Abstract: A device is provided for IR-spectroscopy and for determining an impairment of a surface which is exposed to measuring radiation during the IR-spectroscopy. The device includes a radiation source to generate the measuring radiation a detector and a sample receptacle for receiving a sample. The sample receptacle is at least partially delimited by the surface. The detector measures radiation after interaction with the sample. The device is configured to measure an IR-reference spectrum of a reference sample which is received in the sample receptacle, evaluate the reference spectrum, determine an indicator of the impairment, wherein evaluating encompasses an integration of a quantity which is based on the reference spectrum over a predetermined integration spectral range, wherein the indicator is determined dependently on a value of the integration.

Abstract: A device is provided for IR-spectroscopy and for determining an impairment of a surface which is exposed to measuring radiation during the IR-spectroscopy. The device includes a radiation source to generate the measuring radiation a detector and a sample receptacle for receiving a sample. The sample receptacle is at least partially delimited by the surface. The detector measures radiation after interaction with the sample. The device is configured to measure an IR-reference spectrum of a reference sample which is received in the sample receptacle, evaluate the reference spectrum, determine an indicator of the impairment, wherein evaluating encompasses an integration of a quantity which is based on the reference spectrum over a predetermined integration spectral range, wherein the indicator is determined dependently on a value of the integration.