Patents by Inventor Osamu SUGAHARA

Osamu SUGAHARA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10482207
    Abstract: A design verification support apparatus includes, a memory that stores circuit information and test pattern information, and a processor coupled to the memory. The processor performs a process including, acquiring the circuit information and the test pattern information from the memory, calculating a delay time occurring until the first clock signal reaches each of a plurality of memory circuits coupled in series and included in the scan chain from the clock source, based on the circuit information, selecting a first memory circuit whose first output value is to be changed by a shift operation among the plurality of memory circuits, based on the test pattern information at the cycle, and calculating the first output value of the first memory circuit when a second clock signal is supplied to the first memory circuit, the second clock signal being obtained by delaying the first clock signal by a delay time.
    Type: Grant
    Filed: May 21, 2018
    Date of Patent: November 19, 2019
    Assignee: FUJITSU LIMITED
    Inventor: Osamu Sugahara
  • Publication number: 20180341724
    Abstract: A design verification support apparatus includes, a memory that stores circuit information and test pattern information, and a processor coupled to the memory. The processor performs a process including, acquiring the circuit information and the test pattern information from the memory, calculating a delay time occurring until the first clock signal reaches each of a plurality of memory circuits coupled in series and included in the scan chain from the clock source, based on the circuit information, selecting a first memory circuit whose first output value is to be changed by a shift operation among the plurality of memory circuits, based on the test pattern information at the cycle, and calculating the first output value of the first memory circuit when a second clock signal is supplied to the first memory circuit, the second clock signal being obtained by delaying the first clock signal by a delay time.
    Type: Application
    Filed: May 21, 2018
    Publication date: November 29, 2018
    Applicant: FUJITSU LIMITED
    Inventor: Osamu SUGAHARA