Abstract: A device for examining the smoothness of a sample surface includes a scattered-light instrument for scanning the surface with a focused laser beam and for detecting scattered light which is reflected during the scanning of the surface. There is also an instrument for microscopic examination of prominently light-scattering regions of the surface after they have been identified using the scattered-light instrument. This device has an evacuable sample chamber, in which the sample is placed on a sample holder and which has a transparent window through which the laser beam passes before it strikes the surface of the sample. There is also a method for examining a sample using the device.

Abstract: Described herein is a resin-cured carrier material and a process for preparing a resin-cured carrier material. The carrier material has two oppositely disposed major surfaces and a core therebetween, the core being impregnated with at least one heat-cured thermosetting resin and at least one of the two surfaces having a coating of at least one polymerization resin curable by U.V.-radiation, electron radiation or the radiation of radio-active isotopes.