Patents by Inventor Osamu Ido

Osamu Ido has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Impact test apparatus
    Patent number: 7596985
    Abstract: An impact test apparatus allows a retaining member to retain a test object. The retaining member is attached to an elastic member. When a weight is made to collide against the test object, impact is applied to the test object. The test object is subjected to free oscillation in response to the impact. The elasticity of the elastic member accepts the movement of the retaining member. Damping of the free oscillation of the test object is minimized. The impact test sufficiently reflects the influence of the free oscillation.
    Type: Grant
    Filed: June 16, 2008
    Date of Patent: October 6, 2009
    Assignee: Fujitsu Limited
    Inventor: Osamu Ido
  • IMPACT TEST APPARATUS
    Publication number: 20080282767
    Abstract: An impact test apparatus allows a retaining member to retain a test object. The retaining member is attached to an elastic member. When a weight is made to collide against the test object, impact is applied to the test object. The test object is subjected to free oscillation in response to the impact. The elasticity of the elastic member accepts the movement of the retaining member. Damping of the free oscillation of the test object is minimized. The impact test sufficiently reflects the influence of the free oscillation.
    Type: Application
    Filed: June 16, 2008
    Publication date: November 20, 2008
    Applicant: FUJITSU LIMITED
    Inventor: Osamu IDO
  • Strain waveform control apparatus, strain waveform regulating member, strain waveform control method by using strain waveform control apparatus, and strain waveform control program
    Patent number: 7284445
    Abstract: A strain waveform control apparatus of the present invention is adapted to horizontally supporting a printed circuit board over a trestle and cause strains on the printed circuit board by a dropped rigid ball with buffer blocks being located on both surfaces of the printed circuit board. These buffer blocks are movably supported by movable stages so as to be in contact with proper places of both surfaces of the printed circuit board. The buffer blocks are capable of regulating and relatively modify/adjusting first and second occurred strain waveforms generated by application of the impact to the printed circuit board and modifying/adjusting a steepness of each of the strain waveforms.
    Type: Grant
    Filed: December 28, 2004
    Date of Patent: October 23, 2007
    Assignee: Fujitsu Limited
    Inventors: Osamu Ido, Tadashi Tateno
  • Strain waveform control apparatus, strain waveform regulating member, strain waveform control method by using strain waveform control apparatus, and strain waveform control program
    Publication number: 20050115332
    Abstract: A strain waveform control apparatus of the present invention is adapted to horizontally supporting a printed circuit board over a trestle and cause strains on the printed circuit board by a dropped rigid ball with buffer blocks being located on both surfaces of the printed circuit board. These buffer blocks are movably supported by movable stages so as to be in contact with proper places of both surfaces of the printed circuit board. The buffer blocks are capable of regulating and relatively modify/adjusting first and second occurred strain waveforms generated by application of the impact to the printed circuit board and modifying/adjusting a steepness of each of the strain waveforms.
    Type: Application
    Filed: December 28, 2004
    Publication date: June 2, 2005
    Applicant: FUJITSU LIMITED
    Inventors: Osamu Ido, Tadashi Tateno