Patents by Inventor Ovadya Menadeva

Ovadya Menadeva has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140139429
    Abstract: The invention relates to a method for computer vision based hand gesture device control, which includes receiving 2D and 3D image information of a field of view which includes at least one user. An area of the user's hand is determined based on the 3D information and a shape of the user's hand is determined based on the 2D information. The detected shape of the hand and the position of the hand are then used to control a device.
    Type: Application
    Filed: July 11, 2012
    Publication date: May 22, 2014
    Inventors: Ovadya Menadeva, Eran Eilat, Amir Kaplan
  • Publication number: 20130301926
    Abstract: A system and method for computer vision based tracking of a hand may include receiving a sequence of images, the images including at least one object having a shape of a hand. A first selected feature is tracked from within the hand shaped object. Shape recognition algorithms are applied at a suspected location of the hand shaped object in an image from the sequence of images to detect a shape of a hand in the image and a second feature from within the detected shape of the hand is then selected and tracked, thereby providing verification and updating of the location of the hand shaped object.
    Type: Application
    Filed: June 25, 2013
    Publication date: November 14, 2013
    Inventors: Eran EILAT, Amir Kaplan, Ovadya Menadeva, Haim Perski
  • Publication number: 20130293460
    Abstract: A method for computer vision based hand gesture device control, is provided. The method includes receiving a sequence of images of a field of view; applying a shape recognition algorithm on the sequence of images to detect a shape of a first posture of a hand; and generating a command to initiate device control based on the detection of the shape of the first posture of the hand.
    Type: Application
    Filed: July 1, 2013
    Publication date: November 7, 2013
    Inventors: Amir KAPLAN, Ovadya MENADEVA, Eran EILAT, Haim PERSKI
  • Publication number: 20130285904
    Abstract: A method for computer vision based hand gesture device control, is provided. The method includes receiving a sequence of images of a field of view; applying a shape recognition algorithm on the sequence of images to detect a shape of a first posture of a hand; and generating a command to initiate device control based on the detection of the shape of the first posture of the hand.
    Type: Application
    Filed: July 1, 2013
    Publication date: October 31, 2013
    Inventors: Amir KAPLAN, Ovadya Menadeva, Eran Eilat, Tomer Peled, Haim Perski
  • Publication number: 20130279756
    Abstract: There is provided a method for computer vision based hand identification, the method comprising: obtaining an image of an object; detecting in the image at least two different types of shape features of the object; obtaining information of each type of shape feature; combining the information of each type of shape feature to obtain combined information; and determining that the object is a hand based on the combined information.
    Type: Application
    Filed: December 15, 2011
    Publication date: October 24, 2013
    Inventors: Ovadya Menadeva, Eran Eilat, Amir Kaplan, Haim Perski
  • Publication number: 20130135199
    Abstract: A system and method for user interaction with projected content are provided. A computer generated image is projected onto a surface, the computer generated image comprising at least one symbol. The projected computer generated image is imaged to obtain a sensor image. The location of the symbol within the sensor image is detected and based on the location of the symbol in the sensor image a device may be controlled.
    Type: Application
    Filed: August 10, 2011
    Publication date: May 30, 2013
    Inventors: Haim Perski, Gil Wohlstadter, Ovadya Menadeva, Eran Eilat
  • Patent number: 8290279
    Abstract: A method for processing an image of a person, the method including: (i) defining a first search area in response to a value of a metric parameter and to a location of an element of interest within the image; (ii) generating an edge detection data structure, wherein some of the elements of the edge detection data structure are indicative of edges of the image which are located within an edge detection search area that is contained within the first search area; (iii) determining a contour path in the edge detection data structure in response to multiple edges of the edge detection data structure, wherein the contour path includes a single data structure element from each column of the data structure; and (iv) retrieving a face portion of the image, wherein the face portion is included within a mask that is responsive to the contour path.
    Type: Grant
    Filed: February 25, 2009
    Date of Patent: October 16, 2012
    Assignee: WaniB
    Inventors: Ovadya Menadeva, Avi Mandelberg
  • Patent number: 7910885
    Abstract: A system and method for determining a cross sectional feature of a measured structural element having a sub-micron cross section, the cross section is defined by an intermediate section that is located between a first and a second traverse sections. The method starts by a first step of scanning, at a first tilt state, a first portion of a reference structural element and at least the first traverse section of the measured structural element, to determine a first relationship between the reference structural element and the first traverse section. The first step is followed by a second step of scanning, at a second tilt state, a second portion of a reference structural element and at least the second traverse section of the measured structural element, to determine a second relationship between the reference structural element and the second traverse section.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: March 22, 2011
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Zvika Rosenberg, Ovadya Menadeva, Aviram Tam
  • Patent number: 7856138
    Abstract: A system software product and a method for evaluating a mask, the method including the stages of: defining multiple CD measurement target windows; defining multiple pattern recognition windows such that the multiple CD measurements windows do not overlap the multiple pattern recognition windows, wherein each CD measurement target window and an associated pattern recognition window are positioned within a measurement area that is scannable without introducing a substantial mechanical movement; performing multiple critical dimension measurements of multiple patterns of an object being manufactured by exposing the mask to radiation, wherein the performing comprises using at least one CD measurement target window and at least one pattern recognition window; and evaluating the mask.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: December 21, 2010
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Youval Nehmadi, Ovadya Menadeva, Sergey Latinsky, Zamir Abraham, Orit Afek
  • Patent number: 7590278
    Abstract: A method for analyzing an image includes identifying a curved segment of a contour that is associated with noise. The curved segment is smoothed so as to reduce the noise that is associated with the curved segment, thereby providing a smoothed segment. The smoothed segment is transformed to a natural coordinate system, thereby providing a transformed segment. A line is fitted to the transformed segment in order to determine a radius of curvature of the curved segment.
    Type: Grant
    Filed: August 6, 2004
    Date of Patent: September 15, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Kris Roman, Ovadya Menadeva, Aviram Tam, Gidi Gottlib, Liraz Gershtein
  • Publication number: 20090220149
    Abstract: A method for processing an image of a person, the method including: (i) defining a first search area in response to a value of a metric parameter and to a location of an element of interest within the image; (ii) generating an edge detection data structure, wherein some of the elements of the edge detection data structure are indicative of edges of the image which are located within an edge detection search area that is contained within the first search area; (iii) determining a contour path in the edge detection data structure in response to multiple edges of the edge detection data structure, wherein the contour path includes a single data structure element from each column of the data structure; and (iv) retrieving a face portion of the image, wherein the face portion is included within a mask that is responsive to the contour path.
    Type: Application
    Filed: February 25, 2009
    Publication date: September 3, 2009
    Inventors: Ovadya MENADEVA, Avi MANDELBERG
  • Publication number: 20080183323
    Abstract: A method, a system and a computer program product for evaluating an actual structural element of an electrical circuit. The method includes: detecting an actual structural element contour by processing a scanning electron microscope image of the actual structural element; aligning the actual structural element contour with a simulated contour to provide an aligned actual structural element contour; wherein the simulated contour is obtained by simulating a lithographic process that is responsive to a design contour; and comparing between the aligned actual structural element contour and reference information.
    Type: Application
    Filed: January 24, 2008
    Publication date: July 31, 2008
    Inventors: Ovadya Menadeva, Sergey Latinski
  • Patent number: 7317523
    Abstract: A method for calibrating a metrology tool, the method includes: determining a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; and defining a calibration parameter in response to the relationship. A metrology system that includes: a miller adapted to mill a reference structural element; and a measurement device adapted to determine a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; wherein the metrology system is further adapted to define a calibration parameter in response to the relationship.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: January 8, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Nadav Wertsman, Ovadya Menadeva
  • Publication number: 20070051888
    Abstract: A system and method for determining a cross sectional feature of a measured structural element having a sub-micron cross section, the cross section is defined by an intermediate section that is located between a first and a second traverse sections. The method starts by a first step of scanning, at a first tilt state, a first portion of a reference structural element and at least the first traverse section of the measured structural element, to determine a first relationship between the reference structural element and the first traverse section. The first step is followed by a second step of scanning, at a second tilt state, a second portion of a reference structural element and at least the second traverse section of the measured structural element, to determine a second relationship between the reference structural element and the second traverse section.
    Type: Application
    Filed: July 12, 2004
    Publication date: March 8, 2007
    Inventors: Zvika Rosenberg, Ovadya Menadeva, Avlram Tam
  • Patent number: 7184100
    Abstract: A method of selecting key-frames (230) from a video sequence (210, 215) by comparing each frame in the video sequence with respect to its preceding and subsequent key-frames for redundancy where the comparison involves region and motion analysis. The video sequence is optionally pre-processed to detect graphic overlay. The key-frame set is optionally post-processed (250) to optimize the resulting set for face or other object recognition.
    Type: Grant
    Filed: March 24, 1999
    Date of Patent: February 27, 2007
    Assignee: MATE - Media Access Technologies Ltd.
    Inventors: Itzhak Wilf, Ovadya Menadeva, Hayit Greenspan
  • Publication number: 20060266833
    Abstract: A system, computer software product and a method for evaluating a mask, the method includes the stages of: defining multiple CD measurement target windows; defining multiple pattern recognition windows such that the multiple CD measurements windows do not overlap the multiple pattern recognition windows; wherein each CD measurement target window and an associated pattern recognition window are positioned within a measurement area that is scan-able without introducing a substantial mechanical movement; performing multiple critical dimension measurements of multiple patterns of an object being manufactured by exposing the mask to radiation; wherein the performing comprises using at least one CD measurement target window and at least one pattern recognition window; and evaluating the mask
    Type: Application
    Filed: February 23, 2006
    Publication date: November 30, 2006
    Inventors: Youval Nehmadi, Ovadya Menadeva, Sergey Latinsky, Zamir Abraham, Orit Afek
  • Publication number: 20060187447
    Abstract: A method for calibrating a metrology tool, the method includes: determining a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; and defining a calibration parameter in response to the relationship. A metrology system that includes: a miller adapted to mill a reference structural element; and a measurement device adapted to determine a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; wherein the metrology system is further adapted to define a calibration parameter in response to the relationship.
    Type: Application
    Filed: May 12, 2005
    Publication date: August 24, 2006
    Inventors: Nadav Wertsman, Ovadya Menadeva
  • Patent number: 6937766
    Abstract: A method for generating an index of the text of a video image sequence is provided. The method includes the steps of determining the image text objects in each of a plurality of frames of the video image sequence; comparing the image text objects in each of the plurality of frames of the video image sequence to obtain a record of frame sequences having matching image text objects; extracting the content for each of the similar image text objects in text string format; and storing the text string for each image text object as a video text object in a retrievable medium.
    Type: Grant
    Filed: April 13, 2000
    Date of Patent: August 30, 2005
    Assignee: MATE—Media Access Technologies Ltd.
    Inventors: Itzhak Wilf, Joseph Ladkani, Ovadya Menadeva, Hayit Greenspan
  • Publication number: 20050069192
    Abstract: A method for analyzing an image includes identifying a curved segment of a contour that is associated with noise. The curved segment is smoothed so as to reduce the noise that is associated with the curved segment, thereby providing a smoothed segment. The smoothed segment is transformed to a natural coordinate system, thereby providing a transformed segment. A line is fitted to the transformed segment in order to determine a radius of curvature of the curved segment.
    Type: Application
    Filed: August 6, 2004
    Publication date: March 31, 2005
    Inventors: Kris Roman, Ovadya Menadeva, Aviram Tam, Gidi Gottlib, Liraz Gershtein