Abstract: The invention relates to a beam analysis device (10) for determining the axial position of the focal point (71) of an energy beam or a sample beam (70) decoupled from an energy beam, comprising a beam-shaping device (12), a detector (40), and an analysis device (45). The beam-shaping device (12) is designed to release two sub-beams (72, 73) from the sample beam (70) on a plane of the sub-beam release process (19). The cross-sections of the two sub-beams (72, 73) are defined by sub-apertures (32, 33) which are delimited from each other and which are arranged at a distance k to each other in a first lateral direction (31). The beam-shaping device (12) is designed to image the two sub-beams (72, 73) in order to form two beam spots (92, 93) on the detector and deflect at least one of the two sub-beams (72, 73) in a second lateral direction (37) which is oriented transversely to the first lateral direction (31) in order to form a distance w in the second lateral direction (37) between the two beam spots (92, 93).

Abstract: The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components (70) by means of layered solidification of a construction material (55) by an energy beam (30). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (40), a processing plane (45), and a layer applicator (60). The device according to the invention comprises a movable beam barrier (17), a movable beam sampling module (20) and a measuring device (10) with a radiation detector (12).

Abstract: The invention relates to a beam analysis device (10) for determining the axial position of the focal point (71) of an energy beam or a sample beam (70) decoupled from an energy beam, comprising a beam-shaping device (12), a detector (40), and an analysis device (45). The beam-shaping device (12) is designed to modulate an intensity distribution (81) of the energy beam (77) or the decoupled sample beam (70) on a modulation plane (19) using a two-dimensional transmission function in order to form a modulated sample beam (79). The transmission function has at least two contrast stages (32, 33) with a distance a to each other in the form of transitions between at least one blocking region (25) and at least one passage region (21). The beam-shaping device (12) is designed to guide the modulated sample beam (79) onto the detector (40) along a propagation path in order to form the intensity distribution (83) on the detector (40) with at least two contrast features (92, 93) along the first lateral direction (31).

Abstract: The present disclosure relates to a beam analysis device for determining a light beam state, e.g., determining the focal position of a light beam, where the device has a partial beam imaging device having at least one first selection device for forming a first partial beam from a first partial aperture region of the first measurement beam, and an imaging device for imaging the first partial beam for generating a first beam spot onto a detector unit having a spatially-resolving detector. The beam analysis device also can have an evaluation unit for processing the signals of the detector unit, for determining a lateral position (a1) of the first beam spot, and for determining changes in the lateral position (a1, a1?) of the first beam spot over time. An optical system for focal position control with a laser optics and with a beam analysis device.

Abstract: The invention relates to a method and an apparatus for the direct and precise measurement of the power and/or energy of a laser beam, which make a measurement possible even in areas close to the focus of a laser beam, A device is proposed for this purpose that contains a radiation sensor, an expansion device, and a support mount. The radiation sensor has a receiving surface and is configured for the generation of an electrical signal, which is dependent on the power of the laser beam or the energy of the laser beam. The expansion device and the radiation sensor are positioned on the support mount at a distance from one another. The expansion device is configured in such a way as to increase the angle range of the laser beam. The laser beam propagates to the radiation sensor with an increased angle range. A diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device.

Abstract: The invention relates to a method and an apparatus for the direct determination of spatial dimensions of a light beam with high precision and short measuring period, which are also suitable for the measuring of laser beams with high power in the range of the beam focus. For this purpose, an apparatus is proposed that includes a beam scanner, at least one light sensor, a movement device for the execution of a relative movement between the light beam and the beam scanner, and a device for the signal recording of a temporally variable signal of the light sensor. The beam scanner comprises at least one scanning body with at least three sampling areas, which extends along sampling lines. The sampling areas are configured for the extraction of linear or strip-shaped light samples from a cross-section of the light beam. Several scanning surfaces are defined by the sampling lines of the sampling areas, each spanned by a movement vector of the relative movement.

Abstract: The invention relates to a method and an apparatus for the direct determination of spatial dimensions of a light beam with high precision and short measuring period, which are also suitable for the measuring of laser beams with high power in the range of the beam focus. For this purpose, an apparatus is proposed that includes a beam scanner (20), at least one light sensor (60), a movement device (50) for the execution of a relative movement between the light beam (10) and the beam scanner (20), and a device (64) for the signal recording of a temporally variable signal of the light sensor (60). The beam scanner (20) comprises at least one scanning body (21) with at least three sampling areas (22), which extends along sampling lines. The sampling areas (22) are configured for the extraction of linear or strip-shaped light samples from a cross-section (14) of the light beam (10).

Abstract: The invention relates to a method and an apparatus for the direct and precise measurement of the power and/or energy of a laser beam, which make a measurement possible even in areas close to the focus of a laser beam, A device is proposed for this purpose that contains a radiation sensor, an expansion device, and a support mount. The radiation sensor has a receiving surface and is configured for the generation of an electrical signal, which is dependent on the power of the laser beam or the energy of the laser beam, The expansion device and the radiation sensor are positioned on the support mount at a distance from one another. The expansion device is configured in such a way as to increase the angle range of the laser beam. The laser beam propagates to the radiation sensor with an increased angle range. A diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device.

Abstract: The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30).

Abstract: The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components (70) by means of layered solidification of a construction material (55) by an energy beam (30). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (40), a processing plane (45), and a layer applicator (60). The device according to the invention comprises a movable beam barrier (17), a movable beam sampling module (20) and a measuring device (10) with a radiation detector (12). The method includes the following procedure steps. The beam barrier (17) and the beam sampling module (20) are positioned in the beam path between the beam deflecting device (40) and at least one selected processing coordinate (44) in the processing plane (45).

Abstract: The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30).

Abstract: Apparatus for determining geometrical parameters of a laser beam includes an optical system, a device for output coupling radiation, a beam diagnostic device, and a reflector element. The optical system focuses the laser beam into a processing region. The device for output coupling radiation couples out radiation that runs through the optical system in a direction opposite to a direction of the laser beam. The reflector element has a first surface which is partially reflecting and curved, where the curvature is equal to a mean curvature of a wave front of the laser beam in a positioning region of the reflector element.

Abstract: In a method for the laser drilling of holes in a circuit substrate with the aid of a perforated mask, a laser beam is moved in the region of the perforated mask on a circular path. The center point of the region lies concentrically with respect to the set position of the respective hole in the mask. Further, the diameter of the region is smaller than the diameter of the hole. At the same time, the diameter of the laser beam spot is chosen to be large enough that it always covers the center point of the perforated mask during the circular motion. As a result, an energy distribution of the laser energy, which is as uniform as possible, is achieved in the region of the perforated mask.

Abstract: In a method for the laser drilling of holes in a circuit substrate with the aid of a perforated mask, a laser beam is moved in the region of the perforated mask on a circular path. The center point of the region lies concentrically with respect to the set position of the respective hole in the mask. Further, the diameter of the region is smaller than the diameter of the hole. At the same time, the diameter of the laser beam spot is chosen to be large enough that it always covers the center point of the perforated mask during the circular motion. As a result, an energy distribution of the laser energy, which is as uniform as possible, is achieved in the region of the perforated mask.

Abstract: Gas laser, particularly carbon dioxide laser, with a component-free gas dharge chamber between high voltage electrodes, with a beam of two resonator end mirrors multiply folded between facing reflectors and with openings of the outwardly sealed gas discharge chamber permitting the inflow and outflow of gas. A gas laser with the aforementioned features is so constructed for the purpose of increasing its efficiency, that there is a continuous gas flow in the gas discharge chamber and that the gas flow direction is parallel to the longitudinal axis of the component-free gas discharge chamber located between the reflectors.