Patents by Inventor Osvaldo PENSADO

Osvaldo PENSADO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10317332
    Abstract: The present invention relates to a system, apparatus or and method to quantify features of relatively small defects or anomalies on a selected surface. Such defects may be associated with localized corrosion, such as pitting, that takes place on the surface of a metal exposed to a metallic environment.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: June 11, 2019
    Assignee: Southwest Research Institute
    Inventors: Osvaldo Pensado, Pavan Kumar Shukla
  • Publication number: 20160069789
    Abstract: The present invention relates to a system, apparatus or and method to quantify features of relatively small defects or anomalies on a selected surface. Such defects may be associated with localized corrosion, such as pitting, that takes place on the surface of a metal exposed to a metallic environment.
    Type: Application
    Filed: September 5, 2014
    Publication date: March 10, 2016
    Inventors: Osvaldo PENSADO, Pavan Kumar SHUKLA
  • Patent number: 8310243
    Abstract: A system and associated methods for acquiring and analyzing LEIS data from a buried structure, such as a pipeline. A special probe having adjustable electrodes is placed in the soil above the structure. A voltage is applied to the structure, causing more current to emanate from a coating defect than from intact coating. The probe electrodes acquire a response signal, which is analyzed to detect the defect.
    Type: Grant
    Filed: August 10, 2010
    Date of Patent: November 13, 2012
    Assignee: Southwest Research Institute
    Inventors: Pavan K. Shukla, Todd S. Mintz, Biswajit Dasgupta, Jay L. Fisher, Osvaldo Pensado-Rodriguez
  • Publication number: 20120038376
    Abstract: A system and associated methods for acquiring and analyzing LEIS data from a buried structure, such as a pipeline. A special probe having adjustable electrodes is placed in the soil above the structure. A voltage is applied to the structure, causing more current to emanate from a coating defect than from intact coating. The probe electrodes acquire a response signal, which is analyzed to detect the defect.
    Type: Application
    Filed: August 10, 2010
    Publication date: February 16, 2012
    Applicant: SOUTHWEST RESEARCH INSTITUTE
    Inventors: Pavan K. Shukla, Todd S. Mintz, Biswajit Dasgupta, Jay L. Fisher, Osvaldo Pensado-Rodriguez