Patents by Inventor Osamu Nakagawara

Osamu Nakagawara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10361324
    Abstract: A structural body that includes a film that has a phase-separated nanostructure where a separate columnar shape phase is dispersed in a matrix phase that are phase-separated in a state of thermal equilibrium. The matrix phase is formed from any one of a p-type semiconductor material and an n-type semiconductor material, and the separate columnar shape phase is formed from the other semiconductor material. The film is formed on a substrate such that the separate columnar shaped phase and the matrix phase have three-dimensional junction planes.
    Type: Grant
    Filed: July 27, 2017
    Date of Patent: July 23, 2019
    Assignee: MURATA MANUFACTURING CO., LTD.
    Inventors: Hidekazu Tanaka, Osamu Nakagawara
  • Publication number: 20170338358
    Abstract: A structural body that includes a film that has a phase-separated nanostructure where a separate columnar shape phase is dispersed in a matrix phase that are phase-separated in a state of thermal equilibrium. The matrix phase is formed from any one of a p-type semiconductor material and an n-type semiconductor material, and the separate columnar shape phase is formed from the other semiconductor material. The film is formed on a substrate such that the separate columnar shaped phase and the matrix phase have three-dimensional junction planes.
    Type: Application
    Filed: July 27, 2017
    Publication date: November 23, 2017
    Inventors: HIDEKAZU TANAKA, Osamu Nakagawara
  • Patent number: 8148879
    Abstract: In a sheet-type piezoelectric vibrator provided with a piezoelectric sheet made from a transparent organic polymer and electrodes formed on respective main surfaces that are opposite to each other of the piezoelectric sheet, an electrode material that is effectively used for making the vibrator colorless is provided. The first electrodes formed on one of the main surfaces of piezoelectric sheets are made of zinc oxide electrode layers, each mainly containing zinc oxide, and second electrodes formed on the other main surface of the piezoelectric sheets include polythiophene electrode layers made from a conductive polymer containing thiophene in a molecule structure thereof. Although the zinc oxide electrode layer is transparent, it is slightly yellowish, while, on the other hand, although the polythiophene electrode layer is also transparent, it is slightly bluish.
    Type: Grant
    Filed: November 26, 2010
    Date of Patent: April 3, 2012
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Masamichi Andoh, Osamu Nakagawara, Souko Fukahori
  • Publication number: 20110062829
    Abstract: In a sheet-type piezoelectric vibrator provided with a piezoelectric sheet made from a transparent organic polymer and electrodes formed on respective main surfaces that are opposite to each other of the piezoelectric sheet, an electrode material that is effectively used for making the vibrator colorless is provided. The first electrodes formed on one of the main surfaces of piezoelectric sheets are made of zinc oxide electrode layers, each mainly containing zinc oxide, and second electrodes formed on the other main surface of the piezoelectric sheets include polythiophene electrode layers made from a conductive polymer containing thiophene in a molecule structure thereof. Although the zinc oxide electrode layer is transparent, it is slightly yellowish, while, on the other hand, although the polythiophene electrode layer is also transparent, it is slightly bluish.
    Type: Application
    Filed: November 26, 2010
    Publication date: March 17, 2011
    Inventors: Masamichi Andoh, Osamu Nakagawara, Souko Fukahori
  • Patent number: 7867636
    Abstract: A ZnO-based transparent conductive film is produced by growing ZnO doped with a group III element oxide on a substrate and has a region with a crystal structure in which a c-axis grows along a plurality of different directions. The transparent conductive film produced by growing ZnO doped with a group III element oxide on a substrate has a ZnO (002) rocking curve full width at half maximum of about 13.5° or more. ZnO is doped with a group III element oxide so that the ratio of the group III element oxide in the transparent conductive film is about 7% to about 40% by weight. The transparent conductive film is formed on the substrate with a SiNx thin film provided therebetween. The transparent conductive film is formed on the substrate by a thin film formation method with a bias voltage applied to the substrate.
    Type: Grant
    Filed: November 22, 2006
    Date of Patent: January 11, 2011
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Hiroyuki Seto, Yutaka Kishimoto
  • Publication number: 20080050595
    Abstract: A ZnO-based transparent conductive film has practicable moisture resistance, desired characteristics of a transparent conductive film, and excellent economy. The transparent conductive film is produced by growing ZnO doped with a group III element oxide on a substrate and has a region with a crystal structure in which a c-axis grows along a plurality of different directions. The transparent conductive film produced by growing ZnO doped with a group III element oxide on a substrate has a ZnO (002) rocking curve full width at half maximum of about 13.5° or more. ZnO is doped with a group III element oxide so that the ratio of the group III element oxide in the transparent conductive film is about 7% to about 40% by weight. The transparent conductive film is formed on the substrate with a SiNx thin film provided therebetween. The transparent conductive film is formed on the substrate by a thin film formation method with a bias voltage applied to the substrate.
    Type: Application
    Filed: November 22, 2006
    Publication date: February 28, 2008
    Applicant: MURATA MANUFACTURING CO., LTD.
    Inventors: Osamu NAKAGAWARA, Hiroyuki SETO, Yutaka KISHIMOTO
  • Patent number: 7276836
    Abstract: A piezoelectric thin-film resonator includes a first excitation electrode and a second excitation electrode, the first excitation electrode being disposed opposite the second excitation electrode; a piezoelectric thin film disposed between the first excitation electrode and the second excitation electrode; and a substrate supporting the first excitation electrode, the substrate being composed of a LiTaO3 single crystal or a LiNbO3 single crystal, the first excitation electrode including an acoustic reflecting layer, the acoustic reflecting layer containing (a) at least one epitaxially grown first sublayer being composed of a conducting material and having a relatively high acoustic impedance; and (b) at least one epitaxially grown second sublayer being composed of another conducting material and having a relatively low acoustic impedance.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: October 2, 2007
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Keiichi Umeda, Osamu Nakagawara
  • Patent number: 7218039
    Abstract: A surface acoustic wave device includes a piezoelectric substrate and interdigital electrodes disposed on the piezoelectric substrate, wherein each of the interdigital electrodes includes a main electrode layer made of Cu or an alloy that has Cu as its main component. The surface acoustic wave device also includes a tightly adhering layer which is disposed between the main electrode layer and the piezoelectric substrate and whose main component is NiCr, or a tightly adhering layer whose main component is Ti and whose film thickness is within a range of about 18 nm to about 60 nm.
    Type: Grant
    Filed: March 14, 2006
    Date of Patent: May 15, 2007
    Assignee: Murata Manufacturing Co. Ltd.
    Inventors: Takuo Hada, Takeshi Nakao, Michio Kadota, Osamu Nakagawara
  • Patent number: 7213322
    Abstract: A piezoelectric substrate is provided with interdigital transducer electrodes including a first electrode layer, a second electrode layer, and a third electrode layer that is principally made of aluminum. The piezoelectric substrate has a stepped structure on the surface of the piezoelectric substrate, the stepped structure including terraces each having a width of about 50 nm or less and steps each having a width of a mono-molecular layer (e.g., about 14 ?).
    Type: Grant
    Filed: March 3, 2004
    Date of Patent: May 8, 2007
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Akinori Shinoda
  • Patent number: 7146695
    Abstract: A surface acoustic wave device has superior electrical power resistance that is obtained by improving stress migration resistance of electrodes. In order to form at least one electrode, for example, on a ? rotation Y-cut (?=36° to 42°) LiTaO3 piezoelectric substrate, an underlying electrode layer including Ti or Cr as a primary component is formed, and an Al electrode layer including Al as a primary component is then formed on this underlying electrode layer. The Al electrode layer is an oriented film grown by epitaxial growth and is also a polycrystalline thin film having a twin structure in which a diffraction pattern observed in an X-ray diffraction pole figure has a plurality of symmetry centers.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: December 12, 2006
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Masahiko Saeki, Kazuhiro Inoue
  • Patent number: 7141909
    Abstract: A surface acoustic wave device includes a piezoelectric substrate and interdigital electrodes disposed on the piezoelectric substrate, wherein each of the interdigital electrodes includes a main electrode layer made of Cu or an alloy that has Cu as its main component. The surface acoustic wave device also includes a tightly adhering layer which is disposed between the main electrode layer and the piezoelectric substrate and whose main component is NiCr, or a tightly adhering layer whose main component is Ti and whose film thickness is within a range of about 18 nm to about 60 nm.
    Type: Grant
    Filed: April 29, 2004
    Date of Patent: November 28, 2006
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Takuo Hada, Takeshi Nakao, Michio Kadota, Osamu Nakagawara
  • Publication number: 20060158069
    Abstract: A surface acoustic wave device includes a piezoelectric substrate and interdigital electrodes disposed on the piezoelectric substrate, wherein each of the interdigital electrodes includes a main electrode layer made of Cu or an alloy that has Cu as its main component. The surface acoustic wave device also includes a tightly adhering layer which is disposed between the main electrode layer and the piezoelectric substrate and whose main component is NiCr, or a tightly adhering layer whose main component is Ti and whose film thickness is within a range of about 18 nm to about 60 nm.
    Type: Application
    Filed: March 14, 2006
    Publication date: July 20, 2006
    Inventors: Takuo Hada, Takeshi Nakao, Michio Kadota, Osamu Nakagawara
  • Publication number: 20060119230
    Abstract: A piezoelectric thin-film resonator includes a first excitation electrode and a second excitation electrode, the first excitation electrode being disposed opposite the second excitation electrode; a piezoelectric thin film disposed between the first excitation electrode and the second excitation electrode; and a substrate supporting the first excitation electrode, the substrate being composed of a LiTaO3 single crystal or a LiNbO3 single crystal, the first excitation electrode including an acoustic reflecting layer, the acoustic reflecting layer containing (a) at least one epitaxially grown first sublayer being composed of a conducting material and having a relatively high acoustic impedance; and (b) at least one epitaxially grown second sublayer being composed of another conducting material and having a relatively low acoustic impedance.
    Type: Application
    Filed: December 7, 2005
    Publication date: June 8, 2006
    Inventors: Keiichi Umeda, Osamu Nakagawara
  • Publication number: 20050057121
    Abstract: A surface acoustic wave device has superior electrical power resistance that is obtained by improving stress migration resistance of electrodes. In order to form at least one electrode, for example, on a ? rotation Y-cut (?=36° to 42°) LiTaO3 piezoelectric substrate, an underlying electrode layer including Ti or Cr as a primary component is formed, and an Al electrode layer including Al as a primary component is then formed on this underlying electrode layer. The Al electrode layer is an oriented film grown by epitaxial growth and is also a polycrystalline thin film having a twin structure in which a diffraction pattern observed in an X-ray diffraction pole figure has a plurality of symmetry centers.
    Type: Application
    Filed: September 30, 2004
    Publication date: March 17, 2005
    Applicant: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Masahiko Saeki, Kazuhiro Inoue
  • Publication number: 20040256950
    Abstract: A surface acoustic wave device includes a piezoelectric substrate and interdigital electrodes disposed on the piezoelectric substrate, wherein each of the interdigital electrodes includes a main electrode layer made of Cu or an alloy that has Cu as its main component. The surface acoustic wave device also includes a tightly adhering layer which is disposed between the main electrode layer and the piezoelectric substrate and whose main component is NiCr, or a tightly adhering layer whose main component is Ti and whose film thickness is within a range of about 18 nm to about 60 nm.
    Type: Application
    Filed: April 29, 2004
    Publication date: December 23, 2004
    Applicant: Murata Manufacturing Co., Ltd.
    Inventors: Takuo Hada, Takeshi Nakao, Michio Kadota, Osamu Nakagawara
  • Patent number: 6822371
    Abstract: A surface acoustic wave device has superior electrical power resistance that is obtained by improving stress migration resistance of electrodes. In order to form at least one electrode, for example, on a &thgr; rotation Y-cut (&thgr;=36° to 42°) LiTaO3 piezoelectric substrate, an underlying electrode layer including Ti or Cr as a primary component is formed, and an Al electrode layer including Al as a primary component is then formed on this underlying electrode layer. The Al electrode layer is an oriented film grown by epitaxial growth and is also a polycrystalline thin film having a twin structure in which a diffraction pattern observed in an X-ray diffraction pole figure has a plurality of symmetry centers.
    Type: Grant
    Filed: December 27, 2002
    Date of Patent: November 23, 2004
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Masahiko Saeki, Kazuhiro Inoue
  • Publication number: 20040200054
    Abstract: A piezoelectric substrate is provided with interdigital transducer electrodes including a first electrode layer, a second electrode layer, and a third electrode layer that is principally made of aluminum. The piezoelectric substrate has a stepped structure on the surface of the piezoelectric substrate, the stepped structure including terraces each having a width of about 50 nm or less and steps each having a width of a mono-molecular layer (e.g., about 14 Å).
    Type: Application
    Filed: March 3, 2004
    Publication date: October 14, 2004
    Applicant: Murata Manufacturing Co., Ltd.
    Inventors: Osamu Nakagawara, Akinori Shinoda
  • Patent number: 6630767
    Abstract: A surface acoustic wave device includes a piezoelectric substrate made of a LiNO3 or LiTaO3 single crystal, and an electrode having power endurance. After a damaged layer formed on a surface of the piezoelectric substrate is removed, an under-electrode layer including at least one of Ti and Cr as a main component is formed by a vacuum deposition process at a temperature of about 100° C. or less, and an Al electrode layer including Al or an Al main component is then formed on the under-electrode layer. The Al electrode layer has a twin crystal structure in which the Al crystal is oriented in a desired direction such that the (111) crystal plane of Al substantially coincides with the Z crystal direction of the piezoelectric substrate.
    Type: Grant
    Filed: July 11, 2001
    Date of Patent: October 7, 2003
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Kazuhiro Inoue, Masanobu Watanabe, Osamu Nakagawara, Masahiko Saeki
  • Publication number: 20030132684
    Abstract: A surface acoustic wave device has superior electrical power resistance that is obtained by improving stress migration resistance of electrodes. In order to form at least one electrode, for example, on a &thgr; rotation Y-cut (&thgr;=36° to 42°) LiTaO3 piezoelectric substrate, an underlying electrode layer including Ti or Cr as a primary component is formed, and an Al electrode layer including Al as a primary component is then formed on this underlying electrode layer. The Al electrode layer is an oriented film grown by epitaxial growth and is also a polycrystalline thin film having a twin structure in which a diffraction pattern observed in an X-ray diffraction pole figure has a plurality of symmetry centers.
    Type: Application
    Filed: December 27, 2002
    Publication date: July 17, 2003
    Inventors: Osamu Nakagawara, Masahiko Saeki, Kazuhiro Inoue
  • Publication number: 20020008437
    Abstract: A surface acoustic wave device includes a piezoelectric substrate made of a LiNO3 or LiTaO3 single crystal, and an electrode having excellent power endurance. After a damaged layer formed on a surface of the piezoelectric substrate is removed, an under-electrode layer including at least one of Ti and Cr as a main component is formed by a vacuum deposition process at a temperature of about 100° C. or less, and an Al electrode layer including Al or an Al main component is then formed on the under-electrode layer. The Al electrode layer has a twin crystal structure in which the Al crystal is oriented in a desired direction such that the (111) crystal plane of Al substantially coincides with the Z crystal direction of the piezoelectric substrate.
    Type: Application
    Filed: July 11, 2001
    Publication date: January 24, 2002
    Applicant: Murata Manufacturing Co., Ltd.
    Inventors: Kazuhiro Inoue, Masanobu Watanabe, Osamu Nakagawara, Masahiko Saeki