Patents by Inventor Osbert Cheng

Osbert Cheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030025143
    Abstract: A method of forming a metal-insulator-metal capacitor. A substrate is provided and then a first dielectric layer is formed over the substrate. The first dielectric layer is patterned to form a first opening for forming a desired lower electrode and a second opening for forming a desired conductive line. A first metallic layer conformal to the exposed surface of the first opening and completely filling the second opening is formed. A conformal capacitor dielectric layer is formed over the first metallic layer and then a second dielectric layer is formed over the capacitor dielectric layer. The second dielectric layer is patterned to form a third opening above the first opening and a fourth opening above the second opening. The third opening exposes a portion of the capacitor dielectric layer and the fourth opening exposes a portion of the first metallic layer. Finally, a second metallic layer that completely fills the third opening and the fourth opening is formed.
    Type: Application
    Filed: August 1, 2001
    Publication date: February 6, 2003
    Inventors: Benjamin Szu-Min Lin, Osbert Cheng
  • Patent number: 6388756
    Abstract: An optical method for measuring a trench depth, applicable to a substrate having a trench therein, wherein the substrate has a first surface, and the trench has a bottom surface to serve as a second surface as well as a depth. The method involves measuring a total reflectance from the substrate using different wavelengths, wherein the total reflectance is determined by a first actual reflectance from the first surface, a second actual reflectance from the second surface, and a scattering factor. The second actual reflectance is then determined from the measurement of the first actual reflectance from the first surface and the calculation result of the scattering factor. Since a trench depth is determined from the second actual reflectance, the trench depth is calculated after acquiring the second actual reflectance.
    Type: Grant
    Filed: September 15, 1999
    Date of Patent: May 14, 2002
    Assignee: United Microelectronics Corp.
    Inventors: Jau-Hwang Ho, Osbert Cheng
  • Publication number: 20020009850
    Abstract: A method for making a multi-layer polysilicon plug forms a plurality of undoped polysilicon thin layers alternating with a plurality of doped polysilicon thin layers on a substrate having a concavity until the polysilicon layers fill the concavity. Thus, a multi-layer polysilicon layer is formed. The multi-layer polysilicon layer is patterned and etched to form a multi-layer polysilicon plug in the concavity.
    Type: Application
    Filed: November 22, 1999
    Publication date: January 24, 2002
    Inventor: OSBERT CHENG