Abstract: Bandgap type reference voltage source using an operational transimpedance amplifier. The bandgap stage is formed by a first and a second bandgap branch parallel-connected; the first bandgap branch comprises a first diode and a transistor, series-connected and forming a first output node; the second bandgap branch comprises a second diode and a second transistor series-connected and forming a second output node. The operational amplifier has inputs connected to the output nodes of the bandgap stage. An amplifier current detecting stage is connected to the outputs of the operational amplifier and supplies a current related to the current drawn by the operational amplifier. A diode current detecting stage is connected to the output of the amplifier current detecting stage and to an output of the operational amplifier and supplies a current related to the current flowing in the first diode. An output stage transforms this current into a stabilized voltage.

Abstract: A reading circuit for a memory includes a current detector for each bit line of the memory, a reference voltage generator, and a comparator that compares the reference voltage with the voltage of a reading terminal of the current detector. Each current detector includes a first transistor whose gate is selectively connected to the reading terminal, and whose drain-source path is in series with a respective bit line. An input of a first inverter stage is connected to the source of the first transistor, and an output thereof is connected to the gate of the first transistor. The circuit has a very short reading time based upon each of the current detectors including a first resistor between the source of the first transistor and the bit line, along with second and third transistors having their drain-source paths connected in series with the respective bit line, and along with second and third inverters connected to the respective bit line.

Abstract: A current reference circuit for low supply voltages is provided. The current reference circuit includes a series including a resistor and a diode, a current source having one terminal coupled to a supply voltage and another terminal coupled to the series, an operational amplifier having its negative electrode connected to a band gap reference voltage, and a transistor. The diode has its cathode electrode coupled to ground and its anode electrode coupled to the resistor. The transistor has its gate electrode coupled to the output of the operational amplifier, its source electrode coupled to ground, and its drain electrode coupled to both the positive electrode of the operational amplifier and the current source. Also provided are an integrated circuit that includes at least one current reference circuit for low supply voltages and a signal processing system that includes at least one current reference circuit for low supply voltages.

Abstract: A current reference circuit for low supply voltages is provided. The current reference circuit includes a series including a resistor and a diode, a current source having one terminal coupled to a supply voltage and another terminal coupled to the series, an operational amplifier having its negative electrode connected to a band gap reference voltage, and a transistor. The diode has its cathode electrode coupled to ground and its anode electrode coupled to the resistor. The transistor has its gate electrode coupled to the output of the operational amplifier, its source electrode coupled to ground, and its drain electrode coupled to both the positive electrode of the operational amplifier and the current source. Also provided are an integrated circuit that includes at least one current reference circuit for low supply voltages and a signal processing system that includes at least one current reference circuit for low supply voltages.

Abstract: A reading circuit for a memory includes a current detector for each bit line of the memory, a reference voltage generator, and a comparator that compares the reference voltage with the voltage of a reading terminal of the current detector. Each current detector includes a first transistor whose gate is selectively connected to the reading terminal, and whose drain-source path is in series with a respective bit line. An input of a first inverter stage is connected to the source of the first transistor, and an output thereof is connected to the gate of the first transistor. The circuit has a very short reading time based upon each of the current detectors including a first resistor between the source of the first transistor and the bit line, along with second and third transistors having their drain-source paths connected in series with the respective bit line, and along with second and third inverters connected to the respective bit line.

Abstract: Bandgap type reference voltage source using an operational transimpedance amplifier. The bandgap stage is formed by a first and a second bandgap branch parallel-connected; the first bandgap branch comprises a first diode and a transistor, series-connected and forming a first output node; the second bandgap branch comprises a second diode and a second transistor series-connected and forming a second output node. The operational amplifier has inputs connected to the output nodes of the bandgap stage. An amplifier current detecting stage is connected to the outputs of the operational amplifier and supplies a current related to the current drawn by the operational amplifier. A diode current detecting stage is connected to the output of the amplifier current detecting stage and to an output of the operational amplifier and supplies a current related to the current flowing in the first diode. An output stage transforms this current into a stabilized voltage.