Patents by Inventor Otto J. Orient
Otto J. Orient has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6521898Abstract: The present invention provides an improved electron ionizer for use in a quadrupole mass spectrometer. The improved electron ionizer includes a repeller plate that ejects sample atoms or molecules, an ionizer chamber, a cathode that emits an electron beam into the ionizer chamber, an exit opening for excess electrons to escape, at least one shim plate to collimate said electron beam, extraction apertures, and a plurality of lens elements for focusing the extracted ions onto entrance apertures.Type: GrantFiled: July 10, 2001Date of Patent: February 18, 2003Assignee: California Institute of TechnologyInventors: Ara Chutjian, Murray R. Darrach, Otto J. Orient
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Patent number: 6469299Abstract: The present invention provides a quadrupole mass spectrometer and an ion filter, or pole array, for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.Type: GrantFiled: June 26, 2001Date of Patent: October 22, 2002Assignee: California Institute of TechnologyInventors: Ara Chutjian, Stephen D. Fuerstenau, Otto J. Orient, Karl Y. Yee, John T. Rice
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Publication number: 20010042826Abstract: The present invention provides a quadrupole mass spectrometer and an ion filter, or pole array, for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.Type: ApplicationFiled: June 26, 2001Publication date: November 22, 2001Applicant: California Institute of Technology, a California corporationInventors: Ara Chutjian, Stephen D. Fuerstenau, Otto J. Orient, Karl Y. Yee, John T. Rice
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Publication number: 20010038077Abstract: The present invention provides an improved electron ionizer for use in a quadrupole mass spectrometer. The improved electron ionizer includes a repeller plate that ejects sample atoms or molecules, an ionizer chamber, a cathode that emits an electron beam into the ionizer chamber, an exit opening for excess electrons to escape, at least one shim plate to collimate said electron beam, extraction apertures, and a plurality of lens elements for focusing the extracted ions onto entrance apertures.Type: ApplicationFiled: July 10, 2001Publication date: November 8, 2001Applicant: California Institute of Technology, a non-profit organizationInventors: Ara Chutjian, Murray R. Darrach, Otto J. Orient
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Patent number: 6271527Abstract: The present invention provides an improved electron ionizer for use in a quadrupole mass spectrometer. The improved electron ionizer includes a repeller plate that ejects sample atoms or molecules, an ionizer chamber, a cathode that emits an electron beam into the ionizer chamber, an exit opening for excess electrons to escape, at least one shim plate to collimate said electron beam, extraction apertures, and a plurality of lens elements for focusing the extracted ions onto entrance apertures.Type: GrantFiled: June 6, 2000Date of Patent: August 7, 2001Assignee: California Institute of TechnologyInventors: Ara Chutjian, Murray R. Darrach, Otto J. Orient
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Patent number: 6262416Abstract: The present invention provides a quadrupole mass spectrometer and an ion filter, or pole array, for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.Type: GrantFiled: February 8, 2000Date of Patent: July 17, 2001Assignee: California Institute of TechnologyInventors: Ara Chutjian, Stephen D. Fuerstenau, Otto J. Orient, Karl Y. Yee, John T. Rice
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Patent number: 6072182Abstract: The present invention provides an improved electron ionizer for use in a quadrupole mass spectrometer. The improved electron ionizer includes a repeller plate that ejects sample atoms or molecules, an ionizer chamber, a cathode that emits an electron beam into the ionizer chamber, an exit opening for excess electrons to escape, at least one shim plate to collimate said electron beam, extraction apertures, and a plurality of lens elements for focusing the extracted ions onto entrance apertures.Type: GrantFiled: October 1, 1998Date of Patent: June 6, 2000Assignee: California Institute of TechnologyInventors: Ara Chutjian, Murray R. Darrach, Otto J. Orient
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Patent number: 6049052Abstract: The present invention provides a quadrupole mass spectrometer and an ion filter, or pole array, for use in the quadrupole mass spectrometer. The ion filter includes a thin patterned layer including a two-dimensional array of poles forming one or more quadrupoles. The patterned layer design permits the use of very short poles and with a very dense spacing of the poles, so that the ion filter may be made very small. Also provided is a method for making the ion filter and the quadrupole mass spectrometer. The method involves forming the patterned layer of the ion filter in such a way that as the poles of the patterned layer are formed, they have the relative positioning and alignment for use in a final quadrupole mass spectrometer device.Type: GrantFiled: April 28, 1999Date of Patent: April 11, 2000Assignee: California Institute of TechnologyInventors: Ara Chutjian, Stephen D. Fuerstenau, Otto J. Orient, Karl Y. Yee, John T. Rice
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Patent number: 5719393Abstract: The present invention provides a minature quadrupole mass spectrometer array for the separation of ions, comprising a first pair of parallel, planar, nonmagnetic conducting rods each having an axis of symmetry, a second pair of planar, nonmagnetic conducting rods each having an axis of symmetry parallel to said first pair of rods and disposed such that a line perpendicular to each of said first axes of symmetry and a line perpendicular to each of said second axes of symmetry bisect each other and form a generally 90 degree angle.Type: GrantFiled: October 23, 1996Date of Patent: February 17, 1998Assignee: California Institute Of TechnologyInventors: Ara Chutjian, Michael H. Hecht, Otto J. Orient
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Patent number: 5596193Abstract: The present invention provides a minature quadrupole mass spectrometer array for the separation of ions, comprising a first pair of parallel, planar, nonmagnetic conducting rods each having an axis of symmetry, a second pair of planar, nonmagnetic conducting rods each having an axis of symmetry parallel to said first pair of rods and disposed such that a line perpendicular to each of said first axes of symmetry and a line perpendicular to each of said second axes of symmetry bisect each other and form a generally 90 degree angle.Type: GrantFiled: October 11, 1995Date of Patent: January 21, 1997Assignee: California Institute of TechnologyInventors: Ara Chutjian, Michael H. Hecht, Otto J. Orient
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Patent number: 4902647Abstract: A method of effecting modifications at the surfaces of materials using low energy ion beams of known quantum state, purity, flux and energy. The ion beam is obtained by bombarding ion-generating molecules with electrons which are also at low energy. The electrons used to bombard the ion generating molecules are separated from the ions thus obtained and the ion beam is directed at the material surface to be modified. Depending on the type of ion generating molecules used, different ions can be obtained for different types of surface modifications such as oxidation and diamond film formation.Type: GrantFiled: October 21, 1988Date of Patent: February 20, 1990Assignee: The United States of American as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Ara Chutjian, Michael H. Hecht, Otto J. Orient
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Patent number: 4649278Abstract: An electron gun is used with a mirror electrostatic field to produce zero or near zero velocity electrons by forming a turning point in their trajectories. A gas capable of attaching zero or near zero velocity is introduced at this turning point, and negative ions are produced by the attachment or dissociative attachment process. Operation may be continuous or pulsed. Ions thus formed are extracted by a simple lens system and suitable biasing of grids.Type: GrantFiled: May 2, 1985Date of Patent: March 10, 1987Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Ara Chutjian, Otto J. Orient, Samuel H. Aladzhadzhyan
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Patent number: 4649273Abstract: A variable energy, high flux atomic oxygen source (10) comprising means (48) for producing a high density beam of molecules which will emit O.sup.- ions when bombarded with electrons; means (44) for producing a high current stream of electrons at a low energy level passing through the high density beam of molecules to produce a combined stream (54) of electrons and O.sup.- ions; means (32) for accelerating the combined stream to a desired energy level; means (12) for producing an intense magnetic field to confine the electrons and O.sup.- ions; means (56, 58) for directing a multiple pass laser beam (62) through the combined stream to strip off the excess electrons from a plurality of the O.sup.- ions to produce ground-state O atoms within the combined stream; electrostatic deflection means (68, 70) for deflecting the path of the O.sup.- ions and the electrons in the combined stream; and, means (78) for stopping the O.sup.Type: GrantFiled: April 10, 1986Date of Patent: March 10, 1987Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Ara Chutjian, Otto J. Orient