Patents by Inventor Oscar Gabriel Rodriguez

Oscar Gabriel Rodriguez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8456632
    Abstract: A method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating beam and a sample to be observed, by characterising the distribution of the state of polarization of light across a measurement plane, the method comprising the steps of generating a beam of illuminating light; controlling the state of polarization at different positions across the beam width of the light beam; focussing said illuminating light beam to a focus, wherein said focus is a tight focus and said focused light has a suitable three-dimensional vectorial structure at the focus; detecting and measuring the state of polarization of the reflected light at different positions across the width of the measurement plane to retrieve information on the three-dimensional vectorial electromagnetic interaction of the illuminated focused field and the sample.
    Type: Grant
    Filed: April 28, 2008
    Date of Patent: June 4, 2013
    Inventors: John Christopher Dainty, Oscar Gabriel Rodriguez, David Lara Saucedo
  • Publication number: 20100128268
    Abstract: A method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating beam and a sample to be observed, by characterising the distribution of the state of polarisation of light across a measurement plane, the method comprising the steps of generating a beam of illuminating light; controlling the state of polarisation at different positions across the beam width of the light beam; focussing said illuminating light beam to a focus, wherein said focus is a tight focus and said focused light has a suitable three-dimensional vectorial structure at the focus; detecting and measuring the state of polarisation of the reflected light at different positions across the width of the measurement plane to retrieve information on the three-dimensional vectorial electromagnetic interaction of the illuminated focused field and the sample.
    Type: Application
    Filed: April 28, 2008
    Publication date: May 27, 2010
    Inventors: John Christopher Dainty, Oscar Gabriel Rodriguez, David Lara Saucedo