Patents by Inventor Oren Dovrat

Oren Dovrat has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Context-based defect inspection
    Patent number: 11922619
    Abstract: A context-based inspection system is disclosed. The system may include an optical imaging sub-system. The system may further include one or more controllers communicatively coupled to the optical imaging system. The one or more controllers may be configured to: receive one or more reference images; receive one or more test images of a sample; generate one or more probabilistic context maps during inspection runtime using an unsupervised classifier; provide the generated one or more probabilistic context maps to a supervised classifier during the inspection runtime; and apply the supervised classifier to the received one or more test images to identify one or more DOIs on the sample.
    Type: Grant
    Filed: March 29, 2023
    Date of Patent: March 5, 2024
    Assignee: KLA Corporation
    Inventors: Brian Duffy, Bradley Ries, Laurent Karsenti, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky, Oriel Ben Shmuel, Shlomi Fenster, Yakir Gorski, Oren Dovrat, Ron Dekel, Emanuel Garbin, Sasha Smekhov
  • CONTEXT-BASED DEFECT INSPECTION
    Publication number: 20230316500
    Abstract: A context-based inspection system is disclosed. The system may include an optical imaging sub-system. The system may further include one or more controllers communicatively coupled to the optical imaging system. The one or more controllers may be configured to: receive one or more reference images; receive one or more test images of a sample; generate one or more probabilistic context maps during inspection runtime using an unsupervised classifier; provide the generated one or more probabilistic context maps to a supervised classifier during the inspection runtime; and apply the supervised classifier to the received one or more test images to identify one or more DOIs on the sample.
    Type: Application
    Filed: March 29, 2023
    Publication date: October 5, 2023
    Inventors: Brian Duffy, Bradley Ries, Laurent Karsenti, Kuljit S. Virk, Asaf J. Elron, Ruslan Berdichevsky, Oriel Ben Shmuel, Shlomi Fenster, Yakir Gorski, Oren Dovrat, Ron Dekel, Emanuel Garbin, Sasha Smekhov