe Amzaleg, Zvi Goren
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Patent number: 10957567Abstract: A system, computer program product and a method for detecting manufacturing process defects, the method may include: obtaining multiple edge measurements of one or more structural elements after a completion of each one of multiple manufacturing phases; generating spatial spectrums, based on the multiple edge measurements, for each one of the multiple manufacturing phases; determining relationships between bands of the spatial spectrums; and identifying at least one of the manufacturing process defects based on the relationships between the bands of the spatial spectrums.Type: GrantFiled: November 13, 2019Date of Patent: March 23, 2021Assignee: Applied Materials Israel Ltd.Inventors: Moshe Amzaleg, Ofer Adan
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Patent number: 10871451Abstract: Inspection data that corresponds to potential defects of an object may be received. A first set of locations of first potential defects can be identified. The first set of locations of the first potential defects can be imaged with a review tool to obtain a first set of review images. The first potential defects can be classified based on the first set of review images to obtain first classification results of the first potential defects. A determination can be made as to whether an examination stopping criteria has been satisfied. In response to determining that the examination stopping criteria has not been satisfied, a second set of locations of second potential defects can be identified to be imaged with the review tool to obtain a second set of review images. The second set of locations can be different than the first set of locations.Type: GrantFiled: August 28, 2019Date of Patent: December 22, 2020Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Saar Shabtay, Moshe Amzaleg, Zvi Goren
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Publication number: 20200118855Abstract: A system, computer program product and a method for detecting manufacturing process defects, the method may include: obtaining multiple edge measurements of one or more structural elements after a completion of each one of multiple manufacturing phases; generating spatial spectrums, based on the multiple edge measurements, for each one of the multiple manufacturing phases; determining relationships between bands of the spatial spectrums; and identifying at least one of the manufacturing process defects based on the relationships between the bands of the spatial spectrums.Type: ApplicationFiled: November 13, 2019Publication date: April 16, 2020Inventors: Moshe Amzaleg, Ofer Adan
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Patent number: 10545020Abstract: A computerized method for estimating a size of a nanometric part of an inspected article, the method including: (a) acquiring inspection results generated by processing an inspection image which was generated by collecting signals arriving from a portion of the article which includes the part by an inspection system; (b) fitting to the inspection results an approximation function from a group of functions which is related to a response pattern of the inspection system; and (c) determining an estimated size of the part, based on at least one parameter of the approximation function.Type: GrantFiled: March 14, 2013Date of Patent: January 28, 2020Assignee: APPLIED MATERIALS ISRAEL, LTD.Inventors: Moshe Amzaleg, Nir Ben-David Dodzin
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Publication number: 20190391085Abstract: Inspection data that corresponds to potential defects of an object may be received. A first set of locations of first potential defects can be identified. The first set of locations of the first potential defects can be imaged with a review tool to obtain a first set of review images. The first potential defects can be classified based on the first set of review images to obtain first classification results of the first potential defects. A determination can be made as to whether an examination stopping criteria has been satisfied. In response to determining that the examination stopping criteria has not been satisfied, a second set of locations of second potential defects can be identified to be imaged with the review tool to obtain a second set of review images. The second set of locations can be different than the first set of locations.Type: ApplicationFiled: August 28, 2019Publication date: December 26, 2019Inventors: Saar SHABTAY, Moshe AMZALEG, Zvi GOREN
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Patent number: 10460434Abstract: There are provided system and method of detecting defects on a specimen, the method comprising: capturing a first image from a first die and obtaining one or more second images; receiving: i) a first set of predefined first descriptors each representing a type of DOI, and ii) a second set of predefined second descriptors each representing a type of noise; generating at least one difference image based on difference between pixel values of the first image and pixel values derived from the second images; generating at least one third image, comprising: computing a value for each given pixel of at least part of the at least one difference image based on the first and second sets of predefined descriptors, and surrounding pixels centered around the given pixel; and determining presence of defect candidates based on the at least one third image and a predefined threshold.Type: GrantFiled: August 22, 2017Date of Patent: October 29, 2019Assignee: Applied Materials Israel Ltd.Inventors: Limor Martin, Elad Cohen, Eyal Neistein, Moshe Amzaleg
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Patent number: 10417504Abstract: A system is described. The system includes one or more sensing devices to acquire depth image data, scan logic to scan the depth image data for moving objects, vehicle recognition logic to recognize an automobile in the scanned image data, capture a registered plate number of the automobile and connect with the automobile based on the captured registered plate number and object recognition logic to recognize a presence of one or more moving objects in the depth image data that are about to come across a path of the automobile.Type: GrantFiled: September 23, 2015Date of Patent: September 17, 2019Assignee: INTEL CORPORATIONInventors: Vladimir Colton, Artyom Khvediouk, Ayoob Nabwani, Saar Amzaleg
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Patent number: 10408764Abstract: Examination system, method and computer-readable medium, the method comprising: processing by a processor using a first recipe at least one image comprised in images and metadata generated by an inspection tool and stored, to detect a first location set of first potential defects and attributes thereof; selecting and imaging part of the first location set with a review tool to obtain an image set; obtaining classification results of said first potential defects and determining a further recipe based thereon; processing the image using the further recipe for detecting a further location set of further defects; selecting part of the further location set; imaging the part with the review tool to obtain a further image set, and obtaining further classification results; and repeating determining the further recipe, processing the image, selecting and imaging part of the further location set, and obtaining further classification results, until a stopping criteria is met.Type: GrantFiled: September 13, 2017Date of Patent: September 10, 2019Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Saar Shabtay, Moshe Amzaleg, Zvi Goren
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Patent number: 10290092Abstract: A system configured to detect defects in an inspection image generated by collecting signals arriving from an article, the system comprising a tangible processor which includes: (i) a distribution acquisition module, configured to acquire a distribution of comparison values, each of the comparison values being indicative of a relationship between a value associated with a pixel of the inspection image and a corresponding reference value; (ii) a fitting module, configured to fit to the distribution an approximation function out of a predefined group of functions; and (iii) a defect detection module, configured to: (a) set a defect detection criterion based on a result of the fitting; and to (b) determine a presence of a defect in the inspection image, based on the defect detection criterion.Type: GrantFiled: May 15, 2014Date of Patent: May 14, 2019Assignee: APPLIED MATERIALS ISRAEL, LTDInventors: Moshe Amzaleg, Nir Ben-David Dodzin
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Patent number: 10290087Abstract: There are provided system and method of generating an examination recipe usable for examining a specimen, the method comprising: capturing images from dies and obtaining noise map indicative of noise distribution on the images; receiving design data representative of a plurality of design groups each having the same design pattern; calculating a group score for each given design group, the group score calculated based on the noise data associated with the given design group and a defect budget allocated for area of the given design group; providing segmentation related to the dies, comprising: associating design groups with segmentation labels indicative of different noise levels based on the group score, thereby obtaining a set of die segments each corresponding to one or more design groups associated with the same segmentation label and segmentation configuration data; and generating an examination recipe using the segmentation configuration data.Type: GrantFiled: September 11, 2017Date of Patent: May 14, 2019Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Ariel Shkalim, Moshe Amzaleg, Eyal Neistein, Shlomo Tubul, Mark Geshel, Elad Cohen
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Patent number: 10275872Abstract: There are provided system and method of detecting repeating defects on a specimen, the specimen obtained by printing two or more mask fields thereon, each of mask field comprising multiple dies, the method comprising: scanning the specimen to capture a plurality of first images from first dies located at the same position in the mask fields, and, for each first image, capture two or more second images from dies located in different positions from the first dies; generating a plurality of third images corresponding to the plurality of first images; generating, an average third image constituted by pixels with values computed as accumulated pixel values of corresponding pixels in the plurality of third images divided by the number of the two or more mask fields; and determining presence of repeating defects on the specimen based on the average third image and a predefined defect threshold.Type: GrantFiled: August 24, 2017Date of Patent: April 30, 2019Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Karen Pomeranz, Eyal Neistein, Vivek Balasubramanian, Moshe Amzaleg, Eyal Bassa
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Publication number: 20190079022Abstract: Examination system, method and computer-readable medium, the method comprising: processing by a processor using a first recipe at least one image comprised in images and metadata generated by an inspection tool and stored, to detect a first location set of first potential defects and attributes thereof; selecting and imaging part of the first location set with a review tool to obtain an image set; obtaining classification results of said first potential defects and determining a further recipe based thereon; processing the image using the further recipe for detecting a further location set of further defects; selecting part of the further location set; imaging the part with the review tool to obtain a further image set, and obtaining further classification results; and repeating determining the further recipe, processing the image, selecting and imaging part of the further location set, and obtaining further classification results, until a stopping criteria is met.Type: ApplicationFiled: September 13, 2017Publication date: March 14, 2019Inventors: Saar SHABTAY, Moshe AMZALEG, Zvi GOREN
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Publication number: 20190080447Abstract: There are provided system and method of generating an examination recipe usable for examining a specimen, the method comprising: capturing images from dies and obtaining noise map indicative of noise distribution on the images; receiving design data representative of a plurality of design groups each having the same design pattern; calculating a group score for each given design group, the group score calculated based on the noise data associated with the given design group and a defect budget allocated for area of the given design group; providing segmentation related to the dies, comprising: associating design groups with segmentation labels indicative of different noise levels based on the group score, thereby obtaining a set of die segments each corresponding to one or more design groups associated with the same segmentation label and segmentation configuration data; and generating an examination recipe using the segmentation configuration data.Type: ApplicationFiled: September 11, 2017Publication date: March 14, 2019Inventors: Ariel SHKALIM, Moshe AMZALEG, Eyal NEISTEIN, Shlomo TUBUL, Mark GESHEL, Elad COHEN
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Publication number: 20190066291Abstract: There are provided system and method of detecting defects on a specimen, the method comprising: capturing a first image from a first die and obtaining one or more second images; receiving: i) a first set of predefined first descriptors each representing a type of DOI, and ii) a second set of predefined second descriptors each representing a type of noise; generating at least one difference image based on difference between pixel values of the first image and pixel values derived from the second images; generating at least one third image, comprising: computing a value for each given pixel of at least part of the at least one difference image based on the first and second sets of predefined descriptors, and surrounding pixels centered around the given pixel; and determining presence of defect candidates based on the at least one third image and a predefined threshold.Type: ApplicationFiled: August 22, 2017Publication date: February 28, 2019Inventors: Limor MARTIN, Elad COHEN, Eyal NEISTEIN, Moshe AMZALEG
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Patent number: D987599Type: GrantFiled: April 6, 2021Date of Patent: May 30, 2023Inventor: Or Amzaleg
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Patent number: D1024027Type: GrantFiled: May 27, 2022Date of Patent: April 23, 2024Assignee: Amzaleg's LLCInventor: Or Amzaleg