Patents by Inventor Osvaldo Perez Varela

Osvaldo Perez Varela has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240344920
    Abstract: An apparatus, system, or method for vial seal inspection may be based on three-dimensional data that is representative of at least a portion of a vial seal. More particularly, apparatuses, systems, and methods for vial seal inspection may include at least one laser triangulation sensor.
    Type: Application
    Filed: August 22, 2022
    Publication date: October 17, 2024
    Inventors: Al Patrick Goodwin, Joseph Peter Bermacki, Thomas Clark Pearson, Graham F. Milne, Jonathan Parsons, Corey Bishop, Barry Donohoe, Osvaldo Perez-Varela
  • Publication number: 20240095983
    Abstract: Various techniques facilitate the development of an image library that can be used to train and/or validate an automated visual inspection (AVI) model, such an AVI neural network for image classification. In one aspect, an arithmetic transposition algorithm is used to generate synthetic images from original images by transposing features (e.g., defects) onto the original images, with pixel-level realism. In other aspects, digital inpainting techniques are used to generate realistic synthetic images from original images. Deep learning-based inpainting techniques may be used to add, remove, and/or modify defects or other depicted features. In still other aspects, quality control techniques are used to assess the suitability of image libraries for training and/or validation of AVI models, and/or to assess whether individual images are suitable for inclusion in such libraries.
    Type: Application
    Filed: December 1, 2021
    Publication date: March 21, 2024
    Inventors: Al Patrick Goodwin, Joseph Peter Bernacki, Graham F. Milne, Thomas Clark Pearson, Aman Mahendra Jain, Jordan Ray Fine, Kenneth E. Hampshire, Aik Jun Tan, Osvaldo Perez Varela, Nishant Mukesh Gadhvi